{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,6,7]],"date-time":"2025-06-07T04:50:54Z","timestamp":1749271854685,"version":"3.37.3"},"reference-count":33,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100015956","name":"Special Project for Research and Development in Key areas of Guangdong Province","doi-asserted-by":"publisher","award":["2021B0101200001"],"award-info":[{"award-number":["2021B0101200001"]}],"id":[{"id":"10.13039\/501100015956","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100021171","name":"Basic and Applied Basic Research Foundation of Guangdong Province","doi-asserted-by":"publisher","award":["2020B1515120071","2021B1515120017"],"award-info":[{"award-number":["2020B1515120071","2021B1515120017"]}],"id":[{"id":"10.13039\/501100021171","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2022]]},"DOI":"10.1109\/tim.2022.3205903","type":"journal-article","created":{"date-parts":[[2022,9,12]],"date-time":"2022-09-12T19:47:40Z","timestamp":1663012060000},"page":"1-10","source":"Crossref","is-referenced-by-count":7,"title":["A Coarse-to-Fine Method Based on Saliency Map for Solar Cell Interior Defect Measurement"],"prefix":"10.1109","volume":"71","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-0148-1876","authenticated-orcid":false,"given":"Jiaming","family":"Xu","sequence":"first","affiliation":[{"name":"School of Mechatronic Engineering, Guangdong Polytechnic Normal University, Guangzhou, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4191-5974","authenticated-orcid":false,"given":"Yu","family":"Liu","sequence":"additional","affiliation":[{"name":"School of Automation Science and Engineering, South China University of Technology, Guangzhou, China"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2017.2668438"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/JPHOTOV.2018.2850530"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2021.3104584"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.patrec.2018.12.013"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/JPHOTOV.2013.2285622"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3165287"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3096602"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.optlaseng.2019.01.016"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/j.solener.2019.02.067"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.solmat.2011.03.025"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2019.107170"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2019.2929670"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1007\/s11042-020-08849-y"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1007\/s11042-017-5032-z"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TIFS.2016.2601065"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.2014.2345401"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1007\/s41095-015-0028-y"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2015.7298887"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TCYB.2016.2524406"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2748053"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2019.2917522"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TCPMT.2018.2873744"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1007\/s00170-003-1832-6"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TNNLS.2022.3165575"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-24574-4_28"},{"key":"ref26","article-title":"Recurrent residual convolutional neural network based on U-Net (R2U-Net) for medical image segmentation","volume-title":"arXiv:1802.06955","author":"Alom","year":"2018"},{"key":"ref27","article-title":"Attention U-Net: Learning where to look for the pancreas","volume-title":"arXiv:1804.03999","author":"Oktay","year":"2018"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-030-00889-5_1"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2016.2643600"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TCYB.2017.2668395"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TCYB.2020.2992433"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/TCYB.2020.3033798"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/TCYB.2020.3029787"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/9717300\/09888036.pdf?arnumber=9888036","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,1,22]],"date-time":"2024-01-22T21:20:49Z","timestamp":1705958449000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9888036\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022]]},"references-count":33,"URL":"https:\/\/doi.org\/10.1109\/tim.2022.3205903","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"type":"print","value":"0018-9456"},{"type":"electronic","value":"1557-9662"}],"subject":[],"published":{"date-parts":[[2022]]}}}