{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,19]],"date-time":"2026-01-19T01:00:39Z","timestamp":1768784439996,"version":"3.49.0"},"reference-count":28,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61827802"],"award-info":[{"award-number":["61827802"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["62031002"],"award-info":[{"award-number":["62031002"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61961130393"],"award-info":[{"award-number":["61961130393"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Newton Advanced Fellowship","award":["NAF191193"],"award-info":[{"award-number":["NAF191193"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2022]]},"DOI":"10.1109\/tim.2022.3208668","type":"journal-article","created":{"date-parts":[[2022,9,29]],"date-time":"2022-09-29T19:36:36Z","timestamp":1664480196000},"page":"1-10","source":"Crossref","is-referenced-by-count":9,"title":["TDLAS Tomography System for Online Imaging and Dynamic Process Playback of Temperature and Gas Mole Fraction"],"prefix":"10.1109","volume":"71","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-0271-7641","authenticated-orcid":false,"given":"Mingxiang","family":"Li","sequence":"first","affiliation":[{"name":"School of Instrumentation and Opto-Electronic Engineering, Beihang University, Beijing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0488-9604","authenticated-orcid":false,"given":"Lijun","family":"Xu","sequence":"additional","affiliation":[{"name":"School of Instrumentation and Opto-Electronic Engineering, Beihang University, Beijing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3649-9512","authenticated-orcid":false,"given":"Zhang","family":"Cao","sequence":"additional","affiliation":[{"name":"School of Instrumentation and Opto-Electronic Engineering, Beihang University, Beijing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1002\/9783527628148"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1615\/978-1-56700-020-7.0"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.sab.2015.01.010"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2019.2962736"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2018.2799098"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.3390\/app7100990"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2018.2884085"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2020.2990519"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2021.3063963"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2019.2895932"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1364\/oe.23.022494"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1364\/ao.56.002183"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2020.3021648"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2013.2276776"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1063\/5.0050999"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2020.2978722"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2017.2652497"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2020.3016262"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/IST.2015.7294460"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3115210"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2018.2804892"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1017\/jfm.2014.171"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1364\/ao.48.005546"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2017.2677638"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1145\/3297663.3310305"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/FPL.2018.00071"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2007.908604"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1016\/j.applthermaleng.2016.12.060"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/9717300\/09906000.pdf?arnumber=9906000","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,1,22]],"date-time":"2024-01-22T22:50:19Z","timestamp":1705963819000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9906000\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022]]},"references-count":28,"URL":"https:\/\/doi.org\/10.1109\/tim.2022.3208668","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2022]]}}}