{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,12,4]],"date-time":"2025-12-04T10:04:03Z","timestamp":1764842643182,"version":"3.37.3"},"reference-count":41,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61971304","51976137"],"award-info":[{"award-number":["61971304","51976137"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2022]]},"DOI":"10.1109\/tim.2022.3209751","type":"journal-article","created":{"date-parts":[[2022,9,26]],"date-time":"2022-09-26T20:32:08Z","timestamp":1664224328000},"page":"1-11","source":"Crossref","is-referenced-by-count":3,"title":["Spatial and Temporal Regularized Iterative Deep Neural Network for Non-Stationary Image Reconstruction of Electrical Impedance Tomography"],"prefix":"10.1109","volume":"71","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-2220-3856","authenticated-orcid":false,"given":"Shangjie","family":"Ren","sequence":"first","affiliation":[{"name":"Tianjin Key Laboratory of Process Measurement and Control, School of Electrical and Information Engineering, Tianjin University, Tianjin, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-8227-2306","authenticated-orcid":false,"given":"Jiachen","family":"Shi","sequence":"additional","affiliation":[{"name":"Tianjin Key Laboratory of Process Measurement and Control, School of Electrical and Information Engineering, Tianjin University, Tianjin, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-7289-5155","authenticated-orcid":false,"given":"Ru","family":"Guan","sequence":"additional","affiliation":[{"name":"Tianjin Key Laboratory of Process Measurement and Control, School of Electrical and Information Engineering, Tianjin University, Tianjin, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8478-8928","authenticated-orcid":false,"given":"Feng","family":"Dong","sequence":"additional","affiliation":[{"name":"Tianjin Key Laboratory of Process Measurement and Control, School of Electrical and Information Engineering, Tianjin University, Tianjin, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"volume-title":"Industrial Tomography: Systems and Applications","year":"2015","author":"Wang","key":"ref1"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2652367"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2017.2682929"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TBME.2017.2728323"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.neuroimage.2015.08.071"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1088\/0266-5611\/25\/2\/025001"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TMI.2014.2351014"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2017.2701098"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1198\/tech.2006.s351"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/10.664204"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1088\/0266-5611\/26\/7\/074010"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2012.2196394"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2019.2921441"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2020.3031172"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/42.363109"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2017.2713099"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TMI.2018.2828303"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2018.2876411"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2019.2954722"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6579\/ab21b2"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2020.2970371"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6420\/aa9581"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TMI.2018.2799231"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TMI.2018.2820382"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TMI.2018.2832656"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.2020.3012955"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TMI.2020.2998480"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TMI.2021.3054167"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1016\/j.artint.2019.103168"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1007\/s00521-018-3813-6"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.2016.2646371"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/CVPRW.2015.7301268"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3092061"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1137\/0152060"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1088\/0967-3334\/27\/5\/S03"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1080\/17415977.2017.1378195"},{"volume-title":"Electrical Impedance Tomography: Methods, History and Applications","year":"2005","author":"Holder","key":"ref37"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/TMI.2019.2900031"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1016\/S1004-9541(12)60400-5"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-56904-8_6"},{"key":"ref41","article-title":"SGDR: Stochastic gradient descent with warm restarts","author":"Loshchilov","year":"2016","journal-title":"arXiv:1608.03983"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/9717300\/09903466.pdf?arnumber=9903466","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,1,22]],"date-time":"2024-01-22T22:49:47Z","timestamp":1705963787000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9903466\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022]]},"references-count":41,"URL":"https:\/\/doi.org\/10.1109\/tim.2022.3209751","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"type":"print","value":"0018-9456"},{"type":"electronic","value":"1557-9662"}],"subject":[],"published":{"date-parts":[[2022]]}}}