{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,2,21]],"date-time":"2025-02-21T10:09:28Z","timestamp":1740132568495,"version":"3.37.3"},"reference-count":16,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100012166","name":"National Key Research and Development Program of China","doi-asserted-by":"publisher","award":["2017YFF0205703"],"award-info":[{"award-number":["2017YFF0205703"]}],"id":[{"id":"10.13039\/501100012166","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2022]]},"DOI":"10.1109\/tim.2022.3210954","type":"journal-article","created":{"date-parts":[[2022,9,30]],"date-time":"2022-09-30T19:42:59Z","timestamp":1664566979000},"page":"1-7","source":"Crossref","is-referenced-by-count":2,"title":["Investigation on the Voltage Dependence of Compressed-Gas-Insulated Capacitors up to 400 kV by Improved Voltage-Doubling Method"],"prefix":"10.1109","volume":"71","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-2677-172X","authenticated-orcid":false,"given":"Yang","family":"Pan","sequence":"first","affiliation":[{"name":"Division of Electron and Electricity Measurement Technology, Shanghai Institute of Measurement and Testing Technology, Shanghai, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2288-0120","authenticated-orcid":false,"given":"Liren","family":"Zhou","sequence":"additional","affiliation":[{"name":"Division of Electron and Electricity Measurement Technology, Shanghai Institute of Measurement and Testing Technology, Shanghai, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1199-7048","authenticated-orcid":false,"given":"Jian","family":"Feng","sequence":"additional","affiliation":[{"name":"Division of Electron and Electricity Measurement Technology, Shanghai Institute of Measurement and Testing Technology, Shanghai, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-7850-9278","authenticated-orcid":false,"given":"Lei","family":"Lai","sequence":"additional","affiliation":[{"name":"Division of Electron and Electricity Measurement Technology, Shanghai Institute of Measurement and Testing Technology, Shanghai, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9402-3224","authenticated-orcid":false,"given":"Guozhong","family":"Zhan","sequence":"additional","affiliation":[{"name":"Division of Electron and Electricity Measurement Technology, Shanghai Institute of Measurement and Testing Technology, Shanghai, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-4082-877X","authenticated-orcid":false,"given":"Feng","family":"Xu","sequence":"additional","affiliation":[{"name":"Division of Electron and Electricity Measurement Technology, Shanghai Institute of Measurement and Testing Technology, Shanghai, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-3305-4190","authenticated-orcid":false,"given":"Haiming","family":"Shao","sequence":"additional","affiliation":[{"name":"Division of Electrical and Magnetic Metrology, National Institute of Metrology, Beijing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/19.310188"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TCOME.1964.6539562"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TPAS.1978.354603"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2011.2126190"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/CPEM.2018.8501116"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TCE.1963.6373272"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/19.650781"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.1973.4314197"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1049\/ip-a-1.1981.0037"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.1987.6312705"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TPAS.1979.319532"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TCE.1963.6373273"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2018.2886866"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.1987.6312780"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/CPEM49742.2020.9191810"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/61.53054"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/9717300\/09906302.pdf?arnumber=9906302","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,1,24]],"date-time":"2024-01-24T02:17:49Z","timestamp":1706062669000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9906302\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022]]},"references-count":16,"URL":"https:\/\/doi.org\/10.1109\/tim.2022.3210954","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"type":"print","value":"0018-9456"},{"type":"electronic","value":"1557-9662"}],"subject":[],"published":{"date-parts":[[2022]]}}}