{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,21]],"date-time":"2026-01-21T08:47:47Z","timestamp":1768985267367,"version":"3.49.0"},"reference-count":0,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["U20B2033"],"award-info":[{"award-number":["U20B2033"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100005240","name":"Changjiang Scholar Program of Chinese Ministry of Education","doi-asserted-by":"publisher","award":["Q2021053"],"award-info":[{"award-number":["Q2021053"]}],"id":[{"id":"10.13039\/501100005240","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100005240","name":"Changjiang Scholar Program of Chinese Ministry of Education","doi-asserted-by":"publisher","award":["T2017030"],"award-info":[{"award-number":["T2017030"]}],"id":[{"id":"10.13039\/501100005240","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2022]]},"DOI":"10.1109\/tim.2022.3214266","type":"journal-article","created":{"date-parts":[[2022,11,3]],"date-time":"2022-11-03T22:23:19Z","timestamp":1667514199000},"page":"1-11","source":"Crossref","is-referenced-by-count":5,"title":["Inspection Path Planning of Complex Surface Based on One-Step Inverse Approach and Curvature-Oriented Point Distribution"],"prefix":"10.1109","volume":"71","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-1216-6329","authenticated-orcid":false,"given":"Mengmeng","family":"Xi","sequence":"first","affiliation":[{"name":"Key Laboratory for Precision and Nontraditional Machining Technology of Ministry of Education, Dalian University of Technology, Dalian, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4679-0760","authenticated-orcid":false,"given":"Yongqing","family":"Wang","sequence":"additional","affiliation":[{"name":"Key Laboratory for Precision and Nontraditional Machining Technology of Ministry of Education, Dalian University of Technology, Dalian, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0189-5478","authenticated-orcid":false,"given":"Haibo","family":"Liu","sequence":"additional","affiliation":[{"name":"Key Laboratory for Precision and Nontraditional Machining Technology of Ministry of Education, Dalian University of Technology, Dalian, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-7311-5445","authenticated-orcid":false,"given":"Donghang","family":"Li","sequence":"additional","affiliation":[{"name":"Key Laboratory for Precision and Nontraditional Machining Technology of Ministry of Education, Dalian University of Technology, Dalian, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1608-6323","authenticated-orcid":false,"given":"Haowei","family":"Xiao","sequence":"additional","affiliation":[{"name":"Key Laboratory for Precision and Nontraditional Machining Technology of Ministry of Education, Dalian University of Technology, Dalian, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-5027-3419","authenticated-orcid":false,"given":"Xu","family":"Li","sequence":"additional","affiliation":[{"name":"Key Laboratory for Precision and Nontraditional Machining Technology of Ministry of Education, Dalian University of Technology, Dalian, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-7957-5530","authenticated-orcid":false,"given":"Xuefeng","family":"Zhu","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Structural Analysis for Industrial Equipment, Dalian University of Technology, Dalian, China"}]}],"member":"263","container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/9717300\/09928432.pdf?arnumber=9928432","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,11,28]],"date-time":"2022-11-28T19:29:07Z","timestamp":1669663747000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9928432\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022]]},"references-count":0,"URL":"https:\/\/doi.org\/10.1109\/tim.2022.3214266","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2022]]}}}