{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,2]],"date-time":"2026-04-02T17:26:02Z","timestamp":1775150762977,"version":"3.50.1"},"reference-count":30,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Science Foundation of China","doi-asserted-by":"publisher","award":["52107160"],"award-info":[{"award-number":["52107160"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Science Foundation of China","doi-asserted-by":"publisher","award":["61701327"],"award-info":[{"award-number":["61701327"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Science Foundation of China","doi-asserted-by":"publisher","award":["51477106"],"award-info":[{"award-number":["51477106"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Science Foundation of China","doi-asserted-by":"publisher","award":["51877142"],"award-info":[{"award-number":["51877142"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100012226","name":"Fundamental Research Funds for the Central Universities","doi-asserted-by":"publisher","award":["2018SCU12003"],"award-info":[{"award-number":["2018SCU12003"]}],"id":[{"id":"10.13039\/501100012226","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2022]]},"DOI":"10.1109\/tim.2022.3216800","type":"journal-article","created":{"date-parts":[[2022,11,3]],"date-time":"2022-11-03T22:23:19Z","timestamp":1667514199000},"page":"1-9","source":"Crossref","is-referenced-by-count":19,"title":["Partial Discharge Localization on Power Cables Based on a Novel Signal Relay System"],"prefix":"10.1109","volume":"71","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-3222-1521","authenticated-orcid":false,"given":"Kai","family":"Zhou","sequence":"first","affiliation":[{"name":"High Voltage Laboratory, College of Electrical Engineering, Sichuan University, Chengdu, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1126-3650","authenticated-orcid":false,"given":"Yao","family":"Fu","sequence":"additional","affiliation":[{"name":"High Voltage Laboratory, College of Electrical Engineering, Sichuan University, Chengdu, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3790-4014","authenticated-orcid":false,"given":"Guangya","family":"Zhu","sequence":"additional","affiliation":[{"name":"High Voltage Laboratory, College of Electrical Engineering, Sichuan University, Chengdu, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8018-8861","authenticated-orcid":false,"given":"Shilin","family":"Zhao","sequence":"additional","affiliation":[{"name":"China National Grid Sichuan Electric Power Company Skills Training Center, Chengdu, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-6077-0977","authenticated-orcid":false,"given":"Lu","family":"Lu","sequence":"additional","affiliation":[{"name":"College of Electronics and Information Engineering, Sichuan University, Chengdu, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2729-629X","authenticated-orcid":false,"given":"Xianjin","family":"Wang","sequence":"additional","affiliation":[{"name":"National Grid Chongqing Electric Power Company Wanzhou Power Supply Branch, Chongqing, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4579-1833","authenticated-orcid":false,"given":"Yuan","family":"Li","sequence":"additional","affiliation":[{"name":"High Voltage Laboratory, College of Electrical Engineering, Sichuan University, Chengdu, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-2359-2822","authenticated-orcid":false,"given":"Pengfei","family":"Meng","sequence":"additional","affiliation":[{"name":"High Voltage Laboratory, College of Electrical Engineering, Sichuan University, Chengdu, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5913-8501","authenticated-orcid":false,"given":"Shiyu","family":"Ma","sequence":"additional","affiliation":[{"name":"High Voltage Laboratory, College of Electrical Engineering, Sichuan University, Chengdu, China"}]}],"member":"263","reference":[{"key":"ref30","year":"0"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/MEI.2003.1226730"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2019.2949843"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2017.2680459"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2005.858115"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2010.5658224"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2008.4591242"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/57.245980"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/61.53090"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/14.123439"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/61.296237"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/MEI.2008.4455500"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2019.2914710"},{"key":"ref27","author":"pcjm","year":"2005","journal-title":"On-line detection and location of partial discharges in medium-voltage power cables"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/MEI.2016.7552375"},{"key":"ref6","doi-asserted-by":"crossref","first-page":"2179","DOI":"10.1109\/TIM.2014.2386918","article-title":"Wire fault diagnosis in the frequency domain by impedance spectroscopy","volume":"64","author":"shi","year":"2015","journal-title":"IEEE Trans Instrum Meas"},{"key":"ref29","year":"2015"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2015.005521"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2013.6678858"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2015.004799"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2020.3022157"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2019.2896553"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2020.3027925"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/14.123440"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2019.008202"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/ICPADM.1997.617622"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2017.006311"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TEMC.2008.2007964"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/EIC.2013.6554202"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2015.004398"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/9717300\/09927484.pdf?arnumber=9927484","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,11,28]],"date-time":"2022-11-28T19:29:12Z","timestamp":1669663752000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9927484\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022]]},"references-count":30,"URL":"https:\/\/doi.org\/10.1109\/tim.2022.3216800","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2022]]}}}