{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,17]],"date-time":"2026-03-17T01:50:45Z","timestamp":1773712245629,"version":"3.50.1"},"reference-count":25,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2022]]},"DOI":"10.1109\/tim.2022.3217862","type":"journal-article","created":{"date-parts":[[2022,11,4]],"date-time":"2022-11-04T00:50:49Z","timestamp":1667523049000},"page":"1-10","source":"Crossref","is-referenced-by-count":9,"title":["Estimation of Reference Voltages for Time-Difference Electrical Impedance Tomography"],"prefix":"10.1109","volume":"71","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-6237-0179","authenticated-orcid":false,"given":"Hao","family":"Yu","sequence":"first","affiliation":[{"name":"Agile Tomography Group, School of Engineering, Institute for Digital Communications, The University of Edinburgh, Edinburgh, U.K"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-4142-0426","authenticated-orcid":false,"given":"Xingchen","family":"Wan","sequence":"additional","affiliation":[{"name":"Agile Tomography Group, School of Engineering, Institute for Digital Communications, The University of Edinburgh, Edinburgh, U.K"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5089-8141","authenticated-orcid":false,"given":"Zhongxu","family":"Dong","sequence":"additional","affiliation":[{"name":"Agile Tomography Group, School of Engineering, Institute for Digital Communications, The University of Edinburgh, Edinburgh, U.K"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5291-9698","authenticated-orcid":false,"given":"Zhixi","family":"Zhang","sequence":"additional","affiliation":[{"name":"Agile Tomography Group, School of Engineering, Institute for Digital Communications, The University of Edinburgh, Edinburgh, U.K"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-5073-5126","authenticated-orcid":false,"given":"Jiabin","family":"Jia","sequence":"additional","affiliation":[{"name":"Agile Tomography Group, School of Engineering, Institute for Digital Communications, The University of Edinburgh, Edinburgh, U.K"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1088\/0957-0233\/13\/1\/314"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TMI.2018.2828303"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2021.3120190"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.flowmeasinst.2015.07.002"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1002\/ima.1850020203"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2020.3036076"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/MSP.2010.939038"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2020.3013056"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.3390\/a12050088"},{"key":"ref19","article-title":"Simple recurrent units for highly parallelizable recurrence","author":"lei","year":"2017","journal-title":"arXiv 1709 02755"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2019.2954722"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/SENSORS47125.2020.9278662"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1088\/0957-0233\/24\/3\/035403"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2018.2874127"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2008.07.003"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1088\/0957-0233\/26\/1\/015305"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.3390\/s20113324"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.3923\/itj.2011.1614.1619"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1088\/0967-3334\/30\/6\/S03"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TMI.2018.2816739"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3169557"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/I2MTC.2019.8826809"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/IACC.2016.25"},{"key":"ref23","article-title":"Deep learning using rectified linear units (ReLU)","author":"fred agarap","year":"2018","journal-title":"arXiv 1803 08375"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2017.2705063"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/9717300\/09931742.pdf?arnumber=9931742","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,11,28]],"date-time":"2022-11-28T19:25:07Z","timestamp":1669663507000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9931742\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022]]},"references-count":25,"URL":"https:\/\/doi.org\/10.1109\/tim.2022.3217862","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2022]]}}}