{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,9]],"date-time":"2026-04-09T14:31:11Z","timestamp":1775745071491,"version":"3.50.1"},"reference-count":48,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61971304"],"award-info":[{"award-number":["61971304"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["51976137"],"award-info":[{"award-number":["51976137"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100006606","name":"Natural Science Foundation of Tianjin","doi-asserted-by":"publisher","award":["19JCZDJC38900"],"award-info":[{"award-number":["19JCZDJC38900"]}],"id":[{"id":"10.13039\/501100006606","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2022]]},"DOI":"10.1109\/tim.2022.3218515","type":"journal-article","created":{"date-parts":[[2022,11,4]],"date-time":"2022-11-04T01:33:13Z","timestamp":1667525593000},"page":"1-13","source":"Crossref","is-referenced-by-count":5,"title":["A Flexible Image-Guided Shape Reconstruction Framework for Electrical Impedance Tomography"],"prefix":"10.1109","volume":"71","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-7536-5253","authenticated-orcid":false,"given":"Yu","family":"Wang","sequence":"first","affiliation":[{"name":"Tianjin Key Laboratory of Process Measurement and Control, School of Electrical and Information Engineering, Tianjin University, Tianjin, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8478-8928","authenticated-orcid":false,"given":"Feng","family":"Dong","sequence":"additional","affiliation":[{"name":"Tianjin Key Laboratory of Process Measurement and Control, School of Electrical and Information Engineering, Tianjin University, Tianjin, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-2220-3856","authenticated-orcid":false,"given":"Shangjie","family":"Ren","sequence":"additional","affiliation":[{"name":"Tianjin Key Laboratory of Process Measurement and Control, School of Electrical and Information Engineering, Tianjin University, Tianjin, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2021.3050845"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/TBME.2020.3006175"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2015.2445575"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2021.3104967"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TMI.2019.2958670"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TMI.2019.2900031"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/I2MTC50364.2021.9460093"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3132830"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1002\/mp.12038"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2020.2969077"},{"key":"ref10","article-title":"Electrical resistance tomography image reconstruction with densely connected convolutional neural network","volume":"70","author":"li","year":"2020","journal-title":"IEEE Trans Instrum Meas"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1109\/TMI.2021.3129739"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2021.109335"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1088\/0266-5611\/23\/5\/020"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1088\/0266-5611\/15\/5\/308"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1137\/120886984"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1088\/0266-5611\/15\/5\/318"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1080\/17415977.2017.1378195"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2018.2853358"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TMI.2019.2905245"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TMI.2006.887367"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1088\/0266-5611\/15\/3\/306"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TMI.2012.2183641"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1088\/0967-3334\/29\/6\/S06"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2003.819229"},{"key":"ref6","author":"wang","year":"2015","journal-title":"Industrial Tomography Systems and Applications"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1002\/mp.15669"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.neuroimage.2015.08.071"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TMI.2020.2983055"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1088\/0964-1726\/23\/8\/085001"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2015.2493446"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TMI.2009.2022540"},{"key":"ref1","author":"holder","year":"2005","journal-title":"Electrical Impedance Tomography Methods History and Applications"},{"key":"ref46","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2007.901238"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1080\/17415970500264152"},{"key":"ref45","doi-asserted-by":"publisher","DOI":"10.1016\/S1004-9541(12)60400-5"},{"key":"ref48","doi-asserted-by":"publisher","DOI":"10.1016\/j.flowmeasinst.2007.07.004"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TMI.2019.2918566"},{"key":"ref47","doi-asserted-by":"publisher","DOI":"10.1109\/42.700740"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TMI.2017.2756078"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2004.832919"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1088\/0031-9155\/53\/4\/R01"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1016\/S0009-2509(97)00044-4"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1007\/BF00133570"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1007\/s10278-013-9622-7"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1088\/0967-3334\/31\/8\/S02"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1109\/83.661186"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3175970"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/9717300\/09933839.pdf?arnumber=9933839","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,12,12]],"date-time":"2022-12-12T19:13:07Z","timestamp":1670872387000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9933839\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022]]},"references-count":48,"URL":"https:\/\/doi.org\/10.1109\/tim.2022.3218515","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2022]]}}}