{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,29]],"date-time":"2026-05-29T11:16:34Z","timestamp":1780053394144,"version":"3.54.0"},"reference-count":38,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100003968","name":"Iran National Science Foundation","doi-asserted-by":"publisher","award":["99012163"],"award-info":[{"award-number":["99012163"]}],"id":[{"id":"10.13039\/501100003968","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100002398","name":"Sharif University of Technology","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100002398","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2023]]},"DOI":"10.1109\/tim.2022.3224527","type":"journal-article","created":{"date-parts":[[2022,11,24]],"date-time":"2022-11-24T21:23:32Z","timestamp":1669325012000},"page":"1-8","source":"Crossref","is-referenced-by-count":21,"title":["On the Field-Reconstruction Method for Electromagnetic Modeling of Resolvers"],"prefix":"10.1109","volume":"72","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-3694-2924","authenticated-orcid":false,"given":"Hamid","family":"Saneie","sequence":"first","affiliation":[{"name":"Electrical Engineering Department, Sharif University of Technology, Tehran, Iran"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0744-1442","authenticated-orcid":false,"given":"Zahra","family":"Nasiri-Gheidari","sequence":"additional","affiliation":[{"name":"Electrical Engineering Department, Sharif University of Technology, Tehran, Iran"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-2154-8692","authenticated-orcid":false,"given":"Anouar","family":"Belahcen","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering and Automation, Aalto University, Espoo, Finland"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","volume-title":"High-Reliability Position Control for Rugged Applications","author":"Tomassi","year":"2021"},{"key":"ref2","volume-title":"Pancake Resolvers Handbook","year":"2020"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2021.3084157"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3139656"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1049\/iet-smt.2017.0149"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2015.2409199"},{"key":"ref7","volume-title":"What 2D skew modeling brings to NVH simulations","author":"Rosu","year":"2021"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2008.2010317"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2020.2986042"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2021.3125915"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2009.2027598"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2017.2712570"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2012.2196706"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2012.2211886"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2015.2444994"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3080400"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3155747"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3080388"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2021.3079725"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3119141"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TTE.2021.3114210"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2005.859979"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/IECON.2008.4758265"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2008.2001439"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2009.2035466"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2011.2172917"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2015.2506819"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2017.2653839"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2020.3023907"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2010.2043934"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2020.2986189"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2018.2884556"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2014.2369993"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/TVT.2020.2981551"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2009.2018684"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/IAS.2005.1518782"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/20.106510"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3097409"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/10012124\/09963636.pdf?arnumber=9963636","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,2,1]],"date-time":"2024-02-01T02:49:13Z","timestamp":1706755753000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9963636\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023]]},"references-count":38,"URL":"https:\/\/doi.org\/10.1109\/tim.2022.3224527","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2023]]}}}