{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,28]],"date-time":"2025-10-28T18:45:38Z","timestamp":1761677138705,"version":"3.37.3"},"reference-count":34,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["51977117"],"award-info":[{"award-number":["51977117"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2023]]},"DOI":"10.1109\/tim.2022.3225029","type":"journal-article","created":{"date-parts":[[2022,11,28]],"date-time":"2022-11-28T19:24:51Z","timestamp":1669663491000},"page":"1-11","source":"Crossref","is-referenced-by-count":6,"title":["Defect Detection of Electrical Insulating Materials Using Optically Excited Transient Thermography and Deep Autoencoder"],"prefix":"10.1109","volume":"72","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-7421-3186","authenticated-orcid":false,"given":"Hongwei","family":"Mei","sequence":"first","affiliation":[{"name":"Tsinghua Shenzhen International Graduate School, Tsinghua University, Guangdong, Shenzhen, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-4113-5107","authenticated-orcid":false,"given":"Zekai","family":"Shen","sequence":"additional","affiliation":[{"name":"Tsinghua Shenzhen International Graduate School, Tsinghua University, Guangdong, Shenzhen, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-2542-5702","authenticated-orcid":false,"given":"Yanxin","family":"Tu","sequence":"additional","affiliation":[{"name":"Tsinghua Shenzhen International Graduate School, Tsinghua University, Guangdong, Shenzhen, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-5218-0398","authenticated-orcid":false,"given":"Lishuai","family":"Liu","sequence":"additional","affiliation":[{"name":"School of Mechanical and Power Engineering, East China University of Science and Technology, Shanghai, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-7267-6673","authenticated-orcid":false,"given":"Fanghui","family":"Yin","sequence":"additional","affiliation":[{"name":"Tsinghua Shenzhen International Graduate School, Tsinghua University, Guangdong, Shenzhen, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4178-3537","authenticated-orcid":false,"given":"Liming","family":"Wang","sequence":"additional","affiliation":[{"name":"Tsinghua Shenzhen International Graduate School, Tsinghua University, Guangdong, Shenzhen, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"volume-title":"External Insulation of Insulators and Transmission and Transformation Equipment","year":"2006","author":"Guan","key":"ref1"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3075031"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.engfailanal.2020.104665"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/MEI.2021.9399912"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.3390\/en10121987"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2005.1394021"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.4028\/www.scientific.net\/AMR.926-930.358"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.apacoust.2020.107784"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1002\/tee.23306"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.optlaseng.2019.02.001"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.infrared.2015.12.026"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2018.2834157"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/EIC.2017.8004665"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2019.2959855"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2019.2912269"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1063\/1.4884644"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/j.ndteint.2020.102264"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1016\/j.ndteint.2021.102438"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1016\/j.infrared.2004.03.012"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2008.926109"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1016\/j.optlaseng.2021.106679"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/j.ndteint.2019.102164"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2020.2984642"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2021.3101309"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2018.2883367"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/RAICS.2011.6069335"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.21236\/ada164453"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1016\/j.aei.2021.101272"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2021.108148"},{"key":"ref30","first-page":"153","article-title":"Greedy layer-wise training of deep networks","volume-title":"Proc. Adv. Neural Inf. Process. Syst. Conf.","author":"Sch\u00f6lkopf"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/JSTARS.2018.2877501"},{"volume-title":"Digital Image Processing","year":"1966","author":"Gonzalez","key":"ref32"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.3390\/s22020423"},{"volume-title":"Theory and Practice of Infrared Technology for Nondestructive Testing","year":"2001","author":"Maldague","key":"ref34"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/10012124\/09964386.pdf?arnumber=9964386","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,2,1]],"date-time":"2024-02-01T02:50:02Z","timestamp":1706755802000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9964386\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023]]},"references-count":34,"URL":"https:\/\/doi.org\/10.1109\/tim.2022.3225029","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"type":"print","value":"0018-9456"},{"type":"electronic","value":"1557-9662"}],"subject":[],"published":{"date-parts":[[2023]]}}}