{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,9]],"date-time":"2026-06-09T16:11:26Z","timestamp":1781021486039,"version":"3.54.1"},"reference-count":41,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100012166","name":"National Key Research and Development Program of China","doi-asserted-by":"publisher","award":["2021YFA1003404"],"award-info":[{"award-number":["2021YFA1003404"]}],"id":[{"id":"10.13039\/501100012166","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Guangdong Provincial Key Research and Development Program","award":["2020B010179002"],"award-info":[{"award-number":["2020B010179002"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2023]]},"DOI":"10.1109\/tim.2022.3225926","type":"journal-article","created":{"date-parts":[[2022,12,1]],"date-time":"2022-12-01T20:42:28Z","timestamp":1669927348000},"page":"1-8","source":"Crossref","is-referenced-by-count":19,"title":["Complex Permittivity Measurement Utilizing Multiple Modes of a Rectangular Cavity"],"prefix":"10.1109","volume":"72","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-4352-8035","authenticated-orcid":false,"given":"Qin","family":"Shi","sequence":"first","affiliation":[{"name":"School of Electronic and Information Engineering, South China University of Technology, Guangzhou, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5807-0365","authenticated-orcid":false,"given":"Qing-Xin","family":"Chu","sequence":"additional","affiliation":[{"name":"School of Electronic and Information Engineering, South China University of Technology, Guangzhou, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-6020-832X","authenticated-orcid":false,"given":"Mei-Zhen","family":"Xiao","sequence":"additional","affiliation":[{"name":"China Electronic Product Reliability and Environmental Testing Research Institute, Guangzhou, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9866-091X","authenticated-orcid":false,"given":"Fu-Chang","family":"Chen","sequence":"additional","affiliation":[{"name":"School of Electronic and Information Engineering, South China University of Technology, Guangzhou, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-3634-8610","authenticated-orcid":false,"given":"Xue-Quan","family":"Huang","sequence":"additional","affiliation":[{"name":"School of Electronic and Information Engineering, South China University of Technology, Guangzhou, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-5969-3495","authenticated-orcid":false,"given":"Xiao","family":"He","sequence":"additional","affiliation":[{"name":"China Electronic Product Reliability and Environmental Testing Research Institute, Guangzhou, China"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/PROC.1974.9382"},{"key":"ref2","volume-title":"Measurement and Materials Characterization","author":"Chen","year":"2004"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/PROC.1967.5719"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2022.3146879"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3147878"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3129205"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3153991"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2021.3073426"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2020.2966358"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.1983.1131471"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2015.2401231"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2020.2998565"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2022.3152511"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3157398"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2020.2978051"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2022.3142038"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.1981.1130496"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2013.2279496"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/22.920149"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2018.2830332"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/ICMMT.2007.381367"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/I2MTC48687.2022.9806628"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/19.963207"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/ICIMW.2005.1572407"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2005.854249"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2014.2313415"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2017.2662558"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2014.2336775"},{"key":"ref29","volume-title":"Basics of Measuring the Dielectric Properties of Materials","year":"2017"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2006.879885"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2021.3052874"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2015.005170"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/MWSYM.2006.249650"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/MWSYM.1997.596696"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.1983.1131473"},{"key":"ref36","volume-title":"RT\/Duroid 5870\/5880 High Frequency Laminates Rogers Co, RT\/duroid 5880 Laminates\u2014Rogers Corp., A. C. Solutions","year":"2017"},{"key":"ref37","volume-title":"RO4350B High Frequency Laminates Rogers Co, RO4350B Laminates\u2014Rogers Corp., A. C. Solutions","year":"2017"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2021.3135874"},{"key":"ref39","volume-title":"Joint Committee for Guides in Metrology (JCGM\/WG 1), Evaluation of Measurement Data-Guide to the Expression of Uncertainty in Measurement","year":"2008"},{"key":"ref40","volume-title":"Split Post Dielectric Resonators (SPDR)","year":"2017"},{"key":"ref41","volume-title":"Split Post Dielectric Resonators for Dielectric Measurements"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/10012124\/09968190.pdf?arnumber=9968190","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,2,1]],"date-time":"2024-02-01T02:39:55Z","timestamp":1706755195000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9968190\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023]]},"references-count":41,"URL":"https:\/\/doi.org\/10.1109\/tim.2022.3225926","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2023]]}}}