{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,13]],"date-time":"2026-06-13T18:36:37Z","timestamp":1781375797768,"version":"3.54.1"},"reference-count":24,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2023]]},"DOI":"10.1109\/tim.2022.3227996","type":"journal-article","created":{"date-parts":[[2022,12,9]],"date-time":"2022-12-09T18:36:36Z","timestamp":1670610996000},"page":"1-8","source":"Crossref","is-referenced-by-count":5,"title":["Sub-10 <i>\u03bc<\/i>Hz\/\u221aHz Measurement Instrumentation for 140-dB DR Frequency-Modulated MEMS Sensors"],"prefix":"10.1109","volume":"72","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-5935-1639","authenticated-orcid":false,"given":"Christian","family":"Padovani","sequence":"first","affiliation":[{"name":"Dipartimento di Elettronica, Informazione e Bioingegneria, Politecnico di Milano, Milan, Italy"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9680-350X","authenticated-orcid":false,"given":"Marco","family":"Bestetti","sequence":"additional","affiliation":[{"name":"Dipartimento di Elettronica, Informazione e Bioingegneria, Politecnico di Milano, Milan, Italy"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-1535-2987","authenticated-orcid":false,"given":"Carlo","family":"Valzasina","sequence":"additional","affiliation":[{"name":"ST Microelectronics, Cornaredo, Milano, Italy"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1974-2605","authenticated-orcid":false,"given":"Andrea Giovanni","family":"Bonfanti","sequence":"additional","affiliation":[{"name":"Dipartimento di Elettronica, Informazione e Bioingegneria, Politecnico di Milano, Milan, Italy"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2997-834X","authenticated-orcid":false,"given":"Giacomo","family":"Langfelder","sequence":"additional","affiliation":[{"name":"Dipartimento di Elettronica, Informazione e Bioingegneria, Politecnico di Milano, Milan, Italy"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6439\/ac0fbf"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/MEMS46641.2020.9056192"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/JMEMS.2021.3096031"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/JMEMS.2018.2846781"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TRANSDUCERS.2019.8808357"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ISCDG.2013.6656312"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1007\/springerreference_28001"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2012.2182866"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/MEMS51670.2022.9699447"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2021.3117939"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/INERTIAL53425.2022.9787717"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/MEMS46641.2020.9056160"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2880697"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/MEMSYS.2018.8346497"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2016.2645613"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/ESSCIRC.2014.6942106"},{"key":"ref17","volume-title":"53200A Series User Manual","year":"2022"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1049\/el.2011.1524"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/ISISS.2019.8739760"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/ICCE-Asia49877.2020.9277339"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1017\/cbo9780511541131"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TRANSDUCERS.2019.8808613"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TCOM.1980.1094619"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2004.834519"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/10012124\/09978715.pdf?arnumber=9978715","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,2,1]],"date-time":"2024-02-01T04:35:29Z","timestamp":1706762129000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9978715\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023]]},"references-count":24,"URL":"https:\/\/doi.org\/10.1109\/tim.2022.3227996","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2023]]}}}