{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,23]],"date-time":"2026-01-23T11:18:46Z","timestamp":1769167126758,"version":"3.49.0"},"reference-count":33,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"name":"Guangdong-Hong Kong Joint Project","award":["2020A0505090005"],"award-info":[{"award-number":["2020A0505090005"]}]},{"name":"Key Project in Foshan City","award":["2020001006509"],"award-info":[{"award-number":["2020001006509"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2023]]},"DOI":"10.1109\/tim.2022.3229708","type":"journal-article","created":{"date-parts":[[2022,12,15]],"date-time":"2022-12-15T19:48:21Z","timestamp":1671133701000},"page":"1-8","source":"Crossref","is-referenced-by-count":21,"title":["Multiscale Convolution-Based Probabilistic Classification for Detecting Bare PCB Defects"],"prefix":"10.1109","volume":"72","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-3630-3359","authenticated-orcid":false,"given":"Lei","family":"Lei","sequence":"first","affiliation":[{"name":"Department of Advanced Design and Systems Engineering, City University of Hong Kong, Hong Kong, SAR, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-0707-5940","authenticated-orcid":false,"given":"Han-Xiong","family":"Li","sequence":"additional","affiliation":[{"name":"Department of Advanced Design and Systems Engineering, City University of Hong Kong, Hong Kong, SAR, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-6734-249X","authenticated-orcid":false,"given":"Hai-Dong","family":"Yang","sequence":"additional","affiliation":[{"name":"Guangdong Engineering Research Center for Green Manufacturing and Energy Efficiency Optimization, Guangdong University of Technology, Guangzhou, China"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2020.3032190"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3169547"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/CISP.2011.6100553"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1007\/s10044-017-0640-9"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.optlaseng.2020.106474"},{"key":"ref6","article-title":"Very deep convolutional networks for large-scale image recognition","author":"Simonyan","year":"2014","journal-title":"arXiv:1409.1556"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2016.90"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1609\/aaai.v31i1.11231"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3056744"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3117357"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/RAECS.2014.6799537"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1007\/s11042-019-08097-9"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2017.2783098"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/CSIT52700.2021.9648731"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/ICFSP.2018.8552045"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1049\/joe.2018.8275"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1049\/trit.2019.0019"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2021.3070507"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3153997"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3154814"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1016\/j.eswa.2021.115673"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1155\/2021\/7550670"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TASE.2019.2900170"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2020.3040485"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3077994"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3096284"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3200361"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2019.2958826"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3053987"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3200861"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1080\/00224065.1984.11978921"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1049\/joe.2019.1183"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV.2017.74"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/10012124\/09989396.pdf?arnumber=9989396","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,3,14]],"date-time":"2024-03-14T02:05:52Z","timestamp":1710381952000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9989396\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023]]},"references-count":33,"URL":"https:\/\/doi.org\/10.1109\/tim.2022.3229708","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2023]]}}}