{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,8,1]],"date-time":"2026-08-01T17:11:04Z","timestamp":1785604264166,"version":"3.56.0"},"reference-count":25,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2023]]},"DOI":"10.1109\/tim.2023.3235426","type":"journal-article","created":{"date-parts":[[2023,1,9]],"date-time":"2023-01-09T19:56:54Z","timestamp":1673294214000},"page":"1-10","source":"Crossref","is-referenced-by-count":26,"title":["Pedestrian Indoor Localization Method Based on Integrated Particle Filter"],"prefix":"10.1109","volume":"72","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-2638-9643","authenticated-orcid":false,"given":"Ling-Feng","family":"Shi","sequence":"first","affiliation":[{"name":"Institute of Electronic CAD, Xidian University, Xi&#x2019;an, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9494-0217","authenticated-orcid":false,"given":"Bao-Lin","family":"Feng","sequence":"additional","affiliation":[{"name":"Institute of Electronic CAD, Xidian University, Xi&#x2019;an, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-6049-9339","authenticated-orcid":false,"given":"Yi-Fan","family":"Dai","sequence":"additional","affiliation":[{"name":"Institute of Electronic CAD, Xidian University, Xi&#x2019;an, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1256-3241","authenticated-orcid":false,"given":"Gong-Xu","family":"Liu","sequence":"additional","affiliation":[{"name":"Institute of Electronic CAD, Xidian University, Xi&#x2019;an, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3697-4731","authenticated-orcid":false,"given":"Yifan","family":"Shi","sequence":"additional","affiliation":[{"name":"Department of Mechanical and Material Engineering, Queen&#x2019;s University, Kingston, ON, Canada"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/JIOT.2020.3011402"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3128706"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3135344"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3069486"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TMC.2018.2857772"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2018.2846481"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3132075"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3123293"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TASLP.2019.2935837"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ICTC.2018.8539576"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/MFI.2012.6343024"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/ETFA.2009.5347181"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.3390\/app10020668"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2020.3029281"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2019.2909195"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2017.2751572"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2007.911646"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2019.2927053"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2018.2869262"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/IPIN.2014.7275542"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/IROS.2013.6696459"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.3390\/s17112678"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3052026"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.23919\/ICIF.2018.8455789"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1007\/s11277-021-08951-w"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/10012124\/10012375.pdf?arnumber=10012375","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,2,9]],"date-time":"2024-02-09T08:37:12Z","timestamp":1707467832000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10012375\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023]]},"references-count":25,"URL":"https:\/\/doi.org\/10.1109\/tim.2023.3235426","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2023]]}}}