{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,10]],"date-time":"2026-07-10T00:06:36Z","timestamp":1783641996798,"version":"3.55.0"},"reference-count":106,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/legalcode"}],"funder":[{"name":"Khalifa University of Science and Technology, Abu Dhabi, United Arab Emirates","award":["CIRA-2020-037"],"award-info":[{"award-number":["CIRA-2020-037"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2023]]},"DOI":"10.1109\/tim.2023.3238036","type":"journal-article","created":{"date-parts":[[2023,1,19]],"date-time":"2023-01-19T18:48:49Z","timestamp":1674154129000},"page":"1-18","source":"Crossref","is-referenced-by-count":84,"title":["Detection of Surface Cracks in Metals Using Microwave and Millimeter-Wave Nondestructive Testing Techniques\u2014A Review"],"prefix":"10.1109","volume":"72","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-0653-9539","authenticated-orcid":false,"given":"Mohamed A.","family":"Abou-Khousa","sequence":"first","affiliation":[{"name":"Electrical Engineering and Computer Science Department, Khalifa University of Science and Technology, Abu Dhabi, United Arab Emirates"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-6464-453X","authenticated-orcid":false,"given":"Mohammed Saif Ur","family":"Rahman","sequence":"additional","affiliation":[{"name":"Electrical Engineering and Computer Science Department, Khalifa University of Science and Technology, Abu Dhabi, United Arab Emirates"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-8725-5484","authenticated-orcid":false,"given":"Kristen M.","family":"Donnell","sequence":"additional","affiliation":[{"name":"Department of Electrical and Computer Engineering, Missouri University of Science and Technology, Rolla, MO, USA"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-6003-5078","authenticated-orcid":false,"given":"Mohammad Tayeb Al","family":"Qaseer","sequence":"additional","affiliation":[{"name":"Department of Electrical and Computer Engineering (ECpE), Iowa State University, Ames, IA, USA"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1680\/feng.2011.164.1.15"},{"key":"ref2","author":"W\u00e5le","year":"1995","journal-title":"Crack characterisation for in-service inspection planning"},{"key":"ref3","volume-title":"Crack characterisation for in-service inspection planning: An update","author":"W\u00e5le","year":"2006"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.promfg.2017.02.086"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1002\/stc.1655"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.2172\/1183636"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1201\/9780203911068"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1520\/STP27595S"},{"key":"ref9","article-title":"Microwave nondestructive testing methods","volume-title":"Nondestructive Testing Monographs and Tracts; Gordon and Breach","author":"Bahr"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1007\/978-94-015-1303-6"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/MIM.2007.364985"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1111\/j.1460-2695.2008.01255.x"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.3390\/met6080172"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1098\/rsta.2019.0585"},{"key":"ref15","first-page":"1","article-title":"Surface crack detection by microwave methods","volume-title":"Proc. 6th Symp. Nondestruct. Eval. Aerosp. Weapons Syst. Compon. Mater.","author":"Feinstein"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1063\/1.1684617"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TAP.1979.1142180"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/I2MTC.2014.6860934"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2017.2735658"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.3390\/s19061376"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/I2MTC43012.2020.9129478"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2020.2978317"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.23919\/IRS48640.2020.9253797"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3088468"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3122168"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/CPEM.1994.333291"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/ICIMW.2000.893090"},{"key":"ref28","first-page":"1228","article-title":"Interaction of surface cracks in metals with open-ended coaxial probes at microwave frequencies","volume":"2000","author":"Wang","journal-title":"Mater. Eval."},{"issue":"10","key":"ref29","first-page":"1253","article-title":"Moment method solution for modeling the interaction of open ended coaxial probes and surface cracks in metals","volume":"60","author":"Wang","year":"2002","journal-title":"Mater. Eval."},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2012.2199193"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1016\/j.ndteint.2012.11.002"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2014.2317295"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/19.328896"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1080\/09349849508968091"},{"issue":"6","key":"ref35","first-page":"676","article-title":"A novel microwave method for surface crack detection using higher order waveguide modes","volume":"52","author":"Yeh","year":"1994","journal-title":"Mater. Eval."},{"issue":"4","key":"ref36","first-page":"496","article-title":"Sizing technique for slots and surface cracks in metals","volume":"53","author":"Yeh","year":"1995","journal-title":"Mater. Eval."},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/45.539960"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/22.566626"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1109\/22.644234"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1080\/10589759708953032"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1080\/10589759808953057"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1080\/09349840008968164"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1016\/S0963-8695(03)00005-7"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1049\/el:20058436"},{"key":"ref45","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2006.884282"},{"key":"ref46","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2009.2022380"},{"key":"ref47","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2009.2027780"},{"key":"ref48","doi-asserted-by":"publisher","DOI":"10.1016\/j.ndteint.2009.08.004"},{"key":"ref49","doi-asserted-by":"publisher","DOI":"10.1016\/j.ndteint.2012.10.004"},{"key":"ref50","doi-asserted-by":"publisher","DOI":"10.1016\/j.ndteint.2014.12.005"},{"key":"ref51","doi-asserted-by":"publisher","DOI":"10.1007\/s10921-018-0526-9"},{"key":"ref52","doi-asserted-by":"publisher","DOI":"10.1016\/j.matdes.2020.109151"},{"key":"ref53","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2017.2669301"},{"key":"ref54","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2018.2882695"},{"key":"ref55","doi-asserted-by":"publisher","DOI":"10.1049\/el:20011051"},{"key":"ref56","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2005.851086"},{"key":"ref57","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2011.2149370"},{"key":"ref58","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2006.873818"},{"key":"ref59","doi-asserted-by":"publisher","DOI":"10.1016\/j.sna.2014.04.006"},{"key":"ref60","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2014.2309897"},{"key":"ref61","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2019.2907129"},{"key":"ref62","doi-asserted-by":"publisher","DOI":"10.1109\/LMWC.2017.2788640"},{"key":"ref63","doi-asserted-by":"publisher","DOI":"10.1109\/OJIM.2022.3198483"},{"key":"ref64","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2006.880273"},{"key":"ref65","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2008.2009131"},{"key":"ref66","doi-asserted-by":"publisher","DOI":"10.1109\/I2MTC.2019.8826970"},{"key":"ref67","doi-asserted-by":"publisher","DOI":"10.1109\/EUMA.1973.331765"},{"key":"ref68","doi-asserted-by":"publisher","DOI":"10.1109\/EUMA.1975.332181"},{"key":"ref69","doi-asserted-by":"publisher","DOI":"10.1088\/0957-0233\/4\/5\/007"},{"key":"ref70","doi-asserted-by":"publisher","DOI":"10.1063\/1.1900683"},{"key":"ref71","doi-asserted-by":"publisher","DOI":"10.1088\/0957-0233\/19\/10\/105701"},{"key":"ref72","doi-asserted-by":"publisher","DOI":"10.1109\/LMWC.2012.2197384"},{"key":"ref73","doi-asserted-by":"publisher","DOI":"10.3390\/s141019354"},{"key":"ref74","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2017.2673823"},{"key":"ref75","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2020.3017536"},{"key":"ref76","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2018.2815437"},{"key":"ref77","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2020.3032617"},{"key":"ref78","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2019.2937532"},{"key":"ref79","doi-asserted-by":"publisher","DOI":"10.3390\/s20092670"},{"key":"ref80","doi-asserted-by":"publisher","DOI":"10.1109\/IST50367.2021.9651442"},{"key":"ref81","doi-asserted-by":"publisher","DOI":"10.1109\/I2MTC48687.2022.9806572"},{"key":"ref82","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2020.3008386"},{"key":"ref83","doi-asserted-by":"publisher","DOI":"10.1587\/elex.13.20160715"},{"key":"ref84","doi-asserted-by":"publisher","DOI":"10.26866\/jees.2020.20.4.285"},{"key":"ref85","doi-asserted-by":"publisher","DOI":"10.26866\/jees.2021.3.r.23"},{"key":"ref86","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2018.2843601"},{"key":"ref87","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2016.2596080"},{"key":"ref88","doi-asserted-by":"publisher","DOI":"10.1617\/s11527-016-0843-3"},{"key":"ref89","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2020.3003394"},{"key":"ref90","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3060596"},{"key":"ref91","doi-asserted-by":"publisher","DOI":"10.1260\/1369-4332.14.1.47"},{"key":"ref92","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2017.2786696"},{"key":"ref93","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2015.2457455"},{"key":"ref94","doi-asserted-by":"publisher","DOI":"10.1088\/0964-1726\/22\/8\/085009"},{"key":"ref95","doi-asserted-by":"publisher","DOI":"10.1016\/j.ndteint.2016.11.002"},{"key":"ref96","doi-asserted-by":"publisher","DOI":"10.1109\/TAP.2019.2916672"},{"key":"ref97","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2020.3028296"},{"key":"ref98","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3065432"},{"key":"ref99","doi-asserted-by":"publisher","DOI":"10.1109\/LSENS.2021.3083218"},{"key":"ref100","doi-asserted-by":"publisher","DOI":"10.1002\/9781394180042"},{"key":"ref101","doi-asserted-by":"publisher","DOI":"10.1002\/9780470290996"},{"key":"ref102","volume-title":"International Vocabulary of Metrology\u2014Basic and General Concepts and Associated Terms","year":"2012"},{"key":"ref103","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2020.3026122"},{"key":"ref104","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2020.3002443"},{"key":"ref105","doi-asserted-by":"publisher","DOI":"10.1109\/TAP.2011.2173145"},{"key":"ref106","doi-asserted-by":"publisher","DOI":"10.1109\/TAP.2016.2630598"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/10012124\/10021671.pdf?arnumber=10021671","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,2,13]],"date-time":"2024-02-13T06:09:17Z","timestamp":1707804557000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10021671\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023]]},"references-count":106,"URL":"https:\/\/doi.org\/10.1109\/tim.2023.3238036","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2023]]}}}