{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,6,6]],"date-time":"2025-06-06T04:51:01Z","timestamp":1749185461596,"version":"3.37.3"},"reference-count":52,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/100012542","name":"Sichuan Science and Technology Program","doi-asserted-by":"publisher","award":["2020JDTD0009"],"award-info":[{"award-number":["2020JDTD0009"]}],"id":[{"id":"10.13039\/100012542","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100015965","name":"Science and Technology Project of Yunnan Power Grid Company Ltd","doi-asserted-by":"publisher","award":["YNKJXM20191243"],"award-info":[{"award-number":["YNKJXM20191243"]}],"id":[{"id":"10.13039\/501100015965","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100021171","name":"Basic and Applied Basic Research Foundation of Guangdong Province","doi-asserted-by":"publisher","award":["2020B1515130001"],"award-info":[{"award-number":["2020B1515130001"]}],"id":[{"id":"10.13039\/501100021171","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2023]]},"DOI":"10.1109\/tim.2023.3238057","type":"journal-article","created":{"date-parts":[[2023,1,19]],"date-time":"2023-01-19T18:48:49Z","timestamp":1674154129000},"page":"1-14","source":"Crossref","is-referenced-by-count":6,"title":["Parameter Extraction for the Degradation of On-Board Arrester in High-Speed Railway Under Effects of Multiple Strokes"],"prefix":"10.1109","volume":"72","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-6070-0020","authenticated-orcid":false,"given":"Lijun","family":"Zhou","sequence":"first","affiliation":[{"name":"School of Electrical Engineering, Southwest Jiaotong University, Chengdu, Sichuan, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-7618-7970","authenticated-orcid":false,"given":"Lin","family":"Huang","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering, Southwest Jiaotong University, Chengdu, Sichuan, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-7234-6209","authenticated-orcid":false,"given":"Zhicong","family":"Lin","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering, Southwest Jiaotong University, Chengdu, Sichuan, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-5881-8727","authenticated-orcid":false,"given":"Renwei","family":"Wei","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering, Southwest Jiaotong University, Chengdu, Sichuan, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9402-2769","authenticated-orcid":false,"given":"Dongyang","family":"Wang","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering, Southwest Jiaotong University, Chengdu, Sichuan, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-6629-3924","authenticated-orcid":false,"given":"Yutang","family":"Ma","sequence":"additional","affiliation":[{"name":"Faculty of Land and Resources Engineering, Kunming University of Science and Technology, Kunming, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8512-2079","authenticated-orcid":false,"given":"Jiekang","family":"Wu","sequence":"additional","affiliation":[{"name":"School of Automation, Guangdong University of Technology, Guangzhou, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3169755"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3191723"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3117360"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3109394"},{"issue":"3","key":"ref5","first-page":"1","article-title":"Study on temperature distribution measurement and defect simulation of roof arrester of EMU","volume":"46","author":"Lv","year":"2021","journal-title":"Power Syst. Technol."},{"key":"ref6","first-page":"99","article-title":"Study on transient overvoltage during pantograph lifting and lowering of intercity train","volume-title":"Proc. 4th ACEEE","author":"Liang"},{"issue":"2","key":"ref7","first-page":"399","article-title":"Lightning protection system of traction power supply system for high-speed railway","volume":"39","author":"Zhou","year":"2013","journal-title":"High Volt. Eng."},{"issue":"10","key":"ref8","first-page":"68","article-title":"Calculation of trip rate of high-speed railway traction network caused by direct lightning","volume":"39","author":"Wang","year":"2017","journal-title":"J. China Railway Soc."},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TEMC.2012.2187339"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2017.2736551"},{"volume-title":"IEC: Protection Against Lightning\u2014Part 1: General Principles","year":"2010","key":"ref11"},{"key":"ref12","first-page":"960","article-title":"Effects of multiple stroke on ZnO surge arresters","volume-title":"Proc. 24th ICLP","author":"Vahidi"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/61.636934"},{"issue":"12","key":"ref14","first-page":"3785","article-title":"Degradation performance of ZnO varistor under multi-pulse lightning impulse","volume":"45","author":"Xu","year":"2019","journal-title":"High Volt. Eng."},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2013.2283911"},{"issue":"11","key":"ref16","first-page":"2763","article-title":"Effect of multiple lightning strikes on the performance of ZnO lightning arrester block","volume":"37","author":"Haryono","year":"2011","journal-title":"High Volt. Eng."},{"issue":"11","key":"ref17","first-page":"3792","article-title":"Destructive forms of metal oxides under multiple lightning impulses","volume":"43","author":"Li","year":"2017","journal-title":"High Volt. Eng."},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.3390\/electronics9060930"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2016.2535324"},{"volume-title":"Surge Arresters\u2014Part 4: Metal\u2013Oxide Surge Arresters Without Gaps for A.C. Systems","year":"2014","key":"ref20"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/IPMHVC.2014.7287341"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2006.1593416"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2009.2013375"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2009.2013402"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2017.006334"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1049\/smt2.12039"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/ICHVE.2018.8641858"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/MEI.2016.7414229"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2015.2506785"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/tpwrd.2022.3141397"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3196448"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2019.2959500"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3070622"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3127306"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3193413"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2015.005175"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/LSENS.2021.3123097"},{"volume-title":"Zinc Oxide Ceramics Manufacture and Application","year":"2009","author":"Wang","key":"ref38"},{"issue":"15","key":"ref39","article-title":"Characterization of defectsing in ZnO varistor ceramics","volume":"61","author":"Zhao","year":"2012","journal-title":"Acta Phys. Sinica"},{"volume-title":"Dielectric and Resistive Properties of Solid Insulating Materials\u2014Part 2\u20131: Relative Permittivity and Dissipation Factor\u2014Technical Frequencies (0,1 Hz to 10 MHz)\u2014AC Methods","year":"2018","key":"ref40"},{"volume-title":"Test Methods for Properties of Structure Ceramic Used in Electronic Components and Device\u2014Part 4: Test Method for Permittivity and Dielectric Loss Angle Tangent Value","year":"2015","key":"ref41"},{"issue":"3","key":"ref42","first-page":"63","article-title":"Research progress of degradation mechanism of ZnO varistors","volume":"29","author":"Liu","year":"2010","journal-title":"Adv. Technol. Electr. Eng. Energy"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2018.007036"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1063\/1.321701"},{"key":"ref45","doi-asserted-by":"publisher","DOI":"10.1049\/hve2.12072"},{"key":"ref46","doi-asserted-by":"publisher","DOI":"10.1016\/j.epsr.2018.08.001"},{"key":"ref47","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2019.2952736"},{"key":"ref48","doi-asserted-by":"publisher","DOI":"10.3390\/en13020323"},{"key":"ref49","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2022.3177567"},{"key":"ref50","doi-asserted-by":"publisher","DOI":"10.1109\/TTE.2021.3069014"},{"key":"ref51","doi-asserted-by":"publisher","DOI":"10.1016\/j.advengsoft.2013.12.007"},{"key":"ref52","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3193705"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/10012124\/10021661.pdf?arnumber=10021661","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,2,13]],"date-time":"2024-02-13T08:31:32Z","timestamp":1707813092000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10021661\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023]]},"references-count":52,"URL":"https:\/\/doi.org\/10.1109\/tim.2023.3238057","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"type":"print","value":"0018-9456"},{"type":"electronic","value":"1557-9662"}],"subject":[],"published":{"date-parts":[[2023]]}}}