{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,1]],"date-time":"2025-10-01T15:21:28Z","timestamp":1759332088802,"version":"3.37.3"},"reference-count":35,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100004731","name":"Zhejiang Provincial Natural Science Foundation of China","doi-asserted-by":"publisher","award":["LZ21F030004"],"award-info":[{"award-number":["LZ21F030004"]}],"id":[{"id":"10.13039\/501100004731","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Key Research and Development Program of Zhejiang","award":["2022C01018"],"award-info":[{"award-number":["2022C01018"]}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["U21B2001"],"award-info":[{"award-number":["U21B2001"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2023]]},"DOI":"10.1109\/tim.2023.3239637","type":"journal-article","created":{"date-parts":[[2023,1,31]],"date-time":"2023-01-31T18:40:23Z","timestamp":1675190423000},"page":"1-9","source":"Crossref","is-referenced-by-count":6,"title":["A New Residual Generation-Based Fault Estimation Approach for Cyber-Physical Systems"],"prefix":"10.1109","volume":"72","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-1550-7683","authenticated-orcid":false,"given":"Jun-Wei","family":"Zhu","sequence":"first","affiliation":[{"name":"Institute of Cyberspace Security, College of Information Engineering, Zhejiang University of Technology, Hangzhou, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-2943-1253","authenticated-orcid":false,"given":"Zhen-Hao","family":"Xia","sequence":"additional","affiliation":[{"name":"Institute of Cyberspace Security, College of Information Engineering, Zhejiang University of Technology, Hangzhou, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8707-9908","authenticated-orcid":false,"given":"Xin","family":"Wang","sequence":"additional","affiliation":[{"name":"School of Mathematical Science and the Heilongjiang Provincial Key Laboratory of the Theory and Computation of Complex Systems, Heilongjiang University, Harbin, China"}]}],"member":"263","reference":[{"doi-asserted-by":"publisher","key":"ref1","DOI":"10.1109\/TIM.2016.2575179"},{"doi-asserted-by":"publisher","key":"ref2","DOI":"10.1016\/j.automatica.2018.10.047"},{"doi-asserted-by":"publisher","key":"ref3","DOI":"10.1109\/TIM.2018.2847800"},{"doi-asserted-by":"publisher","key":"ref4","DOI":"10.1007\/s10462-020-09934-2"},{"doi-asserted-by":"publisher","key":"ref5","DOI":"10.1109\/TIM.2019.2902003"},{"doi-asserted-by":"publisher","key":"ref6","DOI":"10.1016\/j.neucom.2019.06.029"},{"doi-asserted-by":"publisher","key":"ref7","DOI":"10.1016\/j.neucom.2018.04.037"},{"doi-asserted-by":"publisher","key":"ref8","DOI":"10.1016\/j.renene.2017.12.102"},{"doi-asserted-by":"publisher","key":"ref9","DOI":"10.1016\/j.enbuild.2013.08.044"},{"doi-asserted-by":"publisher","key":"ref10","DOI":"10.1109\/TIE.2017.2774777"},{"doi-asserted-by":"publisher","key":"ref11","DOI":"10.1016\/j.automatica.2014.08.022"},{"doi-asserted-by":"publisher","key":"ref12","DOI":"10.1016\/j.jprocont.2016.04.004"},{"doi-asserted-by":"publisher","key":"ref13","DOI":"10.1109\/TCST.2018.2885963"},{"doi-asserted-by":"publisher","key":"ref14","DOI":"10.1016\/j.amc.2018.06.022"},{"doi-asserted-by":"publisher","key":"ref15","DOI":"10.1109\/TFUZZ.2017.2690627"},{"doi-asserted-by":"publisher","key":"ref16","DOI":"10.1016\/j.jfranklin.2020.05.047"},{"doi-asserted-by":"publisher","key":"ref17","DOI":"10.1109\/TIE.2011.2182011"},{"doi-asserted-by":"publisher","key":"ref18","DOI":"10.1109\/TAC.2015.2491898"},{"doi-asserted-by":"publisher","key":"ref19","DOI":"10.1109\/TIE.2020.3001857"},{"doi-asserted-by":"publisher","key":"ref20","DOI":"10.1016\/j.neucom.2018.11.055"},{"doi-asserted-by":"publisher","key":"ref21","DOI":"10.1016\/j.jprocont.2013.08.011"},{"doi-asserted-by":"publisher","key":"ref22","DOI":"10.1109\/TII.2020.2987840"},{"doi-asserted-by":"publisher","key":"ref23","DOI":"10.1109\/TIM.2019.2900143"},{"doi-asserted-by":"publisher","key":"ref24","DOI":"10.1109\/TIM.2020.3033943"},{"doi-asserted-by":"publisher","key":"ref25","DOI":"10.1007\/978-1-4471-6410-4"},{"doi-asserted-by":"publisher","key":"ref26","DOI":"10.1109\/TSP.2012.2208638"},{"doi-asserted-by":"publisher","key":"ref27","DOI":"10.1109\/TAC.2011.2173422"},{"doi-asserted-by":"publisher","key":"ref28","DOI":"10.1016\/j.automatica.2016.04.020"},{"doi-asserted-by":"publisher","key":"ref29","DOI":"10.1016\/j.automatica.2018.03.035"},{"doi-asserted-by":"publisher","key":"ref30","DOI":"10.1109\/TCYB.2020.3010222"},{"doi-asserted-by":"publisher","key":"ref31","DOI":"10.1109\/TAC.2021.3053194"},{"doi-asserted-by":"publisher","key":"ref32","DOI":"10.1016\/j.automatica.2020.109246"},{"doi-asserted-by":"publisher","key":"ref33","DOI":"10.1016\/j.automatica.2022.110388"},{"doi-asserted-by":"publisher","key":"ref34","DOI":"10.1201\/9780203749999"},{"doi-asserted-by":"publisher","key":"ref35","DOI":"10.1109\/TAC.2015.2492159"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/10012124\/10033087.pdf?arnumber=10033087","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,2,13]],"date-time":"2024-02-13T12:29:14Z","timestamp":1707827354000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10033087\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023]]},"references-count":35,"URL":"https:\/\/doi.org\/10.1109\/tim.2023.3239637","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"type":"print","value":"0018-9456"},{"type":"electronic","value":"1557-9662"}],"subject":[],"published":{"date-parts":[[2023]]}}}