{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,17]],"date-time":"2026-03-17T20:08:53Z","timestamp":1773778133279,"version":"3.50.1"},"reference-count":31,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundations of China","doi-asserted-by":"publisher","award":["51975377"],"award-info":[{"award-number":["51975377"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundations of China","doi-asserted-by":"publisher","award":["52005335"],"award-info":[{"award-number":["52005335"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Shanghai Sailing Program","award":["21YF1430600"],"award-info":[{"award-number":["21YF1430600"]}]},{"DOI":"10.13039\/501100019082","name":"Shanghai Aerospace Science and Technology Innovation Foundation","doi-asserted-by":"publisher","award":["SAST2020-052"],"award-info":[{"award-number":["SAST2020-052"]}],"id":[{"id":"10.13039\/501100019082","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2023]]},"DOI":"10.1109\/tim.2023.3242006","type":"journal-article","created":{"date-parts":[[2023,2,3]],"date-time":"2023-02-03T18:47:40Z","timestamp":1675450060000},"page":"1-12","source":"Crossref","is-referenced-by-count":15,"title":["Tensor Denoising Assisted Time-Reassigned Synchrosqueezing Wavelet Transform for Gear Fault Diagnosis"],"prefix":"10.1109","volume":"72","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-6289-4607","authenticated-orcid":false,"given":"Wenyue","family":"Hu","sequence":"first","affiliation":[{"name":"School of Mechanical Engineering, University of Shanghai for Science and Technology, Shanghai, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-6978-7142","authenticated-orcid":false,"given":"Jing","family":"Yuan","sequence":"additional","affiliation":[{"name":"School of Mechanical Engineering, University of Shanghai for Science and Technology, Shanghai, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1633-0429","authenticated-orcid":false,"given":"Huiming","family":"Jiang","sequence":"additional","affiliation":[{"name":"School of Mechanical Engineering, University of Shanghai for Science and Technology, Shanghai, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-2150-6257","authenticated-orcid":false,"given":"Qian","family":"Zhao","sequence":"additional","affiliation":[{"name":"School of Mechanical Engineering, University of Shanghai for Science and Technology, Shanghai, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-6949-561X","authenticated-orcid":false,"given":"Chao","family":"Li","sequence":"additional","affiliation":[{"name":"Shanghai Radio Equipment Institute, Shanghai, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4994-1544","authenticated-orcid":false,"given":"Ze","family":"Yao","sequence":"additional","affiliation":[{"name":"School of Mechanical Engineering, University of Shanghai for Science and Technology, Shanghai, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2019.05.050"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3094838"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.acha.2010.08.002"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2868296"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2020.3045841"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1142\/S0219530520400047"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3161696"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2018.08.004"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2020.2970571"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2020.2964109"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2015.08.023"},{"issue":"4","key":"ref12","first-page":"1814","article-title":"Time-frequency representation enhancement: Approach based on image filtering methods","volume":"78","author":"Djurovi","year":"2016","journal-title":"Rand. Oele. Comput. Syst."},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2020.106754"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2020.2972935"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2019.2938905"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1155\/2021\/8855878"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2022.108834"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2020.2996717"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2017.02.036"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2020.107174"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2022.3177144"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1006\/dspr.2002.0456"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1016\/j.isatra.2022.02.017"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2020.3006776"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2008.09.009"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2020.107574"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2020.2984983"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1016\/j.sigpro.2019.107275"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRS.2008.919249"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/LGRS.2020.2997999"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/78.382394"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/10012124\/10036029.pdf?arnumber=10036029","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,2,13]],"date-time":"2024-02-13T13:51:00Z","timestamp":1707832260000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10036029\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023]]},"references-count":31,"URL":"https:\/\/doi.org\/10.1109\/tim.2023.3242006","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2023]]}}}