{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,9]],"date-time":"2026-04-09T17:25:23Z","timestamp":1775755523661,"version":"3.50.1"},"reference-count":49,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["52127809"],"award-info":[{"award-number":["52127809"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["51625501"],"award-info":[{"award-number":["51625501"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100004826","name":"Beijing Natural Science Foundation","doi-asserted-by":"publisher","award":["4214074"],"award-info":[{"award-number":["4214074"]}],"id":[{"id":"10.13039\/501100004826","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2023]]},"DOI":"10.1109\/tim.2023.3244803","type":"journal-article","created":{"date-parts":[[2023,2,14]],"date-time":"2023-02-14T18:29:23Z","timestamp":1676399363000},"page":"1-13","source":"Crossref","is-referenced-by-count":10,"title":["Fusing Dense Features and Pose Consistency: A Regression Method for Attitude Measurement of Aircraft Landing"],"prefix":"10.1109","volume":"72","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-5550-7699","authenticated-orcid":false,"given":"Mingkun","family":"Liu","sequence":"first","affiliation":[{"name":"Key Laboratory of Precision Opto-Mechatronics Technology, Ministry of Education, School of Instrumentation and Optoelectronic Engineering, Beihang University, Beijing, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1949-5958","authenticated-orcid":false,"given":"Guangkun","family":"Feng","sequence":"additional","affiliation":[{"name":"Key Laboratory of Precision Opto-Mechatronics Technology, Ministry of Education, School of Instrumentation and Optoelectronic Engineering, Beihang University, Beijing, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-0835-5792","authenticated-orcid":false,"given":"Ting-Bing","family":"Xu","sequence":"additional","affiliation":[{"name":"Key Laboratory of Precision Opto-Mechatronics Technology, Ministry of Education, School of Instrumentation and Optoelectronic Engineering, Beihang University, Beijing, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2033-2040","authenticated-orcid":false,"given":"Fulin","family":"Liu","sequence":"additional","affiliation":[{"name":"Key Laboratory of Precision Opto-Mechatronics Technology, Ministry of Education, School of Instrumentation and Optoelectronic Engineering, Beihang University, Beijing, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8925-9259","authenticated-orcid":false,"given":"Zhenzhong","family":"Wei","sequence":"additional","affiliation":[{"name":"Key Laboratory of Precision Opto-Mechatronics Technology, Ministry of Education, School of Instrumentation and Optoelectronic Engineering, Beihang University, Beijing, China"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1117\/12.445395"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ICIEA.2009.5138201"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/LGRS.2012.2214022"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.3390\/s19092165"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1155\/2019\/7389652"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.3390\/rs13040663"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2021.3075889"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV.2019.00777"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR46437.2021.01634"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV.2011.6126326"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/IROS.2015.7354005"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV.2017.169"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1007\/s11263-019-01243-8"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.2004.92"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1561\/0600000001"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV.2017.413"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2018.00038"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2019.00469"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3115564"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV.2019.00203"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR42600.2020.01172"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.15607\/RSS.2018.XIV.019"},{"key":"ref23","article-title":"Deep-6DPose: Recovering 6D object pose from a single RGB image","author":"Do","year":"2018","journal-title":"arXiv:1802.10367"},{"key":"ref24","article-title":"EfficientPose: An efficient, accurate and scalable end-to-end 6D multi object pose estimation approach","author":"Bukschat","year":"2020","journal-title":"arXiv:2011.04307"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR42600.2020.00300"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR42600.2020.00812"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1049\/el:20081184"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/IROS.2009.5354041"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1002\/rob.20387"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.3182\/20120213-3-IN-4034.00035"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TAES.2016.14-0534"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/ROBOT.2007.363169"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/IROS.2007.4399216"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1016\/j.proeng.2011.08.109"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/ACC.2011.5991109"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/AIM.2013.6584225"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.3390\/s18082655"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2019.00589"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2018.00375"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1109\/TNNLS.2020.3027634"},{"key":"ref41","first-page":"1","article-title":"On the variance of the adaptive learning rate and beyond","volume-title":"Proc. Int. Conf. Learn. Represent.","author":"Liu"},{"key":"ref42","first-page":"9593","article-title":"Lookahead optimizer: k steps forward, 1 step back","volume-title":"Proc. Adv. Neural Inf. Process. Syst.","author":"Zhang"},{"key":"ref43","first-page":"1","article-title":"SGDR: Stochastic gradient descent with warm restarts","volume-title":"Proc. Int. Conf. Learn. Represent.","author":"Loshchilov"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-37331-2_42"},{"key":"ref45","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-030-66096-3_39"},{"key":"ref46","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2019.00350"},{"key":"ref47","doi-asserted-by":"publisher","DOI":"10.1007\/s11263-019-01250-9"},{"key":"ref48","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-030-58520-4_34"},{"key":"ref49","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR46437.2021.01283"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/10012124\/10044130.pdf?arnumber=10044130","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,2,13]],"date-time":"2024-02-13T15:11:58Z","timestamp":1707837118000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10044130\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023]]},"references-count":49,"URL":"https:\/\/doi.org\/10.1109\/tim.2023.3244803","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2023]]}}}