{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,17]],"date-time":"2026-04-17T16:53:47Z","timestamp":1776444827095,"version":"3.51.2"},"reference-count":35,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100004543","name":"China Scholarship Council","doi-asserted-by":"publisher","award":["202106840063"],"award-info":[{"award-number":["202106840063"]}],"id":[{"id":"10.13039\/501100004543","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100000288","name":"Royal Society","doi-asserted-by":"publisher","award":["IECNSFC211012"],"award-info":[{"award-number":["IECNSFC211012"]}],"id":[{"id":"10.13039\/501100000288","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2023]]},"DOI":"10.1109\/tim.2023.3250308","type":"journal-article","created":{"date-parts":[[2023,2,28]],"date-time":"2023-02-28T18:33:05Z","timestamp":1677609185000},"page":"1-12","source":"Crossref","is-referenced-by-count":19,"title":["Reliable and Intelligent Fault Diagnosis With Evidential VGG Neural Networks"],"prefix":"10.1109","volume":"72","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-2826-4385","authenticated-orcid":false,"given":"Hanting","family":"Zhou","sequence":"first","affiliation":[{"name":"School of Economics and Management, Nanjing University of Science and Technology, Nanjing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-2236-7076","authenticated-orcid":false,"given":"Wenhe","family":"Chen","sequence":"additional","affiliation":[{"name":"School of Economics and Management, Nanjing University of Science and Technology, Nanjing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-3693-8311","authenticated-orcid":false,"given":"Longsheng","family":"Cheng","sequence":"additional","affiliation":[{"name":"School of Economics and Management, Nanjing University of Science and Technology, Nanjing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2247-7454","authenticated-orcid":false,"given":"Darren","family":"Williams","sequence":"additional","affiliation":[{"name":"School of Engineering, Lancaster University, Lancaster, U.K"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5871-639X","authenticated-orcid":false,"given":"Clarence W.","family":"De Silva","sequence":"additional","affiliation":[{"name":"Department of Mechanical Engineering, The University of British Columbia, BC V6T 1Z4, Vancouver, Canada"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-8057-9654","authenticated-orcid":false,"given":"Min","family":"Xia","sequence":"additional","affiliation":[{"name":"School of Engineering, Lancaster University, Lancaster, U.K"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2021.107938"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.neuroimage.2019.03.042"},{"key":"ref3","first-page":"1","article-title":"Can you trust your model\u2019s uncertainty? Evaluating predictive uncertainty under dataset shift","volume-title":"Proc. Adv. Neural Inf. Process. Syst.","volume":"32","author":"Ovadia"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.inffus.2021.05.008"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TNNLS.2021.3086757"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/LRA.2020.2974682"},{"key":"ref7","first-page":"1","article-title":"Predictive uncertainty estimation via prior networks","volume-title":"Proc. Adv. Neural Inf. Process. Syst.","volume":"31","author":"Malinin"},{"key":"ref8","first-page":"14927","article-title":"Deep evidential regression","volume-title":"Proc. Adv. Neural Inf. Process. Syst.","volume":"33","author":"Amini"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3111977"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1609\/aaai.v34i04.6015"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TMECH.2021.3120755"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1038\/nature14541"},{"key":"ref13","first-page":"4907","article-title":"Bayesian uncertainty estimation for batch normalized deep networks","volume-title":"Proc. Int. Conf. Mach. Learn.","author":"Teye"},{"key":"ref14","first-page":"1","article-title":"Evidential deep learning to quantify classification uncertainty","volume-title":"Proc. Adv. Neural Inf. Process. Syst.","volume":"31","author":"Sensoy"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2018.00355"},{"key":"ref16","article-title":"Very deep convolutional networks for large-scale image recognition","author":"Simonyan","year":"2014","journal-title":"arXiv:1409.1556"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TSMC.2019.2945808"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1016\/j.ast.2022.107473"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2020.2983233"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2018.2882682"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3186688"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TMECH.2019.2898509"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2017.06.022"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TMECH.2017.2728371"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1016\/j.isatra.2021.04.022"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2019.2912072"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2020.2989371"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2019.2927590"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1007\/s10845-020-01600-2"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1016\/j.energy.2019.03.057"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1016\/j.compind.2019.103132"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2844805"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1016\/j.asoc.2020.106515"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3188058"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2020.108202"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/10012124\/10056230.pdf?arnumber=10056230","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,3,2]],"date-time":"2024-03-02T23:27:13Z","timestamp":1709422033000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10056230\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023]]},"references-count":35,"URL":"https:\/\/doi.org\/10.1109\/tim.2023.3250308","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2023]]}}}