{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,17]],"date-time":"2026-02-17T12:18:44Z","timestamp":1771330724069,"version":"3.50.1"},"reference-count":46,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["51877174"],"award-info":[{"award-number":["51877174"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["U1866201"],"award-info":[{"award-number":["U1866201"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["52107167"],"award-info":[{"award-number":["52107167"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"name":"State Grid Corporation Headquarters Science and Technology Project Fund Support","award":["5226SX21001B"],"award-info":[{"award-number":["5226SX21001B"]}]},{"DOI":"10.13039\/501100002858","name":"China Postdoctoral Science Foundation","doi-asserted-by":"publisher","award":["2021M692877"],"award-info":[{"award-number":["2021M692877"]}],"id":[{"id":"10.13039\/501100002858","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2023]]},"DOI":"10.1109\/tim.2023.3251390","type":"journal-article","created":{"date-parts":[[2023,3,2]],"date-time":"2023-03-02T18:23:00Z","timestamp":1677781380000},"page":"1-13","source":"Crossref","is-referenced-by-count":2,"title":["Radiated Magnetic Field Research of Primary\u2013Secondary Fusion MV Switch Subjected to Ultraserious Transient Current"],"prefix":"10.1109","volume":"72","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-6956-8708","authenticated-orcid":false,"given":"Wenchao","family":"Lu","sequence":"first","affiliation":[{"name":"School of Electrical Engineering, Xi’an University of Technology, Xi’an, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-0478-0302","authenticated-orcid":false,"given":"Jiandong","family":"Duan","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering, Xi’an University of Technology, Xi’an, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5655-8965","authenticated-orcid":false,"given":"Linyun","family":"Guo","sequence":"additional","affiliation":[{"name":"Xi’an Xinghui Electric Power Technology Company Ltd., Xi’an, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8898-9129","authenticated-orcid":false,"given":"Lin","family":"Cheng","sequence":"additional","affiliation":[{"name":"Power Research Institute of State Grid Shaanxi Electric Power Company Ltd., Xi’an, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-1096-8483","authenticated-orcid":false,"given":"Jiaxin","family":"Tao","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering, Xi’an University of Technology, Xi’an, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-8852-2150","authenticated-orcid":false,"given":"Yuhang","family":"Zhao","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering, Xi’an University of Technology, Xi’an, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2013.2294471"},{"issue":"11","key":"ref2","first-page":"2829","article-title":"Electromagnetic compatibility performance analysis of electronic transformers","volume":"39","author":"Tong","year":"2013","journal-title":"High Voltage Eng."},{"issue":"2","key":"ref3","first-page":"85","article-title":"Simulated experimental study on transient electric field of 110 kV AIS disconnector during opening and closing operation","volume":"55","author":"Zhu","year":"2019","journal-title":"High Voltage App."},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1049\/iet-epa:20060124"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TEMC.2009.2028236"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2017.2695490"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2016.2600277"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1049\/hve2.12121"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ICEESA.2013.6578412"},{"key":"ref10","first-page":"1","article-title":"Electromagnetic compatibility\u2014A vital issue for medium-voltage switchgear","volume-title":"Proc. Petroleum Chem. Ind. Conf. Eur. Conf.","author":"M\u00fcller"},{"issue":"8","key":"ref11","first-page":"27","article-title":"Study on electromagnetic interference of secondary intelligent devices on pole-mounted switch breaking","volume":"30","author":"Li","year":"2015","journal-title":"Trans. China Electrotechn. Soc."},{"issue":"1","key":"ref12","first-page":"110","article-title":"Electromagnetic interference of 10 kV switching cabinet on secondary intelligent equipment","volume":"39","author":"Li","year":"2015","journal-title":"Power Syst. Technol."},{"issue":"2","key":"ref13","first-page":"214","article-title":"Influence of lightning impulse voltage on measurement accuracy of power distribution primary and secondary fusion equipment","volume":"40","author":"He","year":"2020","journal-title":"Power Automat. Equip."},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.3390\/s21237800"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/cieec50170.2021.9510961"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/15.809855"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/EMCEurope.2012.6396742"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1016\/j.net.2019.01.011"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2021.3126376"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2013.004017"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TPS.2015.2499320"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/pesw.2000.847681"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2020.3024507"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2004.835039"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1201\/9781315214603"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/INCEMIC.2018.8704565"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2019.2958182"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1016\/j.epsr.2015.11.024"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1029\/2008JD009873"},{"issue":"11","key":"ref30","first-page":"104","article-title":"Rocket-triggered lightning test on 10 kV distribution line and analysis of lightning current waveform characteristics","volume":"26","author":"Cai","year":"2022","journal-title":"Electr. Mach. Control."},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/61.248286"},{"key":"ref32","volume-title":"Standard on High-Voltage Switchgear and Controlgear","year":"2008"},{"issue":"8","key":"ref33","first-page":"11","article-title":"Test and simulation of electromagnetic radiation interference during capacitive closing process of pole-mounted switch in distribution network","volume":"56","author":"Niu","year":"2020","journal-title":"High Voltage App."},{"key":"ref34","volume-title":"Research on Simulation Testing Method of System Level Strong Electromagnetic Disturbance in Substations","author":"Cheng","year":"2020"},{"issue":"8","key":"ref35","first-page":"69","article-title":"Study on conduction electromagnetic interference test method for primary and secondary fusion switch in distribution network","volume":"57","author":"Zhang","year":"2021","journal-title":"High Voltage App."},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/TEMC.2016.2518302"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/TEMC.2017.2761024"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/78.492555"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1190\/1.1543223"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1109\/20.996200"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2008.2002873"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2022.3142746"},{"key":"ref43","volume-title":"Electromagnetic Compatibility (EMC)\u2014Part 4\u20139: Testing and Measurement Techniques\u2014Impulse Magnetic Field Immunity Test","year":"2016"},{"key":"ref44","volume-title":"Telecontrol Equipment and Systems\u2014Part 2: Working Conditions\u2014Part 1: Power Supply and Electromagnetic Compatibility","year":"1995"},{"key":"ref45","volume-title":"Electromagnetic Compatibility (EMC)\u2014Part 4\u201310: Testing and Measurement Techniques\u2014Damped Oscillatory Magnetic Field Immunity Test","year":"2016"},{"issue":"4","key":"ref46","first-page":"172","article-title":"Development and application of simulator for transient radiation field of GIS switching operation","volume":"56","author":"Zhang","year":"2020","journal-title":"High Voltage App."}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/10012124\/10057454.pdf?arnumber=10057454","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,3,14]],"date-time":"2024-03-14T03:24:28Z","timestamp":1710386668000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10057454\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023]]},"references-count":46,"URL":"https:\/\/doi.org\/10.1109\/tim.2023.3251390","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2023]]}}}