{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,20]],"date-time":"2026-03-20T18:08:16Z","timestamp":1774030096474,"version":"3.50.1"},"reference-count":25,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["52035015"],"award-info":[{"award-number":["52035015"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["51875530"],"award-info":[{"award-number":["51875530"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Science and Technology Plan Project of Zhejiang Administration for Market Regulation","award":["20210107"],"award-info":[{"award-number":["20210107"]}]},{"DOI":"10.13039\/501100018621","name":"Program for Changjiang Scholars and Innovative Research Team in University","doi-asserted-by":"publisher","award":["IRT_17R98"],"award-info":[{"award-number":["IRT_17R98"]}],"id":[{"id":"10.13039\/501100018621","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2023]]},"DOI":"10.1109\/tim.2023.3261936","type":"journal-article","created":{"date-parts":[[2023,3,27]],"date-time":"2023-03-27T18:45:04Z","timestamp":1679942704000},"page":"1-8","source":"Crossref","is-referenced-by-count":6,"title":["A Simultaneous Multi-Directional Defects Measurement Based on Polarization-Multiplexed Four-Directional Digital Shearography With Large Field of View"],"prefix":"10.1109","volume":"72","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-2168-9535","authenticated-orcid":false,"given":"Liping","family":"Yan","sequence":"first","affiliation":[{"name":"Precision Measurement Laboratory, Zhejiang Sci-Tech University, Hangzhou, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4691-9819","authenticated-orcid":false,"given":"Lan","family":"Tan","sequence":"additional","affiliation":[{"name":"Precision Measurement Laboratory, Zhejiang Sci-Tech University, Hangzhou, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-8383-7786","authenticated-orcid":false,"given":"Liu","family":"Huang","sequence":"additional","affiliation":[{"name":"Precision Measurement Laboratory, Zhejiang Sci-Tech University, Hangzhou, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-0375-740X","authenticated-orcid":false,"given":"Benyong","family":"Chen","sequence":"additional","affiliation":[{"name":"Precision Measurement Laboratory, Zhejiang Sci-Tech University, Hangzhou, China"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.3390\/app8122662"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1088\/0957-0233\/21\/10\/102001"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2022.3172435"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2021.3086876"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1364\/ao.427640"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/0143-8166(95)00141-7"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6501\/ab3bfd"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/jsen.2019.2912269"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2018.04.073"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.optlastec.2020.106701"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1364\/ao.404088"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1117\/1.oe.61.7.076106"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1117\/12.343778"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1088\/0957-0233\/11\/9\/320"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/j.optlaseng.2012.03.011"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/j.optlaseng.2015.12.009"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1063\/1.4961473"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1007\/s40799-019-00345-9"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1016\/j.optlaseng.2018.07.018"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1117\/1.oe.58.5.054105"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1080\/09500340.2020.1733115"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1364\/ao.417373"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1364\/ao.50.003789"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1016\/j.optlaseng.2012.07.014"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1016\/j.optlaseng.2018.08.024"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/10012124\/10081442.pdf?arnumber=10081442","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,2,13]],"date-time":"2024-02-13T18:37:10Z","timestamp":1707849430000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10081442\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023]]},"references-count":25,"URL":"https:\/\/doi.org\/10.1109\/tim.2023.3261936","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2023]]}}}