{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,1]],"date-time":"2026-06-01T12:36:11Z","timestamp":1780317371689,"version":"3.54.1"},"reference-count":40,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/100012542","name":"Sichuan Province Science and Technology Program","doi-asserted-by":"publisher","award":["100012542"],"award-info":[{"award-number":["100012542"]}],"id":[{"id":"10.13039\/100012542","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2023]]},"DOI":"10.1109\/tim.2023.3262254","type":"journal-article","created":{"date-parts":[[2023,3,27]],"date-time":"2023-03-27T18:45:04Z","timestamp":1679942704000},"page":"1-10","source":"Crossref","is-referenced-by-count":7,"title":["Acceleration Measurement-Based Disturbance Observer Control for a Belt-Drive Servo Instrumentation"],"prefix":"10.1109","volume":"72","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-8762-8842","authenticated-orcid":false,"given":"Zhiyong","family":"Yu","sequence":"first","affiliation":[{"name":"Key Laboratory of Optical Engineering, and the Institute of Optics and Electronics, Chinese Academy of Sciences, Chengdu, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5402-8610","authenticated-orcid":false,"given":"Tao","family":"Tang","sequence":"additional","affiliation":[{"name":"Key Laboratory of Optical Engineering, and the Institute of Optics and Electronics, Chinese Academy of Sciences, Chengdu, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5418-0727","authenticated-orcid":false,"given":"Bo","family":"Qi","sequence":"additional","affiliation":[{"name":"Key Laboratory of Optical Engineering, and the Institute of Optics and Electronics, Chinese Academy of Sciences, Chengdu, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3547-6941","authenticated-orcid":false,"given":"Ge","family":"Ren","sequence":"additional","affiliation":[{"name":"Key Laboratory of Optical Engineering, and the Institute of Optics and Electronics, Chinese Academy of Sciences, Chengdu, China"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/tie.2021.3123642"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/icm46511.2021.9385633"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/tmech.2018.2854844"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/tmech.2020.3032115"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.23919\/ipec.2018.8507980"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/isie.2016.7744966"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/cdc.2016.7798901"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/aim.2014.6878071"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/isict.2012.6291627"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2012.2214934"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/epepemc.2006.4778427"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/tie.2014.2308142"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/tie.2020.3034844"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/isie.2010.5637758"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/tie.2015.2512228"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/19.799655"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/ACC.1999.782459"},{"key":"ref18","doi-asserted-by":"crossref","first-page":"418","DOI":"10.1016\/j.isatra.2015.09.001","article-title":"The design and implementation of an accelerometer-assisted velocity observer","volume":"59","author":"Lu","year":"2015","journal-title":"ISA Trans."},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2020.2991290"},{"key":"ref20","first-page":"1","article-title":"Experimental verification of nonlinear compensation to PID control using digital acceleration control","volume-title":"Proc. World Automat. Congr.","author":"Emaru"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/icmlc.2006.258526"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1364\/ol.460716"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/ccsse.2014.7224534"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2019.2942508"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/tie.2018.2881944"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/tie.2007.907664"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/tie.2015.2512224"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/sii.2015.7404990"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/iecon.2019.8926716"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1080\/00207721.2021.1895358"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/iecon.2016.7793442"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1049\/iet-cta.2008.0358"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/tie.2016.2597132"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/tie.2019.2912780"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2016.2588618"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/tie.2016.2578840"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/tie.2012.2194976"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1002\/rnc.3235"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.3390\/s18030754"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1109\/tmech.2005.852448"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/10012124\/10082901.pdf?arnumber=10082901","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,2,13]],"date-time":"2024-02-13T18:54:18Z","timestamp":1707850458000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10082901\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023]]},"references-count":40,"URL":"https:\/\/doi.org\/10.1109\/tim.2023.3262254","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2023]]}}}