{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,10]],"date-time":"2026-06-10T05:43:46Z","timestamp":1781070226789,"version":"3.54.1"},"reference-count":30,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2023]]},"DOI":"10.1109\/tim.2023.3264030","type":"journal-article","created":{"date-parts":[[2023,4,3]],"date-time":"2023-04-03T17:29:57Z","timestamp":1680542997000},"page":"1-9","source":"Crossref","is-referenced-by-count":5,"title":["Designing Fractional Oscillator for Sensing Different Types of Lossy Capacitors"],"prefix":"10.1109","volume":"72","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-2951-4307","authenticated-orcid":false,"given":"Arpit Sourav","family":"Mohapatra","sequence":"first","affiliation":[{"name":"Department of Electrical Engineering, Indian Institute of Technology (IIT) Kharagpur, Kharagpur, India"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-1725-6657","authenticated-orcid":false,"given":"Stefan","family":"Zimmermann","sequence":"additional","affiliation":[{"name":"Institute of Electrical Engineering and Measurement Technology, Leibniz University Hannover, Hannover, Germany"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9934-0157","authenticated-orcid":false,"given":"Karabi","family":"Biswas","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, Indian Institute of Technology (IIT) Kharagpur, Kharagpur, India"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","volume-title":"Foundations of Oscillator Circuit Design","author":"Gonzalez","year":"2006"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.chaos.2003.12.095"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2006.879102"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1063\/1.5040345"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1063\/1.4981204"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2008.918196"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.mejo.2016.06.003"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1080\/00207217.2018.1545260"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1007\/s00034-022-02045-z"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ICUMT.2018.8631226"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1007\/s00034-019-01057-6"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2022.3149857"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1007\/s10470-022-02069-0"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2020.2990587"},{"key":"ref15","volume-title":"Measuring the impedance of a lossy capacitor","author":"Byars","year":"1994"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS48785.2022.9937515"},{"key":"ref17","volume-title":"Microelectronic Circuits","author":"Sedra","year":"2010"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2014.2386233"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2015.2459473"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2018.2858038"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2018.2794764"},{"key":"ref22","article-title":"Design and development of fractional order element based milk adulteration detection system","author":"Das","year":"2012"},{"key":"ref23","volume-title":"Design With Operational Amplifiers and Analog Integrated Circuits","author":"Franco","year":"2002"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2016.2568262"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2696508"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2017.2751502"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2018.2853219"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2020.2975824"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/LSENS.2019.2919894"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3101325"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/10012124\/10091448.pdf?arnumber=10091448","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,2,29]],"date-time":"2024-02-29T21:03:02Z","timestamp":1709240582000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10091448\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023]]},"references-count":30,"URL":"https:\/\/doi.org\/10.1109\/tim.2023.3264030","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2023]]}}}