{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,9,11]],"date-time":"2025-09-11T10:49:19Z","timestamp":1757587759421,"version":"3.37.3"},"reference-count":22,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2023]]},"DOI":"10.1109\/tim.2023.3269110","type":"journal-article","created":{"date-parts":[[2023,4,28]],"date-time":"2023-04-28T17:59:45Z","timestamp":1682704785000},"page":"1-12","source":"Crossref","is-referenced-by-count":4,"title":["Error of Measuring Surface Temperature of Turbine Blades With the Influence of Reflection by Monochromatic Method"],"prefix":"10.1109","volume":"72","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-8016-968X","authenticated-orcid":false,"given":"Jie","family":"Ji","sequence":"first","affiliation":[{"name":"School of Instrumentation and Optoelectronic Engineering, Beihang University, Beijing, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4105-9936","authenticated-orcid":false,"given":"Botao","family":"Wang","sequence":"additional","affiliation":[{"name":"School of Instrumentation and Optoelectronic Engineering, Beihang University, Beijing, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-2353-7786","authenticated-orcid":false,"given":"Yu","family":"Yang","sequence":"additional","affiliation":[{"name":"School of Instrumentation and Optoelectronic Engineering, Beihang University, Beijing, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1870-7613","authenticated-orcid":false,"given":"Tao","family":"Liang","sequence":"additional","affiliation":[{"name":"School of Instrumentation and Optoelectronic Engineering, Beihang University, Beijing, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8509-1049","authenticated-orcid":false,"given":"Ming","family":"Ding","sequence":"additional","affiliation":[{"name":"School of Instrumentation and Optoelectronic Engineering, Beihang University, Beijing, China"}]}],"member":"263","reference":[{"doi-asserted-by":"publisher","key":"ref1","DOI":"10.1179\/isr.1996.21.2.117"},{"doi-asserted-by":"publisher","key":"ref2","DOI":"10.1007\/s40997-018-0235-0"},{"doi-asserted-by":"publisher","key":"ref3","DOI":"10.1016\/j.ijheatmasstransfer.2009.12.053"},{"doi-asserted-by":"publisher","key":"ref4","DOI":"10.1016\/j.anucene.2017.10.010"},{"doi-asserted-by":"publisher","key":"ref5","DOI":"10.1088\/1361-6501\/aab394"},{"doi-asserted-by":"publisher","key":"ref6","DOI":"10.1109\/TIM.2022.3177716"},{"doi-asserted-by":"publisher","key":"ref7","DOI":"10.3390\/app11093913"},{"doi-asserted-by":"publisher","key":"ref8","DOI":"10.1016\/j.measurement.2015.02.043"},{"doi-asserted-by":"publisher","key":"ref9","DOI":"10.1016\/j.jqsrt.2019.02.022"},{"doi-asserted-by":"publisher","key":"ref10","DOI":"10.1016\/j.infrared.2022.104204"},{"doi-asserted-by":"publisher","key":"ref11","DOI":"10.1115\/1.4000541"},{"doi-asserted-by":"publisher","key":"ref12","DOI":"10.1115\/GT2014-25595"},{"doi-asserted-by":"publisher","key":"ref13","DOI":"10.1016\/j.infrared.2016.11.014"},{"doi-asserted-by":"publisher","key":"ref14","DOI":"10.1117\/1.OE.54.6.065102"},{"doi-asserted-by":"publisher","key":"ref15","DOI":"10.1016\/j.infrared.2016.10.011"},{"doi-asserted-by":"publisher","key":"ref16","DOI":"10.1016\/j.infrared.2016.01.013"},{"volume-title":"Thermal Radiation Heat Transfer","year":"2002","author":"Siegel","key":"ref17"},{"doi-asserted-by":"publisher","key":"ref18","DOI":"10.1016\/j.infrared.2014.07.018"},{"doi-asserted-by":"publisher","key":"ref19","DOI":"10.1063\/1.1384448"},{"volume-title":"COMSOL Documentation","year":"2022","key":"ref20"},{"doi-asserted-by":"publisher","key":"ref21","DOI":"10.1117\/1.601868"},{"doi-asserted-by":"publisher","key":"ref22","DOI":"10.1016\/j.jallcom.2011.09.097"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/10012124\/10112607.pdf?arnumber=10112607","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,3,1]],"date-time":"2024-03-01T03:59:21Z","timestamp":1709265561000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10112607\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023]]},"references-count":22,"URL":"https:\/\/doi.org\/10.1109\/tim.2023.3269110","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"type":"print","value":"0018-9456"},{"type":"electronic","value":"1557-9662"}],"subject":[],"published":{"date-parts":[[2023]]}}}