{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,7]],"date-time":"2026-05-07T16:26:04Z","timestamp":1778171164740,"version":"3.51.4"},"reference-count":26,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100005153","name":"China National Funds for Distinguished Young Scientists","doi-asserted-by":"publisher","award":["61925103"],"award-info":[{"award-number":["61925103"]}],"id":[{"id":"10.13039\/501100005153","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100012226","name":"Project for Jiangsu Specially-Appointed Professor, the Fundamental Research Funds for the Central Universities","doi-asserted-by":"publisher","award":["2242022k30008"],"award-info":[{"award-number":["2242022k30008"]}],"id":[{"id":"10.13039\/501100012226","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2023]]},"DOI":"10.1109\/tim.2023.3276025","type":"journal-article","created":{"date-parts":[[2023,5,15]],"date-time":"2023-05-15T18:23:47Z","timestamp":1684175027000},"page":"1-12","source":"Crossref","is-referenced-by-count":7,"title":["An Enhanced-Sensitivity Tangential Electric Field Probe With Tunable Resonant Frequency"],"prefix":"10.1109","volume":"72","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-9406-2736","authenticated-orcid":false,"given":"Zhi-Peng","family":"Chen","sequence":"first","affiliation":[{"name":"Center for Flexible RF Technology, State Key Laboratory of Millimeter Waves, School of Information Science and Engineering, Southeast University, Nanjing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9948-6773","authenticated-orcid":false,"given":"Zhen-Guo","family":"Liu","sequence":"additional","affiliation":[{"name":"Center for Flexible RF Technology, State Key Laboratory of Millimeter Waves, School of Information Science and Engineering, Southeast University, Nanjing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2731-5729","authenticated-orcid":false,"given":"Shang","family":"Zhang","sequence":"additional","affiliation":[{"name":"Center for Flexible RF Technology, State Key Laboratory of Millimeter Waves, School of Information Science and Engineering, Southeast University, Nanjing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9765-278X","authenticated-orcid":false,"given":"Meng-Zi","family":"Li","sequence":"additional","affiliation":[{"name":"Center for Flexible RF Technology, State Key Laboratory of Millimeter Waves, School of Information Science and Engineering, Southeast University, Nanjing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-6337-1739","authenticated-orcid":false,"given":"Wei-Bing","family":"Lu","sequence":"additional","affiliation":[{"name":"Center for Flexible RF Technology, State Key Laboratory of Millimeter Waves, School of Information Science and Engineering, Southeast University, Nanjing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TAP.2019.2897476"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1007\/s12243-007-0004-3"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1002\/mmce.20274"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.3390\/s19091970"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TAP.2019.2927814"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2018.2869181"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TEMC.2011.2141998"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TAP.1986.1143727"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/LMWC.2014.2361433"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2019.2920700"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/ISEMC.2017.8077921"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/LAWP.2019.2942956"},{"key":"ref24","first-page":"39","article-title":"Broadband 180° bit phase shifter using a new switched network","volume":"1","author":"eom","year":"2003","journal-title":"IEEE MTT-S Int Microw Symp Dig"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TEMC.2017.2782673"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2012.2218678"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/LMWC.2005.850486"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2018.2857898"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TEMC.2013.2265333"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TEMC.2014.2354018"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2018.2831398"},{"key":"ref7","doi-asserted-by":"crossref","first-page":"120","DOI":"10.1109\/PROC.1986.13418","article-title":"standards for electromagnetic field measurements","volume":"74","author":"kanda","year":"1986","journal-title":"Proceedings of the IEEE"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/LAWP.2019.2915258"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2020.3006564"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3078000"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TAP.2020.3048497"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TAP.2017.2758420"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/10012124\/10124450.pdf?arnumber=10124450","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,6,12]],"date-time":"2023-06-12T18:03:14Z","timestamp":1686592994000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10124450\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023]]},"references-count":26,"URL":"https:\/\/doi.org\/10.1109\/tim.2023.3276025","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2023]]}}}