{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,31]],"date-time":"2026-01-31T00:36:10Z","timestamp":1769819770399,"version":"3.49.0"},"reference-count":25,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100003593","name":"Conselho Nacional de Desenvolvimento Cient\u00edfico e Tecnologico (CNPq), Ministry of Science, Technol\u00f3gy, and Innovation, Brazil, under Grant CNPq\/Prosul Processo","doi-asserted-by":"publisher","award":["490271\/2011-1"],"award-info":[{"award-number":["490271\/2011-1"]}],"id":[{"id":"10.13039\/501100003593","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2023]]},"DOI":"10.1109\/tim.2023.3279874","type":"journal-article","created":{"date-parts":[[2023,5,26]],"date-time":"2023-05-26T17:41:32Z","timestamp":1685122892000},"page":"1-7","source":"Crossref","is-referenced-by-count":2,"title":["Modeling the Transimpedance Amplitude and Phase of Wideband Cage-Type Current Shunts"],"prefix":"10.1109","volume":"72","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-7552-3602","authenticated-orcid":false,"given":"Gregory A.","family":"Kyriazis","sequence":"first","affiliation":[{"name":"Instituto Nacional de Metrologia, Qualidade e Tecnologia (Inmetro), Duque de Caxias, Brazil"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1866-7324","authenticated-orcid":false,"given":"Rodrigo S.","family":"Ribeiro","sequence":"additional","affiliation":[{"name":"Instituto Nacional de Metrologia, Qualidade e Tecnologia (Inmetro), Duque de Caxias, Brazil"}]}],"member":"263","reference":[{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2002.806008"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/19.278637"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2011.2108553"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2007.891117"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.1990.1032958"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2019.2944012"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/CPEM.2004.305310"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2007.908602"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2018.2882927"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/CPEM.2012.6250913"},{"key":"ref19","author":"ouameur","year":"2019","journal-title":"Concepcion modélisacion et étalonnage d’un shunt pour la mesure de courant à 10 A et 1 MHz"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2018.2855499"},{"key":"ref24","year":"2019","journal-title":"Guide for sampling power and power quality measurements"},{"key":"ref23","author":"abramowitz","year":"1972","journal-title":"Handbook of Mathematical Functions"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2005.843559"},{"key":"ref20","author":"rydler","year":"2021","journal-title":"private communication"},{"key":"ref22","author":"paul","year":"2010","journal-title":"Inductance Loop and Partial"},{"key":"ref21","author":"paul","year":"1992","journal-title":"Introduction to Electromagnetic Compatibility"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2013.2292275"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/CPEM.2004.305451"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/CPEM.2010.5543247"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2008.2007074"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2006.876535"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.21014\/acta_imeko.v4i3.250"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2008.2008469"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/10012124\/10136700.pdf?arnumber=10136700","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,7,10]],"date-time":"2023-07-10T19:06:14Z","timestamp":1689015974000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10136700\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023]]},"references-count":25,"URL":"https:\/\/doi.org\/10.1109\/tim.2023.3279874","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2023]]}}}