{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,5]],"date-time":"2026-05-05T10:26:13Z","timestamp":1777976773262,"version":"3.51.4"},"reference-count":47,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61975161"],"award-info":[{"award-number":["61975161"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["52175516"],"award-info":[{"award-number":["52175516"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100002367","name":"Youth Innovation Promotion Association, Chinese Academy of Sciences","doi-asserted-by":"publisher","award":["2022410"],"award-info":[{"award-number":["2022410"]}],"id":[{"id":"10.13039\/501100002367","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2023]]},"DOI":"10.1109\/tim.2023.3280499","type":"journal-article","created":{"date-parts":[[2023,5,29]],"date-time":"2023-05-29T17:32:18Z","timestamp":1685381538000},"page":"1-11","source":"Crossref","is-referenced-by-count":12,"title":["High-Accurate Quantitative Phase Imaging Based on the Transport of Intensity Equation and Wavelet Transform"],"prefix":"10.1109","volume":"72","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-2352-0856","authenticated-orcid":false,"given":"Chen","family":"Fan","sequence":"first","affiliation":[{"name":"State Key Laboratory for Manufacturing Systems Engineering, School of Mechanical Engineering, Xi'an Jiaotong University, Xi'an, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0927-8634","authenticated-orcid":false,"given":"Hong","family":"Zhao","sequence":"additional","affiliation":[{"name":"State Key Laboratory for Manufacturing Systems Engineering, School of Mechanical Engineering, Xi'an Jiaotong University, Xi'an, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-8077-6359","authenticated-orcid":false,"given":"Zixin","family":"Zhao","sequence":"additional","affiliation":[{"name":"State Key Laboratory for Manufacturing Systems Engineering, School of Mechanical Engineering, Xi'an Jiaotong University, Xi'an, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4097-9781","authenticated-orcid":false,"given":"Junxiang","family":"Li","sequence":"additional","affiliation":[{"name":"State Key Laboratory for Manufacturing Systems Engineering, School of Mechanical Engineering, Xi'an Jiaotong University, Xi'an, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-3434-1407","authenticated-orcid":false,"given":"Yijun","family":"Du","sequence":"additional","affiliation":[{"name":"State Key Laboratory for Manufacturing Systems Engineering, School of Mechanical Engineering, Xi'an Jiaotong University, Xi'an, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2219-1317","authenticated-orcid":false,"given":"Gaopeng","family":"Zhang","sequence":"additional","affiliation":[{"name":"Chinese Academy of Sciences, Xi'an Institute of Optics and Precision Mechanics, Xi'an, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1364\/JOSA.73.001434"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1117\/12.2525786"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1021\/acs.nanolett.1c00190"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1111\/j.0022-2720.2004.01295.x"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1038\/s41598-017-06837-1"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2013.2244222"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1364\/OE.25.009122"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1016\/j.patcog.2004.03.010"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1364\/OE.23.028031"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1364\/AO.53.000D29"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1364\/OE.15.007165"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevLett.80.2586"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1038\/s41377-022-00815-7"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1364\/OE.26.011819"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1364\/OL.26.001873"},{"key":"ref1","doi-asserted-by":"crossref","first-page":"349","DOI":"10.1016\/S0079-6638(08)70178-1","article-title":"V phase-measurement interferometry techniques","author":"creath","year":"1988","journal-title":"Progress in Optics"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1364\/OE.26.027599"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2018.2838778"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1364\/BOE.8.004687"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2020.2975405"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1364\/OE.412510"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1016\/j.optlaseng.2021.106624"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1364\/OE.19.020244"},{"key":"ref46","doi-asserted-by":"crossref","first-page":"65","DOI":"10.1016\/S0030-4018(01)01556-5","article-title":"Phase retrieval from series of images obtained by defocus variation","volume":"199","author":"allen","year":"2001","journal-title":"Opt Commun"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1364\/OE.18.012552"},{"key":"ref45","doi-asserted-by":"publisher","DOI":"10.1364\/OL.391823"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1364\/OE.21.005346"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1364\/OE.20.008186"},{"key":"ref47","doi-asserted-by":"publisher","DOI":"10.1364\/OL.40.001976"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1364\/PRJ.7.000890"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevA.84.023808"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1364\/OE.26.011458"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1364\/AO.46.007978"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1016\/j.optcom.2013.12.060"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1016\/j.optlaseng.2015.03.006"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1364\/OE.22.017172"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/JPHOT.2019.2919543"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1364\/OE.22.010661"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1364\/OE.23.023092"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TCI.2016.2571669"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2015.2509249"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1364\/OL.468807"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1038\/nphoton.2013.187"},{"key":"ref3","first-page":"237","article-title":"A practical algorithm for the determination of phase from image and diffraction plane pictures","volume":"35","author":"gerchberg","year":"1971","journal-title":"Optik"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1364\/OL.38.003538"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.optlaseng.2020.106187"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1364\/OE.22.005474"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/10012124\/10138235.pdf?arnumber=10138235","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,6,26]],"date-time":"2023-06-26T18:32:33Z","timestamp":1687804353000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10138235\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023]]},"references-count":47,"URL":"https:\/\/doi.org\/10.1109\/tim.2023.3280499","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2023]]}}}