{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,9]],"date-time":"2026-04-09T14:38:07Z","timestamp":1775745487313,"version":"3.50.1"},"reference-count":42,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100012166","name":"National Key Research and Development Program of China","doi-asserted-by":"publisher","award":["2020AAA0108302"],"award-info":[{"award-number":["2020AAA0108302"]}],"id":[{"id":"10.13039\/501100012166","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100012226","name":"Fundamental Research Funds for the Central Universities","doi-asserted-by":"publisher","award":["xtr072022001"],"award-info":[{"award-number":["xtr072022001"]}],"id":[{"id":"10.13039\/501100012226","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2023]]},"DOI":"10.1109\/tim.2023.3280532","type":"journal-article","created":{"date-parts":[[2023,5,29]],"date-time":"2023-05-29T17:32:18Z","timestamp":1685381538000},"page":"1-16","source":"Crossref","is-referenced-by-count":11,"title":["Few-Shot Classification of Screen Defects With Class-Agnostic Mask and Context-Based Classifier"],"prefix":"10.1109","volume":"72","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-0807-6539","authenticated-orcid":false,"given":"Chaofan","family":"Zhou","sequence":"first","affiliation":[{"name":"National Key Laboratory of Industrial Control Technology and the College of Electrical Engineering, Zhejiang University, Hangzhou, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0693-6574","authenticated-orcid":false,"given":"Meiqin","family":"Liu","sequence":"additional","affiliation":[{"name":"Institute of Artificial Intelligence and Robotics, Xi’an Jiaotong University, Xi’an, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-5117-3110","authenticated-orcid":false,"given":"Senlin","family":"Zhang","sequence":"additional","affiliation":[{"name":"National Key Laboratory of Industrial Control Technology and the College of Electrical Engineering, Zhejiang University, Hangzhou, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8535-9527","authenticated-orcid":false,"given":"Ping","family":"Wei","sequence":"additional","affiliation":[{"name":"Institute of Artificial Intelligence and Robotics, Xi’an Jiaotong University, Xi’an, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1710-3818","authenticated-orcid":false,"given":"Badong","family":"Chen","sequence":"additional","affiliation":[{"name":"Institute of Artificial Intelligence and Robotics, Xi’an Jiaotong University, Xi’an, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ICPR48806.2021.9412119"},{"key":"ref35","first-page":"1","article-title":"Automatic differentiation in PyTorch","author":"paszke","year":"2017","journal-title":"Proc NIPS Workshop Autodiff"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.patcog.2020.107571"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1007\/s10845-022-02022-y"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1007\/s12541-018-0096-x"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-7908-2604-3_16"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/j.patrec.2021.11.029"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2016.90"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR42600.2020.01222"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1016\/j.ins.2020.05.050"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1007\/978-981-15-3250-4_2"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR42600.2020.01386"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.autcon.2021.103823"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV.2019.00851"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.patcog.2016.11.021"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.patcog.2015.09.022"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.5220\/0010243202360242"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV.2017.74"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.3390\/app10103621"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1016\/j.apsusc.2013.09.002"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2019.01199"},{"key":"ref18","first-page":"1126","article-title":"Model-agnostic meta-learning for fast adaptation of deep networks","volume":"70","author":"finn","year":"2017","journal-title":"Proc 34th Int Conf Mach Learn"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1016\/j.optlaseng.2019.105936"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR52688.2022.00884"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2021.3090036"},{"key":"ref25","article-title":"Few-shot classification of façade defects based on extensible classifier and contrastive learning","volume":"141","author":"cui","year":"2022","journal-title":"Autom Construction"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2018.00131"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3128208"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1007\/s00371-018-1588-5"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2018.00459"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2018.00755"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2017.106"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3193204"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3151930"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR46437.2021.01227"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR42600.2020.01220"},{"key":"ref9","article-title":"Key technology research and application in intelligent object positioning and element defects detection based on machine vision","author":"jiabin","year":"2020"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.cie.2020.106530"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.neucom.2018.03.013"},{"key":"ref6","article-title":"Prototypical networks for few-shot learning","volume":"30","author":"snell","year":"2017","journal-title":"Advances in neural information processing systems"},{"key":"ref5","article-title":"Matching networks for one shot learning","volume":"29","author":"vinyals","year":"2016","journal-title":"Advances in neural information processing systems"},{"key":"ref40","first-page":"2579","article-title":"Visualizing data using t-SNE","volume":"9","author":"van der maaten","year":"2008","journal-title":"J Mach Learn Res"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/10012124\/10138509.pdf?arnumber=10138509","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,7,10]],"date-time":"2023-07-10T19:03:41Z","timestamp":1689015821000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10138509\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023]]},"references-count":42,"URL":"https:\/\/doi.org\/10.1109\/tim.2023.3280532","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2023]]}}}