{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,12,18]],"date-time":"2025-12-18T14:22:43Z","timestamp":1766067763006,"version":"3.37.3"},"reference-count":29,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["52175115","51805414"],"award-info":[{"award-number":["52175115","51805414"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100010877","name":"Science and Technology Innovation Committee of Shenzhen Municipality","doi-asserted-by":"publisher","award":["JCYJ20180306170652664"],"award-info":[{"award-number":["JCYJ20180306170652664"]}],"id":[{"id":"10.13039\/501100010877","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100004731","name":"Zhejiang Provincial Natural Science Foundation of China","doi-asserted-by":"publisher","award":["LZ19A020002"],"award-info":[{"award-number":["LZ19A020002"]}],"id":[{"id":"10.13039\/501100004731","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2023]]},"DOI":"10.1109\/tim.2023.3284950","type":"journal-article","created":{"date-parts":[[2023,6,16]],"date-time":"2023-06-16T17:21:57Z","timestamp":1686936117000},"page":"1-8","source":"Crossref","is-referenced-by-count":4,"title":["Nonlinear Ultrasonic Detection Enhanced by 3-D Printed Phononic Crystals"],"prefix":"10.1109","volume":"72","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-6466-6184","authenticated-orcid":false,"given":"Wenkang","family":"Li","sequence":"first","affiliation":[{"name":"State Key Laboratory for Manufacturing Systems Engineering, Xi’an Jiaotong University, Xi’an, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8647-2601","authenticated-orcid":false,"given":"Hailin","family":"Cao","sequence":"additional","affiliation":[{"name":"Xi’an Jiaotong University Shenzhen Academy, Science and Technology Park, Nanshan District, Shenzhen, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-7170-5452","authenticated-orcid":false,"given":"Liuyang","family":"Zhang","sequence":"additional","affiliation":[{"name":"State Key Laboratory for Manufacturing Systems Engineering, Xi’an Jiaotong University, Xi’an, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-0130-3172","authenticated-orcid":false,"given":"Xuefeng","family":"Chen","sequence":"additional","affiliation":[{"name":"Xi’an Jiaotong University Shenzhen Academy, Science and Technology Park, Nanshan District, Shenzhen, China"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2022.3201945"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2021.3127625"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2020.2993342"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2022.3231268"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.rinp.2018.07.012"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijfatigue.2021.106582"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.apacoust.2021.108528"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.ultras.2017.09.001"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/j.compstruct.2020.111869"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.ultras.2021.106472"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1121\/1.4707522"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.jsv.2018.12.034"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1002\/stc.2516"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2021.108713"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/j.jsv.2016.07.022"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/j.jmps.2017.04.009"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/j.ultras.2014.05.007"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1016\/j.compstruct.2018.08.088"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1063\/1.4934493"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1103\/physrevlett.118.214301"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1038\/378241a0"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1126\/science.289.5485.1734"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1088\/1361-665x\/ab2566"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1038\/s41598-017-14594-4"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1016\/j.ndteint.2021.102456"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/ICSMD57530.2022.10058317"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1016\/j.physleta.2017.08.058"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1103\/physrevb.86.144307"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1063\/1.4901462"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/10012124\/10154610.pdf?arnumber=10154610","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,3,13]],"date-time":"2024-03-13T22:19:24Z","timestamp":1710368364000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10154610\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023]]},"references-count":29,"URL":"https:\/\/doi.org\/10.1109\/tim.2023.3284950","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"type":"print","value":"0018-9456"},{"type":"electronic","value":"1557-9662"}],"subject":[],"published":{"date-parts":[[2023]]}}}