{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,14]],"date-time":"2026-06-14T22:26:15Z","timestamp":1781475975364,"version":"3.54.1"},"reference-count":40,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61901022"],"award-info":[{"award-number":["61901022"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["62271022"],"award-info":[{"award-number":["62271022"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100012226","name":"Fundamental Research Funds for the Central Universities","doi-asserted-by":"publisher","award":["KG12-1124-01"],"award-info":[{"award-number":["KG12-1124-01"]}],"id":[{"id":"10.13039\/501100012226","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100012240","name":"Academic Excellence Foundation of BUAA for Ph.D. Students","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100012240","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2023]]},"DOI":"10.1109\/tim.2023.3285918","type":"journal-article","created":{"date-parts":[[2023,6,14]],"date-time":"2023-06-14T17:21:08Z","timestamp":1686763268000},"page":"1-10","source":"Crossref","is-referenced-by-count":19,"title":["Measurement of Lift-Off Distance and Thickness of Nonmagnetic Metallic Plate Using Pulsed Eddy Current Testing"],"prefix":"10.1109","volume":"72","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-7057-5462","authenticated-orcid":false,"given":"Pu","family":"Huang","sequence":"first","affiliation":[{"name":"School of Instrumentation and Opto-Electronic Engineering, Beihang University, Beijing, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3022-4956","authenticated-orcid":false,"given":"Zhiying","family":"Li","sequence":"additional","affiliation":[{"name":"School of Instrumentation and Opto-Electronic Engineering, Beihang University, Beijing, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0008-4552-1076","authenticated-orcid":false,"given":"Jun","family":"Long","sequence":"additional","affiliation":[{"name":"China Aerospace Science and Technology Corporation, Beijing, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0488-9604","authenticated-orcid":false,"given":"Lijun","family":"Xu","sequence":"additional","affiliation":[{"name":"School of Instrumentation and Opto-Electronic Engineering, Beihang University, Beijing, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9535-0764","authenticated-orcid":false,"given":"Yuedong","family":"Xie","sequence":"additional","affiliation":[{"name":"School of Instrumentation and Opto-Electronic Engineering, Beihang University, Beijing, China"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2020.108589"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3199272"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.ndteint.2018.03.003"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1016\/j.ndteint.2018.01.007"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2020.3005114"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1016\/j.ndteint.2021.102570"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2022.111910"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1016\/j.sna.2019.111739"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2020.3038203"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2012.2225634"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2013.2239892"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1063\/1.1656680"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3111002"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1016\/j.ndteint.2021.102541"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2020.2965201"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2017.2682758"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/j.ndteint.2017.02.009"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2022.3183019"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3175264"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2020.2987413"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1016\/j.sna.2020.111991"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1016\/j.sna.2015.12.026"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1080\/09349840108968182"},{"key":"ref23","doi-asserted-by":"crossref","first-page":"516","DOI":"10.1016\/j.measurement.2018.06.065","article-title":"A new approach to increase the subsurface flaw detection capability of pulsed eddy current technique","volume":"128","author":"rao","year":"2018","journal-title":"Measurement"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2019.2904331"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1016\/j.ndteint.2020.102333"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/j.ndteint.2019.102154"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2021.110249"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1016\/j.ndteint.2019.102211"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1016\/j.ndteint.2004.09.007"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2019.2949340"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2019.04.091"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.ndteint.2020.102227"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.compositesa.2021.106274"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2019.2954011"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2008.926054"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2018.2872386"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.ndteint.2006.10.006"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2020.2966359"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2018.2885406"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/10012124\/10153074.pdf?arnumber=10153074","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,7,17]],"date-time":"2023-07-17T17:40:39Z","timestamp":1689615639000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10153074\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023]]},"references-count":40,"URL":"https:\/\/doi.org\/10.1109\/tim.2023.3285918","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2023]]}}}