{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,9]],"date-time":"2026-04-09T14:44:57Z","timestamp":1775745897502,"version":"3.50.1"},"reference-count":37,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["51627901"],"award-info":[{"award-number":["51627901"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["12204457"],"award-info":[{"award-number":["12204457"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100002367","name":"Research and Development Program of Scientific Research Instruments and Equipment of the Chinese Academy of Sciences","doi-asserted-by":"publisher","award":["ZDZBGCH2021001"],"award-info":[{"award-number":["ZDZBGCH2021001"]}],"id":[{"id":"10.13039\/501100002367","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2023]]},"DOI":"10.1109\/tim.2023.3287245","type":"journal-article","created":{"date-parts":[[2023,6,19]],"date-time":"2023-06-19T17:56:15Z","timestamp":1687197375000},"page":"1-9","source":"Crossref","is-referenced-by-count":3,"title":["All-Time Phase-Resolved 110 GHz Ultramicroscopy via Quadrature-Assisted Demodulation"],"prefix":"10.1109","volume":"72","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-3921-9398","authenticated-orcid":false,"given":"Guangbin","family":"Dai","sequence":"first","affiliation":[{"name":"Hefei National Research Center for Physical Sciences at Microscale, University of Science and Technology of China, Hefei, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-2617-9814","authenticated-orcid":false,"given":"Zheng","family":"Liu","sequence":"additional","affiliation":[{"name":"Department of Materials Science and Engineering, University of Science and Technology of China, Hefei, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Qiuping","family":"Huang","sequence":"additional","affiliation":[{"name":"Hefei National Research Center for Physical Sciences at Microscale, University of Science and Technology of China, Hefei, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5905-4981","authenticated-orcid":false,"given":"Jianlin","family":"Wang","sequence":"additional","affiliation":[{"name":"Hefei National Research Center for Physical Sciences at Microscale, University of Science and Technology of China, Hefei, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8614-5096","authenticated-orcid":false,"given":"Ming","family":"Yin","sequence":"additional","affiliation":[{"name":"Hefei National Research Center for Physical Sciences at Microscale, University of Science and Technology of China, Hefei, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1934-8165","authenticated-orcid":false,"given":"Qingyou","family":"Lu","sequence":"additional","affiliation":[{"name":"Hefei National Research Center for Physical Sciences at Microscale, University of Science and Technology of China, Hefei, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-8240-5404","authenticated-orcid":false,"given":"Yalin","family":"Lu","sequence":"additional","affiliation":[{"name":"Hefei National Research Center for Physical Sciences at Microscale, University of Science and Technology of China, Hefei, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref13","first-page":"30","article-title":"Resolution analysis of a polymethylmethacrylate tapered probe in near-field terahertz imaging","volume":"30","author":"zhu","year":"2015","journal-title":"Appl Comput Electromagn Soc J"},{"key":"ref35","doi-asserted-by":"crossref","DOI":"10.1103\/PhysRevLett.101.043901","article-title":"Input impedance, nanocircuit loading, and radiation tuning of optical nanoantennas","volume":"101","author":"al\u00f9","year":"2008","journal-title":"Phys Rev Lett"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TTHZ.2016.2607522"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1038\/nphoton.2008.53"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/j.ultramic.2021.113295"},{"key":"ref37","first-page":"213s","article-title":"Effect of tip modulation on image contrast in scattering-type near-field optical microscopy","volume":"47","author":"taubner","year":"2005","journal-title":"J Korean Phys Soc"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1364\/OE.24.002728"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1016\/j.ultramic.2011.07.003"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1021\/acs.nanolett.7b01924"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1080\/05704928.2018.1443275"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1063\/1.4926628"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1080\/09500340.2014.1001803"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1364\/OL.25.001122"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1016\/S0030-4018(00)00826-9"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TTHZ.2017.2764385"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1063\/1.1653250"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1063\/1.2348781"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1021\/acsphotonics.8b00636"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1038\/nnano.2016.185"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1038\/ncomms4499"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1038\/ncomms3890"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1002\/smll.202005814"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1063\/1.4943088"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1063\/1.4943793"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1038\/nphoton.2014.225"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1080\/00018732.2012.737982"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1126\/science.1246833"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1364\/OPTICA.5.000159"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1364\/OE.23.013358"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2019.2907742"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1038\/nphoton.2016.205"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1021\/nl802086x"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1063\/1.4926967"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1038\/nature19816"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TTHZ.2020.2990358"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1038\/nphys4047"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3050152"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/10012124\/10155189.pdf?arnumber=10155189","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,7,17]],"date-time":"2023-07-17T17:40:06Z","timestamp":1689615606000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10155189\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023]]},"references-count":37,"URL":"https:\/\/doi.org\/10.1109\/tim.2023.3287245","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2023]]}}}