{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,31]],"date-time":"2026-03-31T15:03:13Z","timestamp":1774969393438,"version":"3.50.1"},"reference-count":41,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"name":"Nature Science Foundation of Anhui","award":["2008085MF183"],"award-info":[{"award-number":["2008085MF183"]}]},{"name":"Nature Science Foundation of Anhui","award":["2008085MF192"],"award-info":[{"award-number":["2008085MF192"]}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["62071001"],"award-info":[{"award-number":["62071001"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100002858","name":"China Postdoctoral Science Foundation","doi-asserted-by":"publisher","award":["2023M730009"],"award-info":[{"award-number":["2023M730009"]}],"id":[{"id":"10.13039\/501100002858","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2023]]},"DOI":"10.1109\/tim.2023.3291000","type":"journal-article","created":{"date-parts":[[2023,6,30]],"date-time":"2023-06-30T17:21:20Z","timestamp":1688145680000},"page":"1-13","source":"Crossref","is-referenced-by-count":5,"title":["A Novel Bearing Fault Diagnosis Algorithm Based on Adaptive Weighted Multiview Learning"],"prefix":"10.1109","volume":"72","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-8084-8380","authenticated-orcid":false,"given":"Yixiang","family":"Lu","sequence":"first","affiliation":[{"name":"Key Laboratory of Intelligent Computing and Signal Processing of Ministry of Education, School of Electrical Engineering and Automation, Anhui University, Hefei, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-7135-9382","authenticated-orcid":false,"given":"Dingchao","family":"Zhu","sequence":"additional","affiliation":[{"name":"Key Laboratory of Intelligent Computing and Signal Processing of Ministry of Education, School of Electrical Engineering and Automation, Anhui University, Hefei, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-5772-8367","authenticated-orcid":false,"given":"Dawei","family":"Zhao","sequence":"additional","affiliation":[{"name":"Key Laboratory of Intelligent Computing and Signal Processing of Ministry of Education, School of Electrical Engineering and Automation, Anhui University, Hefei, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-5407-5241","authenticated-orcid":false,"given":"De","family":"Zhu","sequence":"additional","affiliation":[{"name":"Key Laboratory of Intelligent Computing and Signal Processing of Ministry of Education, School of Electrical Engineering and Automation, Anhui University, Hefei, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-1384-9228","authenticated-orcid":false,"given":"Dong","family":"Sun","sequence":"additional","affiliation":[{"name":"Key Laboratory of Intelligent Computing and Signal Processing of Ministry of Education, School of Electrical Engineering and Automation, Anhui University, Hefei, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5971-6850","authenticated-orcid":false,"given":"Qingwei","family":"Gao","sequence":"additional","affiliation":[{"name":"Key Laboratory of Intelligent Computing and Signal Processing of Ministry of Education, School of Electrical Engineering and Automation, Anhui University, Hefei, China"}]}],"member":"263","reference":[{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3186061"},{"key":"ref35","year":"2022","journal-title":"Society for Machinery Failure Prevention Technology"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.20965\/ijat.2022.p0340"},{"key":"ref34","year":"2022","journal-title":"Case Western Reserve University Bearing Data Center"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3072138"},{"key":"ref37","year":"2022","journal-title":"Jiangnan University Dataset"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2020.3009139"},{"key":"ref36","year":"2022","journal-title":"Xi’an?Xi’an Jiaotong University D"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2020.2986853"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2017.2669947"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3187717"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3091504"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TBME.2017.2679136"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2012.2202358"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3067657"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3159005"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3139660"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2021.108653"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3173646"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1016\/j.isatra.2020.08.010"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3178483"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2022.3156156"},{"key":"ref24","article-title":"A survey on multi-view learning","author":"xu","year":"2013","journal-title":"arXiv 1304 5634"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2020.3008010"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1609\/aaai.v28i1.8950"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2020.2964064"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2021.3135520"},{"key":"ref41","first-page":"1813","article-title":"Efficient and robust feature selection via joint ? 2,1-norms minimization","volume":"23","author":"nie","year":"2010","journal-title":"Proc Adv Neural Inf Process Syst"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3178743"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2020.2979467"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2019.2952476"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1609\/aaai.v29i1.9598"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2020.2994868"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2010.2047910"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TSP.2011.2143711"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3092513"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2758745"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2018.2806984"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.engappai.2022.104741"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2020.3001855"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1007\/s00366-021-01438-z"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/10012124\/10168977.pdf?arnumber=10168977","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,7,31]],"date-time":"2023-07-31T17:30:43Z","timestamp":1690824643000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10168977\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023]]},"references-count":41,"URL":"https:\/\/doi.org\/10.1109\/tim.2023.3291000","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2023]]}}}