{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,27]],"date-time":"2026-02-27T15:36:47Z","timestamp":1772206607496,"version":"3.50.1"},"reference-count":52,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2023]]},"DOI":"10.1109\/tim.2023.3291747","type":"journal-article","created":{"date-parts":[[2023,7,3]],"date-time":"2023-07-03T18:02:17Z","timestamp":1688407337000},"page":"1-12","source":"Crossref","is-referenced-by-count":26,"title":["Harmonic Reducer Fault Detection With Acoustic Emission"],"prefix":"10.1109","volume":"72","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-5834-9772","authenticated-orcid":false,"given":"Liansheng","family":"Liu","sequence":"first","affiliation":[{"name":"Automatic Test and Control Institute, Harbin Institute of Technology, Harbin, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-0517-1525","authenticated-orcid":false,"given":"Zhuo","family":"Zhi","sequence":"additional","affiliation":[{"name":"Automatic Test and Control Institute, Harbin Institute of Technology, Harbin, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1189-7661","authenticated-orcid":false,"given":"Yufei","family":"Yang","sequence":"additional","affiliation":[{"name":"Automatic Test and Control Institute, Harbin Institute of Technology, Harbin, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-3973-4445","authenticated-orcid":false,"given":"Shervin","family":"Shirmohammadi","sequence":"additional","affiliation":[{"name":"Automatic Test and Control Institute, Harbin Institute of Technology, Harbin, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9967-5427","authenticated-orcid":false,"given":"Datong","family":"Liu","sequence":"additional","affiliation":[{"name":"Automatic Test and Control Institute, Harbin Institute of Technology, Harbin, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1177\/13506501221106556"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.matpr.2021.05.447"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/j.sigpro.2022.108867"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.3390\/app9040768"},{"key":"ref52","doi-asserted-by":"publisher","DOI":"10.1007\/s12206-021-0101-7"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.apacoust.2009.04.007"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2020.3024038"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1177\/1687814021996915"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2020.2969062"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1016\/j.renene.2019.06.094"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1177\/14759217211036025"},{"key":"ref51","doi-asserted-by":"publisher","DOI":"10.1155\/2021\/6640387"},{"key":"ref50","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2020.108185"},{"key":"ref46","doi-asserted-by":"publisher","DOI":"10.1016\/S0045-7906(01)00011-8"},{"key":"ref45","doi-asserted-by":"publisher","DOI":"10.1007\/s40430-020-02470-8"},{"key":"ref48","doi-asserted-by":"publisher","DOI":"10.1016\/j.jsv.2012.08.019"},{"key":"ref47","doi-asserted-by":"publisher","DOI":"10.1109\/83.336245"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2018.07.014"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2020.2968382"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1006\/mssp.1999.1235"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.3390\/s18051523"},{"key":"ref49","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2010.08.014"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2023.113098"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2020.3046913"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2021.3137992"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2020.3047433"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2020.3024355"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2020.3016068"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2018.2806984"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2020.107554"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2019.2919375"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.3390\/app10010386"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/TSP.2013.2288675"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1088\/1742-6596\/1865\/3\/032075"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1142\/S1793536909000047"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2019.106443"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1007\/s12206-020-2208-7"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2018.2830109"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1007\/s12541-021-00552-8"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2020.108545"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1016\/j.jsv.2018.07.039"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2016.08.042"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.22266\/ijies2020.0430.08"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2020.108188"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1016\/j.mechmachtheory.2022.104919"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/IWISA.2009.5072690"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1007\/978-981-15-2866-8_10"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2020.108901"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2019.05.049"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2020.2971854"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1177\/1475921720970856"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2020.3044517"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/10012124\/10172095.pdf?arnumber=10172095","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,8,7]],"date-time":"2023-08-07T17:59:41Z","timestamp":1691431181000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10172095\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023]]},"references-count":52,"URL":"https:\/\/doi.org\/10.1109\/tim.2023.3291747","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2023]]}}}