{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,10]],"date-time":"2026-06-10T17:05:15Z","timestamp":1781111115038,"version":"3.54.1"},"reference-count":36,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100012166","name":"National Key Research and Development Program of China","doi-asserted-by":"publisher","award":["2022YFB3402100"],"award-info":[{"award-number":["2022YFB3402100"]}],"id":[{"id":"10.13039\/501100012166","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["52075267"],"award-info":[{"award-number":["52075267"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2023]]},"DOI":"10.1109\/tim.2023.3301863","type":"journal-article","created":{"date-parts":[[2023,8,4]],"date-time":"2023-08-04T17:21:25Z","timestamp":1691169685000},"page":"1-11","source":"Crossref","is-referenced-by-count":6,"title":["Joint Threshold Learning Convolutional Networks for Intelligent Fault Diagnosis Under Nonstationary Conditions"],"prefix":"10.1109","volume":"72","author":[{"ORCID":"https:\/\/orcid.org\/0009-0002-5824-4481","authenticated-orcid":false,"given":"Sheng","family":"Li","sequence":"first","affiliation":[{"name":"Business School, Hohai University, Nanjing, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0713-4434","authenticated-orcid":false,"given":"Yadong","family":"Xu","sequence":"additional","affiliation":[{"name":"School of Mechanical Engineering, Nanjing University of Science and Technology, Nanjing, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-2338-5161","authenticated-orcid":false,"given":"Ke","family":"Feng","sequence":"additional","affiliation":[{"name":"Department of Industrial Systems Engineering and Management, National University of Singapore, Cluny Road, Singapore"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-8799-5669","authenticated-orcid":false,"given":"Yulin","family":"Wang","sequence":"additional","affiliation":[{"name":"School of Mechanical Engineering, Nanjing University of Science and Technology, Nanjing, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-2233-2850","authenticated-orcid":false,"given":"Beibei","family":"Sun","sequence":"additional","affiliation":[{"name":"School of Mechanical Engineering, Southeast University, Nanjing, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-6986-6943","authenticated-orcid":false,"given":"Xiaoan","family":"Yan","sequence":"additional","affiliation":[{"name":"School of Mechatronics Engineering, Nanjing Forestry University, Nanjing, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0745-4956","authenticated-orcid":false,"given":"Xin","family":"Sheng","sequence":"additional","affiliation":[{"name":"School of Mechanical Engineering, Yangzhou University, Yangzhou, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0009-2007-3702","authenticated-orcid":false,"given":"Ke","family":"Zhang","sequence":"additional","affiliation":[{"name":"Business School, Hohai University, Nanjing, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0006-0952-8591","authenticated-orcid":false,"given":"Jinde","family":"Zheng","sequence":"additional","affiliation":[{"name":"School of Mechanical Engineering, Anhui University of Technology, Ma’anshan, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-7537-3934","authenticated-orcid":false,"given":"Qing","family":"Ni","sequence":"additional","affiliation":[{"name":"School of Mechanical and Mechatronic Engineering, University of Technology Sydney, Sydney, NSW, Australia"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2020.3017900"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/TMECH.2022.3199985"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TMECH.2022.3166839"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2020.3041735"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2023.3260469"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2023.3240210"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2019.2943898"},{"key":"ref31","doi-asserted-by":"crossref","first-page":"470","DOI":"10.1016\/j.isatra.2021.11.028","article-title":"Attention-guided joint learning CNN with noise robustness for bearing fault diagnosis and vibration signal denoising","volume":"128","author":"wang","year":"2022","journal-title":"ISA Trans"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3080402"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.inffus.2023.02.012"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2019.2941868"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2022.108648"},{"key":"ref32","article-title":"UniFormer: Unified transformer for efficient spatiotemporal representation learning","author":"li","year":"2022","journal-title":"arXiv 2201 04676"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.37965\/jdmd.2023.152"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2020.3042300"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1177\/14759217221099966"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2023.3251654"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3085951"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2022.108714"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3091498"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2022.108618"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2022.3224969"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3214300"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/j.isatra.2021.04.022"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/j.knosys.2020.105971"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2022.3144572"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3213016"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2022.109605"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3199252"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2021.3058993"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6501\/ab4488"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2023.3256400"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2023.109186"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2021.3125666"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TNNLS.2021.3060494"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2022.109896"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/10012124\/10209225.pdf?arnumber=10209225","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,9,11]],"date-time":"2023-09-11T18:01:40Z","timestamp":1694455300000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10209225\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023]]},"references-count":36,"URL":"https:\/\/doi.org\/10.1109\/tim.2023.3301863","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2023]]}}}