{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,7,23]],"date-time":"2025-07-23T12:47:49Z","timestamp":1753274869817,"version":"3.37.3"},"reference-count":27,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100012166","name":"National Key Research and Development Program of China","doi-asserted-by":"publisher","award":["2022YFE0103800","2022YFC3003204"],"award-info":[{"award-number":["2022YFE0103800","2022YFC3003204"]}],"id":[{"id":"10.13039\/501100012166","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["42174221"],"award-info":[{"award-number":["42174221"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Educational Commission of Jilin Province"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2023]]},"DOI":"10.1109\/tim.2023.3302374","type":"journal-article","created":{"date-parts":[[2023,8,7]],"date-time":"2023-08-07T17:59:02Z","timestamp":1691431142000},"page":"1-9","source":"Crossref","is-referenced-by-count":3,"title":["All Solid-State Electrode With Low Contact Resistance and Low Polarization for Measuring the Electrical Properties of Rocks"],"prefix":"10.1109","volume":"72","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-1681-196X","authenticated-orcid":false,"given":"Yi","family":"Xin","sequence":"first","affiliation":[{"name":"College of Instrumentation and Electrical Engineering, Jilin University, Changchun, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2835-3487","authenticated-orcid":false,"given":"Yuhang","family":"Wang","sequence":"additional","affiliation":[{"name":"College of Instrumentation and Electrical Engineering, Jilin University, Changchun, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-5305-5898","authenticated-orcid":false,"given":"Xuefeng","family":"Song","sequence":"additional","affiliation":[{"name":"College of Instrumentation and Electrical Engineering, Jilin University, Changchun, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8932-6423","authenticated-orcid":false,"given":"Junye","family":"Tong","sequence":"additional","affiliation":[{"name":"College of Instrumentation and Electrical Engineering, Jilin University, Changchun, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1016-3244","authenticated-orcid":false,"given":"Tianyuan","family":"Hou","sequence":"additional","affiliation":[{"name":"College of Instrumentation and Electrical Engineering, Jilin University, Changchun, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-2575-0679","authenticated-orcid":false,"given":"Hongyan","family":"Liu","sequence":"additional","affiliation":[{"name":"College of Instrumentation and Electrical Engineering, Jilin University, Changchun, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-1814-0920","authenticated-orcid":false,"given":"Meng","family":"Cui","sequence":"additional","affiliation":[{"name":"College of Instrumentation and Electrical Engineering, Jilin University, Changchun, China"}]}],"member":"263","reference":[{"doi-asserted-by":"publisher","key":"ref13","DOI":"10.1007\/BF02474708"},{"doi-asserted-by":"publisher","key":"ref12","DOI":"10.1016\/j.egypro.2016.07.156"},{"doi-asserted-by":"publisher","key":"ref15","DOI":"10.1109\/TIM.2010.2047133"},{"doi-asserted-by":"publisher","key":"ref14","DOI":"10.1109\/TBME.2005.857639"},{"key":"ref11","first-page":"179","article-title":"Study of the application of gel electrolyte in the reference electrode of Cu\/CuSO4","volume":"7","author":"lin","year":"2008","journal-title":"Corros Eng Sci Technol"},{"doi-asserted-by":"publisher","key":"ref10","DOI":"10.1016\/j.jappgeo.2017.12.017"},{"doi-asserted-by":"publisher","key":"ref2","DOI":"10.1007\/s42461-022-00554-8"},{"doi-asserted-by":"publisher","key":"ref1","DOI":"10.1016\/j.jappgeo.2004.09.003"},{"doi-asserted-by":"publisher","key":"ref17","DOI":"10.1007\/s11001-010-9092-y"},{"doi-asserted-by":"publisher","key":"ref16","DOI":"10.1190\/geo2015-0484.1"},{"doi-asserted-by":"publisher","key":"ref19","DOI":"10.1680\/jenge.16.00005"},{"doi-asserted-by":"publisher","key":"ref18","DOI":"10.3390\/coatings12050558"},{"doi-asserted-by":"publisher","key":"ref24","DOI":"10.1063\/5.0056177"},{"doi-asserted-by":"publisher","key":"ref23","DOI":"10.1109\/TIM.2018.2806950"},{"doi-asserted-by":"publisher","key":"ref26","DOI":"10.1149\/1.1393914"},{"doi-asserted-by":"publisher","key":"ref25","DOI":"10.1149\/1.3056125"},{"doi-asserted-by":"publisher","key":"ref20","DOI":"10.1002\/inf2.12039"},{"doi-asserted-by":"publisher","key":"ref22","DOI":"10.1002\/ejic.202001024"},{"doi-asserted-by":"publisher","key":"ref21","DOI":"10.1002\/admt.201900083"},{"year":"2008","journal-title":"Evaluation of Measurement—Guide to the Expression of Uncertainty in Measurement","key":"ref27"},{"doi-asserted-by":"publisher","key":"ref8","DOI":"10.1109\/ACCESS.2020.3044929"},{"doi-asserted-by":"publisher","key":"ref7","DOI":"10.1109\/19.963211"},{"doi-asserted-by":"publisher","key":"ref9","DOI":"10.1190\/INT-2019-0213.1"},{"doi-asserted-by":"publisher","key":"ref4","DOI":"10.1016\/j.jappgeo.2015.01.012"},{"doi-asserted-by":"publisher","key":"ref3","DOI":"10.1016\/j.tafmec.2020.102758"},{"doi-asserted-by":"publisher","key":"ref6","DOI":"10.1109\/TIM.2021.3108228"},{"doi-asserted-by":"publisher","key":"ref5","DOI":"10.1109\/LGRS.2018.2886416"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/10012124\/10210220.pdf?arnumber=10210220","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,9,4]],"date-time":"2023-09-04T18:02:20Z","timestamp":1693850540000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10210220\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023]]},"references-count":27,"URL":"https:\/\/doi.org\/10.1109\/tim.2023.3302374","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"type":"print","value":"0018-9456"},{"type":"electronic","value":"1557-9662"}],"subject":[],"published":{"date-parts":[[2023]]}}}