{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,25]],"date-time":"2026-02-25T17:37:18Z","timestamp":1772041038787,"version":"3.50.1"},"reference-count":39,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["62071206"],"award-info":[{"award-number":["62071206"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["62171141"],"award-info":[{"award-number":["62171141"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2023]]},"DOI":"10.1109\/tim.2023.3303505","type":"journal-article","created":{"date-parts":[[2023,8,9]],"date-time":"2023-08-09T17:26:58Z","timestamp":1691602018000},"page":"1-10","source":"Crossref","is-referenced-by-count":13,"title":["Sparse Bayesian Learning Approach for Broken Rotor Bar Fault Diagnosis"],"prefix":"10.1109","volume":"72","author":[{"ORCID":"https:\/\/orcid.org\/0009-0009-6289-7152","authenticated-orcid":false,"given":"Ming","family":"Ma","sequence":"first","affiliation":[{"name":"Department of Electronic Information Engineering, Jiangsu University, Zhenjiang, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3444-3208","authenticated-orcid":false,"given":"Zheng","family":"Cao","sequence":"additional","affiliation":[{"name":"Department of Electronic Information Engineering, Jiangsu University, Zhenjiang, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2904-9823","authenticated-orcid":false,"given":"Haijun","family":"Fu","sequence":"additional","affiliation":[{"name":"Department of Electronic Information Engineering, Jiangsu University, Zhenjiang, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-6516-0927","authenticated-orcid":false,"given":"Weichao","family":"Xu","sequence":"additional","affiliation":[{"name":"Department of Automatic Control, Guangdong University of Technology, Guangzhou, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-0462-4414","authenticated-orcid":false,"given":"Jisheng","family":"Dai","sequence":"additional","affiliation":[{"name":"Department of Electronic Information Engineering, Jiangsu University, Zhenjiang, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2019.2939678"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2020.2975388"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3141152"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2020.3003107"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2020.106908"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2018.2877781"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2008.2007004"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2020.3009011"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2016.2540941"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2018.2813820"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2018.2870265"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2021.3112137"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2022.111340"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2018.2874463"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2017.11.004"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2021.3121788"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2012.2227912"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2016.2603968"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2015.2505663"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/tec.2022.3162394"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2017.2764846"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2016.2570741"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2012.2236557"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TSP.2020.2994514"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2020.3011065"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2019.2909305"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2020.3039648"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2021.3119002"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TSP.2007.914345"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2019.2951008"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2012.2194148"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/TSP.2012.2222378"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/LSP.2021.3104503"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/TSP.2018.2807390"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/MSP.2008.929620"},{"key":"ref36","first-page":"211","article-title":"Sparse Bayesian learning and the relevance vector machine","volume":"1","author":"Tipping","year":"2001","journal-title":"J. Mach. Learn. Res."},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2013.2279917"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1155\/2011\/620689"},{"key":"ref39","volume-title":"Experimental Database for Detecting and Diagnosing Rotor Broken Bar in a Three-Phase Induction Motor","author":"Treml","year":"2021"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/10012124\/10214057.pdf?arnumber=10214057","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,3,1]],"date-time":"2024-03-01T18:49:09Z","timestamp":1709318949000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10214057\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023]]},"references-count":39,"URL":"https:\/\/doi.org\/10.1109\/tim.2023.3303505","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2023]]}}}