{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,18]],"date-time":"2026-03-18T14:20:41Z","timestamp":1773843641906,"version":"3.50.1"},"reference-count":31,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61901219"],"award-info":[{"award-number":["61901219"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["62271258"],"award-info":[{"award-number":["62271258"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61871225"],"award-info":[{"award-number":["61871225"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100012226","name":"Fundamental Research Funds for the Central Universities","doi-asserted-by":"publisher","award":["30917012202"],"award-info":[{"award-number":["30917012202"]}],"id":[{"id":"10.13039\/501100012226","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100012226","name":"Fundamental Research Funds for the Central Universities","doi-asserted-by":"publisher","award":["30920021128"],"award-info":[{"award-number":["30920021128"]}],"id":[{"id":"10.13039\/501100012226","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2023]]},"DOI":"10.1109\/tim.2023.3307173","type":"journal-article","created":{"date-parts":[[2023,8,21]],"date-time":"2023-08-21T17:48:48Z","timestamp":1692640128000},"page":"1-11","source":"Crossref","is-referenced-by-count":10,"title":["Three Steps From Grid-Less Pressure Sensors to Gait Recognition"],"prefix":"10.1109","volume":"72","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-7529-024X","authenticated-orcid":false,"given":"Xiaobo","family":"Zhu","sequence":"first","affiliation":[{"name":"School of Microelectronics (School of Integrated Circuits), Key Laboratory of Near-Range RF Sensing ICs and Microsystems, Ministry of Education, Nanjing University of Science and Technology, Nanjing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0000-6369-1273","authenticated-orcid":false,"given":"Jiale","family":"Gao","sequence":"additional","affiliation":[{"name":"School of Microelectronics (School of Integrated Circuits), Key Laboratory of Near-Range RF Sensing ICs and Microsystems, Ministry of Education, Nanjing University of Science and Technology, Nanjing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3434-1906","authenticated-orcid":false,"given":"Yijie","family":"Dai","sequence":"additional","affiliation":[{"name":"School of Microelectronics (School of Integrated Circuits), Nanjing University of Science and Technology, Nanjing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4354-2235","authenticated-orcid":false,"given":"Jianguo","family":"Zhang","sequence":"additional","affiliation":[{"name":"School of Microelectronics (School of Integrated Circuits), Nanjing University of Science and Technology, Nanjing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-6515-5503","authenticated-orcid":false,"given":"Weidong","family":"Zhang","sequence":"additional","affiliation":[{"name":"School of Microelectronics (School of Integrated Circuits), Nanjing University of Science and Technology, Nanjing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-7193-9950","authenticated-orcid":false,"given":"Daying","family":"Sun","sequence":"additional","affiliation":[{"name":"School of Microelectronics (School of Integrated Circuits), Nanjing University of Science and Technology, Nanjing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0695-2291","authenticated-orcid":false,"given":"Wenhua","family":"Gu","sequence":"additional","affiliation":[{"name":"School of Microelectronics (School of Integrated Circuits), Key Laboratory of Near-Range RF Sensing ICs and Microsystems, Ministry of Education, Nanjing University of Science and Technology, Nanjing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3092072"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.gaitpost.2016.12.021"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1007\/s00371-016-1330-0"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TGRS.2019.2929096"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1016\/j.imavis.2018.04.004"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.3390\/s20247286"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TNSRE.2013.2239313"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2022.3154092"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TBME.2012.2227317"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/JBHI.2021.3122299"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2018.2879896"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1007\/s10586-019-03014-z"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3204088"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2021.3099304"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.3390\/s120202255"},{"key":"ref23","year":"1989","journal-title":"Observational Gait Analysis Handbook"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/I2MTC48687.2022.9806689"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2021.3131613"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/LSENS.2021.3053963"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3108174"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3069044"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3201947"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3134333"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3214271"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1007\/s12021-016-9313-x"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TBME.2014.2368211"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.3390\/s150922089"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2022.3224047"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1186\/s12984-016-0146-5"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TVCG.2019.2953063"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2019.2949583"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/10012124\/10225554.pdf?arnumber=10225554","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,9,25]],"date-time":"2023-09-25T18:15:02Z","timestamp":1695665702000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10225554\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023]]},"references-count":31,"URL":"https:\/\/doi.org\/10.1109\/tim.2023.3307173","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2023]]}}}