{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,13]],"date-time":"2026-03-13T15:16:47Z","timestamp":1773415007361,"version":"3.50.1"},"reference-count":29,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61971093"],"award-info":[{"award-number":["61971093"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61960206010"],"award-info":[{"award-number":["61960206010"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61527803"],"award-info":[{"award-number":["61527803"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Deyuan and University of Electronic Science and Technology of China (UESTC) Joint Research Center"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2023]]},"DOI":"10.1109\/tim.2023.3310083","type":"journal-article","created":{"date-parts":[[2023,8,30]],"date-time":"2023-08-30T17:21:50Z","timestamp":1693416110000},"page":"1-15","source":"Crossref","is-referenced-by-count":22,"title":["Electromagnetic Coupling Sensing of Pipe In-Line Inspection System"],"prefix":"10.1109","volume":"72","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-4027-6779","authenticated-orcid":false,"given":"Gaige","family":"Ru","sequence":"first","affiliation":[{"name":"School of Automation Engineering, University of Electronic Science and Technology of China, Chengdu, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3377-6895","authenticated-orcid":false,"given":"Bin","family":"Gao","sequence":"additional","affiliation":[{"name":"School of Automation Engineering, University of Electronic Science and Technology of China, Chengdu, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9296-4074","authenticated-orcid":false,"given":"Qin","family":"Tang","sequence":"additional","affiliation":[{"name":"School of Automation Engineering, University of Electronic Science and Technology of China, Chengdu, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8755-6479","authenticated-orcid":false,"given":"Shiqiang","family":"Jiang","sequence":"additional","affiliation":[{"name":"Deyuan Pipeline Technology Company Ltd., Chengdu, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8111-7459","authenticated-orcid":false,"given":"Yong","family":"Zhang","sequence":"additional","affiliation":[{"name":"Deyuan Pipeline Technology Company Ltd., Chengdu, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-2265-8949","authenticated-orcid":false,"given":"Fei","family":"Luo","sequence":"additional","affiliation":[{"name":"Deyuan Pipeline Technology Company Ltd., Chengdu, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8698-7605","authenticated-orcid":false,"given":"Wai Lok","family":"Woo","sequence":"additional","affiliation":[{"name":"Department of Computer and Information Sciences, Northumbria University, Newcastle upon Tyne, U.K."}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/I2MTC.2019.8827114"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1063\/1.5090938"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2021.3094319"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.3390\/s21103565"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.apacoust.2020.107416"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.sna.2021.113023"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/IRIS.2015.7451622"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.jlp.2016.03.010"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/j.infrared.2014.02.004"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/j.compositesb.2016.11.018"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1016\/j.ndteint.2014.12.008"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2019.2891107"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2020.2984444"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1016\/j.jngse.2021.103933"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2017.2728338"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.3390\/mi11090840"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/j.sna.2015.09.011"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/j.ndteint.2009.06.009"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1016\/j.sna.2022.113940"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2022.3148755"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2016.2604118"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1364\/AO.55.006480"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.ndteint.2006.12.008"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3062421"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2020.2989704"},{"key":"ref4","first-page":"36","article-title":"Magnetic flux leakage (MFL) technology for natural gas pipeline inspection","volume":"30","author":"ilueng","year":"1997","journal-title":"NDT & E Int"},{"key":"ref3","first-page":"25","article-title":"A review on different pipeline defect detection techniquesm","author":"razvarz","year":"2021","journal-title":"Flow Modelling and Control in Pipeline Systems A Formal Systematic Approach"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.autcon.2022.104285"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.ndteint.2011.03.004"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/10012124\/10234676.pdf?arnumber=10234676","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,9,15]],"date-time":"2023-09-15T19:47:03Z","timestamp":1694807223000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10234676\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023]]},"references-count":29,"URL":"https:\/\/doi.org\/10.1109\/tim.2023.3310083","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2023]]}}}