{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,30]],"date-time":"2026-03-30T04:35:13Z","timestamp":1774845313287,"version":"3.50.1"},"reference-count":47,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61901308"],"award-info":[{"award-number":["61901308"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2023]]},"DOI":"10.1109\/tim.2023.3310088","type":"journal-article","created":{"date-parts":[[2023,8,30]],"date-time":"2023-08-30T17:21:50Z","timestamp":1693416110000},"page":"1-13","source":"Crossref","is-referenced-by-count":12,"title":["Surface Defect Detection of Highly Reflective Leather Based on Dual-Mask-Guided Deep-Learning Model"],"prefix":"10.1109","volume":"72","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-8757-9646","authenticated-orcid":false,"given":"Shaojiang","family":"Yuan","sequence":"first","affiliation":[{"name":"School of Computer Science and Artificial Intelligence, Wuhan Textile University, Wuhan, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2027-1145","authenticated-orcid":false,"given":"Li","family":"Li","sequence":"additional","affiliation":[{"name":"School of Computer Science and Artificial Intelligence, Wuhan Textile University, Wuhan, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5236-8216","authenticated-orcid":false,"given":"Hao","family":"Chen","sequence":"additional","affiliation":[{"name":"School of Computer Science and Artificial Intelligence, Wuhan Textile University, Wuhan, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-7660-5290","authenticated-orcid":false,"given":"Xian","family":"Li","sequence":"additional","affiliation":[{"name":"School of Computer Science and Artificial Intelligence, Wuhan Textile University, Wuhan, China"}]}],"member":"263","reference":[{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2003.821497"},{"key":"ref35","article-title":"Adam: A method for stochastic optimization","author":"kingma","year":"2014","journal-title":"arXiv 1412 6980"},{"key":"ref12","author":"jocher","year":"2020","journal-title":"YOLOv5 by Ultralytics"},{"key":"ref34","article-title":"Very deep convolutional networks for large-scale image recognition","author":"simonyan","year":"2014","journal-title":"arXiv 1409 1556"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/j.optlaseng.2020.106423"},{"key":"ref37","first-page":"4411","article-title":"Mgrln-Net: Mask-guided residual learning network for joint single-image shadow detection and removal","author":"jie","year":"2022","journal-title":"Proc Asian Conf Comput Vis"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2022.111138"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/TMI.2019.2926501"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV.2017.167"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2016.265"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1007\/s41095-022-0273-9"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR52688.2022.01104"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR46437.2021.00766"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR46437.2021.00788"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2017.2775345"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1007\/s12599-014-0334-4"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV.2003.1238669"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.2017.2699184"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.3390\/app12052269"},{"key":"ref38","first-page":"3","article-title":"UNet++: A nested U-Net architecture for medical image segmentation","author":"zhou","year":"2018","journal-title":"Deep Learning in Medical Image Analysis and Multimodal Learning for Clinical Decision Support"},{"key":"ref19","first-page":"1","article-title":"Non-negative matrix factorization with sparseness constraints","volume":"5","author":"hoyer","year":"2004","journal-title":"J Mach Learn Res"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.2018.2803179"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1016\/j.imavis.2019.11.001"},{"key":"ref46","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-030-01225-0_17"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1002\/col.5080100409"},{"key":"ref45","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR52729.2023.01862"},{"key":"ref26","first-page":"24261","article-title":"MLP-mixer: An all-MLP architecture for vision","volume":"34","author":"tolstikhin","year":"2021","journal-title":"Proc 35th Conf Neural Inf Process Syst"},{"key":"ref25","first-page":"234","article-title":"U-Net: Convolutional networks for biomedical image segmentation","author":"ronneberger","year":"2015","journal-title":"Medical Image Computing and Computer-Assisted Intervention—MICCAI"},{"key":"ref47","doi-asserted-by":"crossref","first-page":"600","DOI":"10.1109\/TIP.2003.819861","article-title":"Image quality assessment: From error visibility to structural similarity","volume":"13","author":"wang","year":"2004","journal-title":"IEEE Trans Image Process"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1145\/3394171.3413586"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1117\/1.OE.53.1.014104"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1109\/LGRS.2018.2802944"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/j.patcog.2008.01.026"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-031-19797-0_3"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.2005.36"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1016\/j.patcog.2020.107404"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.2019.2919616"},{"key":"ref27","article-title":"M2-Net: Multi-stages specular highlight detection and removal in multi-scenes","author":"huang","year":"2022","journal-title":"arXiv 2207 09965"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV48922.2021.00986"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1117\/12.2293755"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ICRA40945.2020.9196980"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1111\/cgf.13834"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3193183"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2020.3023509"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.3390\/s19030644"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.3390\/electronics8050481"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2017.660"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/10012124\/10234460.pdf?arnumber=10234460","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,10,9]],"date-time":"2023-10-09T18:47:37Z","timestamp":1696877257000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10234460\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023]]},"references-count":47,"URL":"https:\/\/doi.org\/10.1109\/tim.2023.3310088","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2023]]}}}