{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,9,10]],"date-time":"2025-09-10T21:37:52Z","timestamp":1757540272015,"version":"3.37.3"},"reference-count":27,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2023]]},"DOI":"10.1109\/tim.2023.3312750","type":"journal-article","created":{"date-parts":[[2023,9,11]],"date-time":"2023-09-11T18:03:53Z","timestamp":1694455433000},"page":"1-9","source":"Crossref","is-referenced-by-count":3,"title":["Error Analysis and Correction of Radiation Pyrometer in Measuring Surface Temperature of Turbine Blades With the Influence of Reflection"],"prefix":"10.1109","volume":"72","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-8016-968X","authenticated-orcid":false,"given":"Jie","family":"Ji","sequence":"first","affiliation":[{"name":"School of Instrumentation and Optoelectronic Engineering, Beihang University, Beijing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8509-1049","authenticated-orcid":false,"given":"Ming","family":"Ding","sequence":"additional","affiliation":[{"name":"School of Instrumentation and Optoelectronic Engineering, Beihang University, Beijing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4105-9936","authenticated-orcid":false,"given":"Botao","family":"Wang","sequence":"additional","affiliation":[{"name":"School of Instrumentation and Optoelectronic Engineering, Beihang University, Beijing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-6239-7902","authenticated-orcid":false,"given":"Chang","family":"Sun","sequence":"additional","affiliation":[{"name":"School of Instrumentation and Optoelectronic Engineering, Beihang University, Beijing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2016.06.023"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1002\/fam.844"},{"key":"ref15","doi-asserted-by":"crossref","first-page":"133","DOI":"10.1016\/j.measurement.2016.02.054","article-title":"Single wavelength and ratio pyrometry reflection errors in temperature measurement of gas turbine blade","volume":"86","author":"daniel","year":"2016","journal-title":"Measurement"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1115\/1.4035732"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1063\/1.1627216"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1063\/1.1384448"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.infrared.2016.11.014"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.3390\/app11093913"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6501\/abdb7a"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1117\/1.OE.54.6.065102"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1016\/j.infrared.2016.10.011"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1016\/j.infrared.2016.01.013"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2023.3269110"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1115\/1.1452245"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1243\/09576509JPE422"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1016\/j.infrared.2018.07.022"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6501\/aab394"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1115\/1.2814100"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1088\/0957-0233\/13\/6\/307"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1088\/1742-6596\/1210\/1\/012162"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1111\/j.1749-6632.2001.tb05858.x"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1088\/0026-1394\/33\/4\/12"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1088\/0022-3735\/20\/6\/008"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.3390\/app10082888"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.infrared.2018.09.004"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1086\/319148"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.3390\/act11070188"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/10012124\/10247153.pdf?arnumber=10247153","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,11,20]],"date-time":"2023-11-20T19:15:08Z","timestamp":1700507708000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10247153\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023]]},"references-count":27,"URL":"https:\/\/doi.org\/10.1109\/tim.2023.3312750","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"type":"print","value":"0018-9456"},{"type":"electronic","value":"1557-9662"}],"subject":[],"published":{"date-parts":[[2023]]}}}