{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,12,3]],"date-time":"2025-12-03T18:06:34Z","timestamp":1764785194502,"version":"3.37.3"},"reference-count":38,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"name":"Shanghai Pujiang Talents Program","award":["21PJ1410500"],"award-info":[{"award-number":["21PJ1410500"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2023]]},"DOI":"10.1109\/tim.2023.3318726","type":"journal-article","created":{"date-parts":[[2023,9,25]],"date-time":"2023-09-25T18:15:02Z","timestamp":1695665702000},"page":"1-12","source":"Crossref","is-referenced-by-count":3,"title":["Visual Tracking With Motion Distortion Removal for Nanomanipulation Inside SEM"],"prefix":"10.1109","volume":"72","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-6320-1497","authenticated-orcid":false,"given":"Xiang","family":"Fu","sequence":"first","affiliation":[{"name":"School of Information Science and Technology, ShanghaiTech University, Shanghai, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-8934-785X","authenticated-orcid":false,"given":"Yuting","family":"Yang","sequence":"additional","affiliation":[{"name":"School of Information Science and Technology, ShanghaiTech University, Shanghai, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-7555-6770","authenticated-orcid":false,"given":"Zhenhuan","family":"Sun","sequence":"additional","affiliation":[{"name":"School of Information Science and Technology, ShanghaiTech University, Shanghai, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-0551-3193","authenticated-orcid":false,"given":"Hu","family":"Su","sequence":"additional","affiliation":[{"name":"Institute of Automation, Chinese Academy of Sciences, Beijing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5227-1326","authenticated-orcid":false,"given":"Youfu","family":"Li","sequence":"additional","affiliation":[{"name":"Department of Mechanical Engineering, City University of Hong Kong, Pokfulam, Hong Kong"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-6420-8984","authenticated-orcid":false,"given":"Teng","family":"Li","sequence":"additional","affiliation":[{"name":"School of Information Science and Technology, ShanghaiTech University, Shanghai, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0519-226X","authenticated-orcid":false,"given":"Song","family":"Liu","sequence":"additional","affiliation":[{"name":"School of Information Science and Technology, ShanghaiTech University, Shanghai, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2023.3260279"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/NANO54668.2022.9928655"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1002\/sca.20282"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1080\/17458080.2013.814173"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/CYBERNETICSCOM.2017.8311683"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/3M-NANO49087.2021.9599747"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TSM.2020.2979680"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.5201\/ipol.2012.gjmr-lsd"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2005.38"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1016\/j.jvcir.2013.05.006"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/IROS40897.2019.8968567"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/ICRA.2014.6907624"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/IROS.2016.7759766"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/TRO.2014.2298551"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ICNST52433.2021.9509323"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3065436"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/ICORAS.2016.7872624"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1002\/sca.21250"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1002\/cyto.a.23142"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/ISSM55802.2022.10026935"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/ASMC49169.2020.9185250"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.5201\/ipol.2011.ys-dct"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TASE.2014.2332543"},{"key":"ref26","doi-asserted-by":"crossref","first-page":"674","DOI":"10.1109\/TNANO.2010.2065236","article-title":"Automated four-point probe measurement of nanowires inside a scanning electron microscope","volume":"10","author":"ru","year":"2011","journal-title":"IEEE Trans Nanotechnol"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TASE.2022.3146486"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1117\/12.2584803"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/ROBIO.2016.7866504"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1007\/s11665-019-04176-y"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1093\/nar\/gkg509"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TMECH.2014.2361271"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1007\/11744023_32"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2016.2556898"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3124835"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1017\/S1431927612000220"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2019.2934079"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.3390\/s18041137"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1038\/micronano.2016.24"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2003.818333"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/10012124\/10262182.pdf?arnumber=10262182","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,10,30]],"date-time":"2023-10-30T18:56:08Z","timestamp":1698692168000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10262182\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023]]},"references-count":38,"URL":"https:\/\/doi.org\/10.1109\/tim.2023.3318726","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"type":"print","value":"0018-9456"},{"type":"electronic","value":"1557-9662"}],"subject":[],"published":{"date-parts":[[2023]]}}}