{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,2]],"date-time":"2026-04-02T16:55:45Z","timestamp":1775148945035,"version":"3.50.1"},"reference-count":30,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100012166","name":"National Key Research and Development Program of China","doi-asserted-by":"publisher","award":["2021YFB2011400"],"award-info":[{"award-number":["2021YFB2011400"]}],"id":[{"id":"10.13039\/501100012166","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["52275077"],"award-info":[{"award-number":["52275077"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2023]]},"DOI":"10.1109\/tim.2023.3320740","type":"journal-article","created":{"date-parts":[[2023,9,29]],"date-time":"2023-09-29T17:39:53Z","timestamp":1696009193000},"page":"1-8","source":"Crossref","is-referenced-by-count":10,"title":["Acoustic Emission-Based Cross-Domain Process Health Monitoring for Additive Manufacturing"],"prefix":"10.1109","volume":"72","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-5995-515X","authenticated-orcid":false,"given":"Hao","family":"Li","sequence":"first","affiliation":[{"name":"School of Reliability and Systems Engineering, Beihang University, Beijing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3545-9287","authenticated-orcid":false,"given":"Fei","family":"Gao","sequence":"additional","affiliation":[{"name":"School of Reliability and Systems Engineering, Beihang University, Beijing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-3901-5993","authenticated-orcid":false,"given":"Jinyang","family":"Jiao","sequence":"additional","affiliation":[{"name":"School of Reliability and Systems Engineering, Beihang University, Beijing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3090-7095","authenticated-orcid":false,"given":"Zongyang","family":"Liu","sequence":"additional","affiliation":[{"name":"School of Reliability and Systems Engineering, Beihang University, Beijing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-1890-9840","authenticated-orcid":false,"given":"Dingcheng","family":"Ji","sequence":"additional","affiliation":[{"name":"School of Reliability and Systems Engineering, Beihang University, Beijing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-7670-1482","authenticated-orcid":false,"given":"Jing","family":"Lin","sequence":"additional","affiliation":[{"name":"School of Reliability and Systems Engineering, Beihang University, Beijing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TMECH.2021.3110818"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.addma.2021.101915"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/j.jmsy.2021.03.012"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/JIOT.2023.3239944"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1038\/s41467-019-13055-y"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.conbuildmat.2019.04.082"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1007\/s11665-020-05125-w"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.matchemphys.2022.126144"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.addma.2018.06.020"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2018.12.067"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2019.2910524"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1080\/17452759.2022.2028380"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1007\/s10845-020-01549-2"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2022.3231414"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2021.3076704"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2019.2956294"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3179468"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/j.jmsy.2022.01.007"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3116309"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2022.109628"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1016\/j.knosys.2018.12.019"},{"key":"ref27","article-title":"Deep domain confusion: Maximizing for domain invariance","author":"tzeng","year":"2014","journal-title":"arXiv 1412 3474"},{"key":"ref29","first-page":"1","article-title":"Conditional adversarial domain adaptation","volume":"31","author":"long","year":"2018","journal-title":"Proc Adv Neural Inf Process Syst"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2021.110503"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1007\/s40964-019-00108-3"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2021.110232"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.isatra.2018.07.021"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1007\/s10845-022-01972-7"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2019.2956078"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.addma.2019.05.030"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/10012124\/10268094.pdf?arnumber=10268094","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,11,6]],"date-time":"2023-11-06T19:17:59Z","timestamp":1699298279000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10268094\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023]]},"references-count":30,"URL":"https:\/\/doi.org\/10.1109\/tim.2023.3320740","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2023]]}}}