{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,10]],"date-time":"2026-01-10T19:37:27Z","timestamp":1768073847286,"version":"3.49.0"},"reference-count":31,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["51821003"],"award-info":[{"award-number":["51821003"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["52275551"],"award-info":[{"award-number":["52275551"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100003398","name":"Shanxi Scholarship Council of China","doi-asserted-by":"publisher","award":["2021\u2013117"],"award-info":[{"award-number":["2021\u2013117"]}],"id":[{"id":"10.13039\/501100003398","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100015306","name":"Fund for Shanxi \u201c1331 Project\u201d Key Subjects Construction, China","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100015306","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2023]]},"DOI":"10.1109\/tim.2023.3322476","type":"journal-article","created":{"date-parts":[[2023,10,6]],"date-time":"2023-10-06T17:50:23Z","timestamp":1696614623000},"page":"1-7","source":"Crossref","is-referenced-by-count":12,"title":["Toward Characterizing 3-D Microwave Field With Microscale Resolution Using Nitrogen-Vacancy Centers in Diamond"],"prefix":"10.1109","volume":"72","author":[{"ORCID":"https:\/\/orcid.org\/0009-0006-2112-5170","authenticated-orcid":false,"given":"Ding","family":"Wang","sequence":"first","affiliation":[{"name":"Key Laboratory of Instrument Science and Dynamic Testing Ministry of Education and the Key Laboratory of Quantum Sensing and Precision Measurement, North University of China, Taiyuan, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2972-9669","authenticated-orcid":false,"given":"Huan Fei","family":"Wen","sequence":"additional","affiliation":[{"name":"Key Laboratory of Instrument Science and Dynamic Testing Ministry of Education and the Key Laboratory of Quantum Sensing and Precision Measurement, North University of China, Taiyuan, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2594-5946","authenticated-orcid":false,"given":"Xin","family":"Li","sequence":"additional","affiliation":[{"name":"Key Laboratory of Instrument Science and Dynamic Testing Ministry of Education and the Key Laboratory of Quantum Sensing and Precision Measurement, North University of China, Taiyuan, China"}]},{"ORCID":"https:\/\/orcid.org\/0009-0004-1333-7777","authenticated-orcid":false,"given":"Yuchong","family":"Jin","sequence":"additional","affiliation":[{"name":"Key Laboratory of Instrument Science and Dynamic Testing Ministry of Education and the Key Laboratory of Quantum Sensing and Precision Measurement, North University of China, Taiyuan, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-3595-0263","authenticated-orcid":false,"given":"Wenyuan","family":"Hao","sequence":"additional","affiliation":[{"name":"Key Laboratory of Instrument Science and Dynamic Testing Ministry of Education and the Key Laboratory of Quantum Sensing and Precision Measurement, North University of China, Taiyuan, China"}]},{"ORCID":"https:\/\/orcid.org\/0009-0002-9758-1536","authenticated-orcid":false,"given":"Ziheng","family":"Gao","sequence":"additional","affiliation":[{"name":"Key Laboratory of Instrument Science and Dynamic Testing Ministry of Education and the Key Laboratory of Quantum Sensing and Precision Measurement, North University of China, Taiyuan, China"}]},{"ORCID":"https:\/\/orcid.org\/0009-0006-1908-9764","authenticated-orcid":false,"given":"Yanjie","family":"Liu","sequence":"additional","affiliation":[{"name":"Key Laboratory of Instrument Science and Dynamic Testing Ministry of Education and the Key Laboratory of Quantum Sensing and Precision Measurement, North University of China, Taiyuan, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-1513-7048","authenticated-orcid":false,"given":"Zhonghao","family":"Li","sequence":"additional","affiliation":[{"name":"Key Laboratory of Instrument Science and Dynamic Testing Ministry of Education and the Key Laboratory of Quantum Sensing and Precision Measurement, North University of China, Taiyuan, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-4634-8849","authenticated-orcid":false,"given":"Hao","family":"Guo","sequence":"additional","affiliation":[{"name":"Key Laboratory of Instrument Science and Dynamic Testing Ministry of Education and the Key Laboratory of Quantum Sensing and Precision Measurement, North University of China, Taiyuan, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-7839-6450","authenticated-orcid":false,"given":"Zongmin","family":"Ma","sequence":"additional","affiliation":[{"name":"Key Laboratory of Instrument Science and Dynamic Testing Ministry of Education and the Key Laboratory of Quantum Sensing and Precision Measurement, North University of China, Taiyuan, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5038-2241","authenticated-orcid":false,"given":"Jun","family":"Tang","sequence":"additional","affiliation":[{"name":"Key Laboratory of Instrument Science and Dynamic Testing Ministry of Education and the Key Laboratory of Quantum Sensing and Precision Measurement, North University of China, Taiyuan, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-1128-8201","authenticated-orcid":false,"given":"Jun","family":"Liu","sequence":"additional","affiliation":[{"name":"Key Laboratory of Instrument Science and Dynamic Testing Ministry of Education and the Key Laboratory of Quantum Sensing and Precision Measurement, North University of China, Taiyuan, China"}]}],"member":"263","reference":[{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1088\/1402-4896\/acd81f"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2018.2882937"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2022.3219922"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1063\/1.114159"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevB.87.014115"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevLett.102.057403"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TASC.2007.897403"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1063\/1.2214152"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1038\/s41377-022-00817-5"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TAP.2020.3044365"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1021\/nl404072s"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1088\/1367-2630\/17\/11\/112002"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevApplied.10.044039"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1038\/s41598-020-61669-w"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2021.3084614"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1016\/j.cbpa.2014.04.014"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevB.79.075203"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.3390\/jimaging8050123"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1002\/adom.201600039"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1002\/cnma.201700257"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2018.2812204"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevLett.101.117601"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevB.90.235205"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1088\/0034-4885\/77\/5\/056503"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2019.2937532"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2023.3244254"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1063\/1.4760267"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2019.2933267"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/JIOT.2014.2313981"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1002\/aelm.202101029"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2016.2598227"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/10012124\/10273752.pdf?arnumber=10273752","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,11,6]],"date-time":"2023-11-06T19:17:55Z","timestamp":1699298275000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10273752\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023]]},"references-count":31,"URL":"https:\/\/doi.org\/10.1109\/tim.2023.3322476","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2023]]}}}