{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,23]],"date-time":"2026-01-23T20:50:24Z","timestamp":1769201424155,"version":"3.49.0"},"reference-count":38,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100012166","name":"National Key Research and Development Program of China","doi-asserted-by":"publisher","award":["2021YFB3201800"],"award-info":[{"award-number":["2021YFB3201800"]}],"id":[{"id":"10.13039\/501100012166","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"Natural Science Foundation of China","doi-asserted-by":"publisher","award":["62131017"],"award-info":[{"award-number":["62131017"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"Natural Science Foundation of China","doi-asserted-by":"publisher","award":["62101423"],"award-info":[{"award-number":["62101423"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100015401","name":"Key Research and Development Program of Shaanxi Province","doi-asserted-by":"publisher","award":["2020GY-295"],"award-info":[{"award-number":["2020GY-295"]}],"id":[{"id":"10.13039\/501100015401","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100013314","name":"National 111 Project of China","doi-asserted-by":"publisher","award":["B14040"],"award-info":[{"award-number":["B14040"]}],"id":[{"id":"10.13039\/501100013314","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100002858","name":"China Postdoctoral Science Foundation","doi-asserted-by":"publisher","award":["2021M692531"],"award-info":[{"award-number":["2021M692531"]}],"id":[{"id":"10.13039\/501100002858","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2023]]},"DOI":"10.1109\/tim.2023.3322494","type":"journal-article","created":{"date-parts":[[2023,10,17]],"date-time":"2023-10-17T17:50:13Z","timestamp":1697565013000},"page":"1-9","source":"Crossref","is-referenced-by-count":11,"title":["Enhanced Limit-of-Detection of Current Sensor Based on Tunneling Magnetoresistive Effect With Multichips Differential Design"],"prefix":"10.1109","volume":"72","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-2829-9190","authenticated-orcid":false,"given":"Jiaming","family":"Liu","sequence":"first","affiliation":[{"name":"Electronic Materials Research Laboratory, Key Laboratory of the Ministry of Education and International Center for Dielectric Research, School of Electronic Science and Engineering, Xi’an Jiaotong University, Xi’an, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-7270-2624","authenticated-orcid":false,"given":"Mengmeng","family":"Guan","sequence":"additional","affiliation":[{"name":"Electronic Materials Research Laboratory, Key Laboratory of the Ministry of Education and International Center for Dielectric Research, School of Electronic Science and Engineering, Xi’an Jiaotong University, Xi’an, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-8923-6113","authenticated-orcid":false,"given":"Yiwei","family":"Xu","sequence":"additional","affiliation":[{"name":"Electronic Materials Research Laboratory, Key Laboratory of the Ministry of Education and International Center for Dielectric Research, School of Electronic Science and Engineering, Xi’an Jiaotong University, Xi’an, China"}]},{"ORCID":"https:\/\/orcid.org\/0009-0008-1025-4967","authenticated-orcid":false,"given":"Shuang","family":"Zhao","sequence":"additional","affiliation":[{"name":"Electronic Materials Research Laboratory, Key Laboratory of the Ministry of Education and International Center for Dielectric Research, School of Electronic Science and Engineering, Xi’an Jiaotong University, Xi’an, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-0972-9020","authenticated-orcid":false,"given":"Wei","family":"Su","sequence":"additional","affiliation":[{"name":"Electronic Materials Research Laboratory, Key Laboratory of the Ministry of Education and International Center for Dielectric Research, School of Electronic Science and Engineering, Xi’an Jiaotong University, Xi’an, China"}]},{"ORCID":"https:\/\/orcid.org\/0009-0000-2492-4337","authenticated-orcid":false,"given":"Cuiling","family":"Zhang","sequence":"additional","affiliation":[{"name":"International Joint Laboratory for Micro\/Nano Manufacturing and Measurement Technology, Xi’an Jiaotong University, Xi’an, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-7045-5308","authenticated-orcid":false,"given":"Zhiguang","family":"Wang","sequence":"additional","affiliation":[{"name":"Electronic Materials Research Laboratory, Key Laboratory of the Ministry of Education and International Center for Dielectric Research, School of Electronic Science and Engineering, Xi’an Jiaotong University, Xi’an, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-5956-7376","authenticated-orcid":false,"given":"Xiaohui","family":"Zhang","sequence":"additional","affiliation":[{"name":"International Joint Laboratory for Micro\/Nano Manufacturing and Measurement Technology, Xi’an Jiaotong University, Xi’an, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-7534-0427","authenticated-orcid":false,"given":"Zhongqiang","family":"Hu","sequence":"additional","affiliation":[{"name":"Electronic Materials Research Laboratory, Key Laboratory of the Ministry of Education and International Center for Dielectric Research, School of Electronic Science and Engineering, Xi’an Jiaotong University, Xi’an, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8452-6768","authenticated-orcid":false,"given":"Zhuangde","family":"Jiang","sequence":"additional","affiliation":[{"name":"International Joint Laboratory for Micro\/Nano Manufacturing and Measurement Technology, Xi’an Jiaotong University, Xi’an, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-6310-948X","authenticated-orcid":false,"given":"Ming","family":"Liu","sequence":"additional","affiliation":[{"name":"Electronic Materials Research Laboratory, Key Laboratory of the Ministry of Education and International Center for Dielectric Research, School of Electronic Science and Engineering, Xi’an Jiaotong University, Xi’an, China"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.3390\/s121115520"},{"issue":"6","key":"ref2","first-page":"1905","article-title":"Review of high current measurement and sensing technology","volume":"47","author":"Zhou","year":"2021","journal-title":"High Voltage Eng."},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.4028\/www.scientific.net\/amr.1040.954"},{"issue":"4","key":"ref4","first-page":"42","article-title":"Design of the direct sensing type Hall current sensors with 5 V power","volume":"12","author":"Wang","year":"2016","journal-title":"Instrum. Technol."},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2020.3036632"},{"issue":"17","key":"ref6","first-page":"129","article-title":"Study and manufacture of TMR single chip weak current sensor","volume":"55","author":"Zheng","year":"2018","journal-title":"Electr. Meas. Instrum."},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2018.007442"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/SSPS.2017.8071588"},{"key":"ref9","volume-title":"Effects of Current Passing Through the Human Beings and Livestock","year":"2011"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/CDE.2017.7905240"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.18686\/esta.v2i1.5"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1049\/ip-cds:20050005"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS48785.2022.9937552"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1515\/teme-2019-0032"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2015.2446332"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1088\/0957-0233\/21\/11\/112001"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2009.2013914"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TASC.2016.2536619"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.3390\/s21041500"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2015.7063140"},{"issue":"34","key":"ref21","first-page":"54","article-title":"Design of power monitoring system based on Hall current sensor","volume":"10","author":"Zhou","year":"2015","journal-title":"Transducer Microsyst. Technol."},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2023.3284055"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2023.3273389"},{"key":"ref24","first-page":"45","article-title":"Hardware circuit design of compensation type Hall high-current sensor","volume":"11887","author":"Xu","year":"2021","journal-title":"Proc. SPIE"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1063\/5.0035837"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1016\/j.sna.2019.05.002"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1088\/0953-8984\/19\/16\/165217"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1088\/1755-1315\/668\/1\/012081"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2004.836866"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2018.2850748"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1016\/s0304-8853(98)00376-x"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2019.2893650"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1063\/1.2976435"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1051\/epjap\/2015150214"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2016.2525772"},{"key":"ref36","volume-title":"REF50xx Datasheet","year":"2023"},{"key":"ref37","volume-title":"AD8421 Datasheet","year":"2023"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1088\/1742-6596\/1617\/1\/012038"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/10012124\/10287261.pdf?arnumber=10287261","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,1,12]],"date-time":"2024-01-12T03:33:10Z","timestamp":1705030390000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10287261\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023]]},"references-count":38,"URL":"https:\/\/doi.org\/10.1109\/tim.2023.3322494","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2023]]}}}