{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,29]],"date-time":"2025-10-29T19:47:36Z","timestamp":1761767256782,"version":"3.37.3"},"reference-count":21,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61874085"],"award-info":[{"award-number":["61874085"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Xi\u2019an Major Scientific and Technological Innovation Platform and Local Transformation Project of Scientific and Technological Achievements","award":["20KYPT0001-11-1"],"award-info":[{"award-number":["20KYPT0001-11-1"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2023]]},"DOI":"10.1109\/tim.2023.3322502","type":"journal-article","created":{"date-parts":[[2023,10,6]],"date-time":"2023-10-06T17:50:23Z","timestamp":1696614623000},"page":"1-11","source":"Crossref","is-referenced-by-count":1,"title":["A Low-Power i-ToF LiDAR With Nonlinearity Self-Calibration Technique"],"prefix":"10.1109","volume":"72","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-6682-7084","authenticated-orcid":false,"given":"Youze","family":"Xin","sequence":"first","affiliation":[{"name":"School of Microelectronics and the Key Laboratory of Micro-Nano Electronics and System Integration, Xi’an Jiaotong University, Xi’an, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9373-9976","authenticated-orcid":false,"given":"Bing","family":"Zhang","sequence":"additional","affiliation":[{"name":"School of Microelectronics and the Key Laboratory of Micro-Nano Electronics and System Integration, Xi’an Jiaotong University, Xi’an, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1672-8752","authenticated-orcid":false,"given":"Congzhen","family":"Hu","sequence":"additional","affiliation":[{"name":"School of Microelectronics and the Key Laboratory of Micro-Nano Electronics and System Integration, Xi’an Jiaotong University, Xi’an, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0005-1006-1039","authenticated-orcid":false,"given":"Yiyun","family":"Xie","sequence":"additional","affiliation":[{"name":"School of Microelectronics and the Key Laboratory of Micro-Nano Electronics and System Integration, Xi’an Jiaotong University, Xi’an, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0004-5104-5898","authenticated-orcid":false,"given":"Pengfei","family":"Hu","sequence":"additional","affiliation":[{"name":"School of Microelectronics and the Key Laboratory of Micro-Nano Electronics and System Integration, Xi’an Jiaotong University, Xi’an, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0007-1008-7313","authenticated-orcid":false,"given":"Ruipeng","family":"Yang","sequence":"additional","affiliation":[{"name":"School of Microelectronics and the Key Laboratory of Micro-Nano Electronics and System Integration, Xi’an Jiaotong University, Xi’an, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0008-1059-6983","authenticated-orcid":false,"given":"Yaoxin","family":"Li","sequence":"additional","affiliation":[{"name":"School of Microelectronics and the Key Laboratory of Micro-Nano Electronics and System Integration, Xi’an Jiaotong University, Xi’an, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0721-3167","authenticated-orcid":false,"given":"Dan","family":"Li","sequence":"additional","affiliation":[{"name":"School of Microelectronics and the Key Laboratory of Micro-Nano Electronics and System Integration, Xi’an Jiaotong University, Xi’an, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-4002-9281","authenticated-orcid":false,"given":"Li","family":"Geng","sequence":"additional","affiliation":[{"name":"School of Microelectronics and the Key Laboratory of Micro-Nano Electronics and System Integration, Xi’an Jiaotong University, Xi’an, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref13","first-page":"229","article-title":"Novel standard CMOS detector using majority current for guiding photo-generated electrons towards detecting junctions","author":"van nieuwenhove","year":"2005","journal-title":"Proc Symp IEEE\/LEOS Benelux"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC19947.2020.9063101"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/ICSENS.2008.4716611"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/GROUP4.2006.1708184"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2018.2850931"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2006.883669"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2010.2085870"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2022.3188045"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4613-1981-8_1"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/56.782"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2018.2789403"},{"journal-title":"Current-assisted devices for 3D Time-of-Flight imaging","year":"2011","author":"van der tempel","key":"ref16"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2014.2364270"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2021.3123045"},{"key":"ref8","first-page":"98","article-title":"A 32×32-pixel time-resolved single-photon image sensor with 44.64?m pitch and 19.48% fill-factor with on-chip row\/frame skipping features reaching 800 kHz observation rate for quantum physics applications","author":"gasparini","year":"2018","journal-title":"IEEE Int Solid-State Circuits Conf (ISSCC) Dig Tech Papers"},{"key":"ref7","first-page":"151","article-title":"A 64×64-pixel digital silicon photomultiplier direct ToF sensor with 100-Mphotons\/s\/pixel background rejection and imaging\/altimeter mode with 0.14% precision up to 6 km for spacecraft navigation and landing","author":"perenzoni","year":"2016","journal-title":"IEEE Int Solid-State Circuits Conf (ISSCC) Dig Tech Papers"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/3.910448"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2018.2826860"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1364\/AOP.3.000128"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3186697"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2019.2907776"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/10012124\/10273751.pdf?arnumber=10273751","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,11,13]],"date-time":"2023-11-13T19:14:01Z","timestamp":1699902841000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10273751\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023]]},"references-count":21,"URL":"https:\/\/doi.org\/10.1109\/tim.2023.3322502","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"type":"print","value":"0018-9456"},{"type":"electronic","value":"1557-9662"}],"subject":[],"published":{"date-parts":[[2023]]}}}