{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,4]],"date-time":"2025-11-04T11:11:47Z","timestamp":1762254707663,"version":"build-2065373602"},"reference-count":57,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["52175453"],"award-info":[{"award-number":["52175453"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100005230","name":"Innovation Group Science Fund of Chongqing Natural Science Foundation","doi-asserted-by":"publisher","award":["cstc2019jcyj-cxttX0003"],"award-info":[{"award-number":["cstc2019jcyj-cxttX0003"]}],"id":[{"id":"10.13039\/501100005230","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Graduate Research and Innovation Foundation of Chongqing, China","award":["CYB21013"],"award-info":[{"award-number":["CYB21013"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2023]]},"DOI":"10.1109\/tim.2023.3324689","type":"journal-article","created":{"date-parts":[[2023,10,16]],"date-time":"2023-10-16T18:03:01Z","timestamp":1697479381000},"page":"1-14","source":"Crossref","is-referenced-by-count":5,"title":["An Image-Based Hairline Crack Identification Method for Metal Parts"],"prefix":"10.1109","volume":"72","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-1345-9307","authenticated-orcid":false,"given":"Chuanpeng","family":"Hao","sequence":"first","affiliation":[{"name":"School of Mechanical Engineering, Chongqing University, Chongqing, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-6287-1130","authenticated-orcid":false,"given":"Yan","family":"He","sequence":"additional","affiliation":[{"name":"School of Mechanical Engineering, Chongqing University, Chongqing, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-4203-7189","authenticated-orcid":false,"given":"Yufeng","family":"Li","sequence":"additional","affiliation":[{"name":"School of Mechanical Engineering, Chongqing University, Chongqing, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-8609-261X","authenticated-orcid":false,"given":"Xiaobo","family":"Niu","sequence":"additional","affiliation":[{"name":"School of Mechanical Engineering, Chongqing University, Chongqing, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-6086-0481","authenticated-orcid":false,"given":"Yan","family":"Wang","sequence":"additional","affiliation":[{"name":"School of Computing, Engineering and Mathematics, University of Brighton, Brighton, U.K"}]}],"member":"263","reference":[{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2014.10.009"},{"key":"ref57","doi-asserted-by":"publisher","DOI":"10.1016\/j.rcim.2022.102512"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.aej.2017.01.020"},{"key":"ref56","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2015.2403238"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2764844"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.3390\/app12031374"},{"key":"ref53","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-88071-1"},{"key":"ref52","doi-asserted-by":"publisher","DOI":"10.1109\/34.888718"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.3390\/data3030028"},{"key":"ref55","first-page":"1","article-title":"Very deep convolutional networks for large-scale image recognition","author":"simonyan","year":"2015","journal-title":"Proc 3rd Int Conf Learn Represent (ICLR)"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.patcog.2020.107474"},{"journal-title":"Metallic Reflection","year":"2021","key":"ref54"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TITS.2015.2482222"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2015.2509278"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/WACV.2014.6836111"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TITS.2012.2208630"},{"key":"ref51","doi-asserted-by":"publisher","DOI":"10.1061\/(ASCE)CP.1943-5487.0000736"},{"key":"ref50","doi-asserted-by":"publisher","DOI":"10.22260\/ISARC2018\/0103"},{"key":"ref46","doi-asserted-by":"publisher","DOI":"10.1109\/TASE.2022.3140784"},{"key":"ref45","first-page":"8032","article-title":"A deep learning-based surface defect inspection system using multiscale and channel-compressed features","volume":"69","author":"yang","year":"2020","journal-title":"IEEE Trans Instrum Meas"},{"key":"ref48","article-title":"Detection of sealed and unsealed cracks with complex backgrounds using deep convolutional neural network","volume":"107","author":"huyan","year":"2019","journal-title":"Autom Construction"},{"key":"ref47","doi-asserted-by":"publisher","DOI":"10.1111\/mice.12497"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1016\/j.autcon.2021.103605"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1016\/j.jmsy.2023.02.007"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1111\/mice.12903"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1016\/j.autcon.2021.103606"},{"key":"ref49","doi-asserted-by":"publisher","DOI":"10.1002\/stc.2286"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2018.2878966"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.jclepro.2014.05.084"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/j.prostr.2016.02.008"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.procir.2014.06.087"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.procir.2020.02.131"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1680\/feng.2011.164.1.15"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1108\/SR-06-2019-0153"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.3390\/machines11020169"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1016\/j.jmsy.2015.09.004"},{"key":"ref34","doi-asserted-by":"crossref","first-page":"759","DOI":"10.1007\/s10845-019-01476-x","article-title":"Segmentation-based deep-learning approach for surface-defect detection","volume":"31","author":"tabernik","year":"2020","journal-title":"J Intell Manuf"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1016\/j.jmsy.2020.10.004"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1177\/1475921718811157"},{"key":"ref31","first-page":"17","article-title":"A crack detection method in road surface images using morphology","author":"tanaka","year":"1998","journal-title":"Proc IAPR Workshop Mach Vis Appl"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1016\/j.patcog.2016.11.021"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/ICIP.2006.313007"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/ITSC.2013.6728529"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1080\/0951192X.2020.1858498"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.jclepro.2020.120952"},{"key":"ref39","first-page":"585","article-title":"Image transformations and camera calibration","author":"davies","year":"0","journal-title":"Computer Vision"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1016\/j.cageo.2013.04.008"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1061\/(ASCE)CP.1943-5487.0000890"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.2016.2601099"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1002\/stc.2381"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1111\/mice.12421"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/IFSA-NAFIPS.2013.6608558"},{"key":"ref22","first-page":"489","article-title":"Concrete cracks detection based on deep learning image classification","volume":"2","author":"da silva","year":"2018","journal-title":"Proceedings"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1016\/j.patrec.2011.11.004"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1016\/j.apsusc.2013.09.002"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1016\/j.jmsy.2020.03.009"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.3390\/s20061562"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/10012124\/10286091.pdf?arnumber=10286091","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,11,13]],"date-time":"2023-11-13T19:14:40Z","timestamp":1699902880000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10286091\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023]]},"references-count":57,"URL":"https:\/\/doi.org\/10.1109\/tim.2023.3324689","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"type":"print","value":"0018-9456"},{"type":"electronic","value":"1557-9662"}],"subject":[],"published":{"date-parts":[[2023]]}}}