{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,27]],"date-time":"2025-10-27T20:55:28Z","timestamp":1761598528916,"version":"3.37.3"},"reference-count":37,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2024]]},"DOI":"10.1109\/tim.2023.3325511","type":"journal-article","created":{"date-parts":[[2023,10,19]],"date-time":"2023-10-19T18:02:49Z","timestamp":1697738569000},"page":"1-10","source":"Crossref","is-referenced-by-count":2,"title":["Load in the Loop Dual Howland Current Source for Wide Frequency Bandwidth and Wide Load Range Bioimpedance Measurements"],"prefix":"10.1109","volume":"73","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-6329-0370","authenticated-orcid":false,"given":"Hanen","family":"Nouri","sequence":"first","affiliation":[{"name":"Measurement and Sensor Technology, Chemnitz University of Technology, Chemnitz, Germany"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-4316-1616","authenticated-orcid":false,"given":"Dhouha","family":"Bouchaala","sequence":"additional","affiliation":[{"name":"Control and Energy Management Laboratory (CEM Lab), National School of Engineers of Sfax (ENIS), Sfax, Tunisia"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9015-0226","authenticated-orcid":false,"given":"Yupei","family":"Zhao","sequence":"additional","affiliation":[{"name":"Measurement and Sensor Technology, Chemnitz University of Technology, Chemnitz, Germany"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3689-6518","authenticated-orcid":false,"given":"Ahmed Yahia","family":"Kallel","sequence":"additional","affiliation":[{"name":"Measurement and Sensor Technology, Chemnitz University of Technology, Chemnitz, Germany"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-7166-1266","authenticated-orcid":false,"given":"Olfa","family":"Kanoun","sequence":"additional","affiliation":[{"name":"Measurement and Sensor Technology, Chemnitz University of Technology, Chemnitz, Germany"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1186\/s12882-022-03012-1"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.3390\/biology11091255"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.3390\/s22155801"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/B978-0-12-801238-3.10884-0"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.4103\/1658-354X.197334"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.3390\/s19214614"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/10.4599"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3124059"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.2478\/joeb-2020-0014"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1007\/s11220-019-0251-1"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1063\/1.4991829"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.seta.2022.102506"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2021.3077998"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1142\/S0218126621501516"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.46300\/91015.2020.14.13"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2019.2939117"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.3390\/s22228705"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/SSD49366.2020.9364102"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/MeMeA52024.2021.9478601"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/NanofIM49467.2019.9233492"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2015.12.044"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1088\/1742-6596\/224\/1\/012167"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1016\/j.apcbee.2013.08.010"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1007\/s10470-019-01430-0"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2015.07.054"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TBCAS.2012.2199114"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1063\/1.5079872"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1063\/1.5005330"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.12785\/ijcnt\/010305"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1080\/00207210801976503"},{"article-title":"Investigation of current excitation for personal health and biological tissues monitoring","year":"2016","author":"Bouchaala","key":"ref31"},{"volume-title":"Medical Electrical Equipment\u2014Part 1: General Requirements for Basic Safety and Essential Performance","year":"2005","key":"ref32"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1117\/12.2254629"},{"article-title":"1 effect of parasitic capacitance in op amp circuits","year":"2000","author":"Karki","key":"ref34"},{"article-title":"High-speed layout guidelines","year":"2006","author":"Weiler","key":"ref35"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/CCDC.2012.6244414"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.3390\/electronics4030507"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/10367905\/10288362.pdf?arnumber=10288362","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,3,8]],"date-time":"2024-03-08T02:35:18Z","timestamp":1709865318000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10288362\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024]]},"references-count":37,"URL":"https:\/\/doi.org\/10.1109\/tim.2023.3325511","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"type":"print","value":"0018-9456"},{"type":"electronic","value":"1557-9662"}],"subject":[],"published":{"date-parts":[[2024]]}}}