{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,14]],"date-time":"2026-01-14T17:03:55Z","timestamp":1768410235355,"version":"3.49.0"},"reference-count":35,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61871379"],"award-info":[{"award-number":["61871379"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["62371452"],"award-info":[{"award-number":["62371452"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2024]]},"DOI":"10.1109\/tim.2023.3325866","type":"journal-article","created":{"date-parts":[[2023,10,19]],"date-time":"2023-10-19T18:02:49Z","timestamp":1697738569000},"page":"1-11","source":"Crossref","is-referenced-by-count":6,"title":["Damage Detection of CFRP by Electrical Impedance Tomography Imaging Based on RM-DeeplabV3"],"prefix":"10.1109","volume":"73","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-4979-2542","authenticated-orcid":false,"given":"Wenru","family":"Fan","sequence":"first","affiliation":[{"name":"School of Electronic Information and Automation, Civil Aviation University of China, Tianjin, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0002-4415-4848","authenticated-orcid":false,"given":"Chunxu","family":"Yao","sequence":"additional","affiliation":[{"name":"School of Electronic Information and Automation, Civil Aviation University of China, Tianjin, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.compstruct.2021.114091"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.ndteint.2010.04.001"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.compositesb.2014.09.007"},{"key":"ref4","first-page":"35","article-title":"Conductivity inversion of unidirectional CFRP laminates using eddy current testing","volume":"37","author":"Shen","year":"2020","journal-title":"Trans. Nanjing Univ. Aeronaut. Astronaut"},{"issue":"2","key":"ref5","first-page":"67","article-title":"Application and development of X-ray detection technology in composite material detection","volume":"38","author":"Dong","year":"2016","journal-title":"Nondestruct. Test."},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.mtcomm.2022.104164"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/s0266-3538(99)00166-9"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.compscitech.2022.109429"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1088\/0266-5611\/28\/9\/095011"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/embc.2019.8856781"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/tbme.2019.2891676"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1002\/jmri.23960"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/tmi.2019.2948909"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/j.patcog.2022.108620"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/biocas.2019.8918979"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/j.ifacol.2021.10.292"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/tmi.2018.2828303"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/jsen.2020.2973337"},{"issue":"9","key":"ref19","first-page":"7","article-title":"Open electrical impedance imaging algorithm based on multi-scale residual network model","volume":"56","author":"Liu","year":"2022","journal-title":"J. Zhejiang Univ."},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/j.compbiomed.2021.104592"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1016\/j.ifacol.2020.12.360"},{"issue":"9","key":"ref22","first-page":"41","article-title":"Electrical impedance tomography method based on V-ResNet","volume":"42","author":"Fu","year":"2021","journal-title":"Chin. J. Sci. Instrum."},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/tpami.2019.2938758"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/cvpr.2018.00745"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/3dv.2016.79"},{"key":"ref26","article-title":"Rethinking atrous convolution for semantic image segmentation","author":"Chen","year":"2017","journal-title":"arXiv:1706.05587"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1007\/s11263-014-0733-5"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/jstars.2021.3140101"},{"key":"ref29","article-title":"Research on medical image segmentation algorithm based on deep learning","author":"Qian","year":"2020"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1088\/0266-5611\/19\/3\/308"},{"key":"ref31","first-page":"1","article-title":"L1-norm-based image reconstruction algorithm for electrical capacitance tomography","volume":"18","author":"Wang","year":"2015","journal-title":"Proc. CSEE"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1016\/j.cmpb.2020.105897"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2022.3205908"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/tmi.2021.3139455"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1016\/j.compscitech.2006.07.033"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/10367905\/10288247.pdf?arnumber=10288247","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,1,12]],"date-time":"2024-01-12T02:39:01Z","timestamp":1705027141000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10288247\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024]]},"references-count":35,"URL":"https:\/\/doi.org\/10.1109\/tim.2023.3325866","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2024]]}}}