{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,6,3]],"date-time":"2025-06-03T15:19:42Z","timestamp":1748963982135,"version":"3.37.3"},"reference-count":34,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/100000002","name":"NIH","doi-asserted-by":"publisher","award":["3R01EB01946504","3R01EB01946504S2","R01EB03103801"],"award-info":[{"award-number":["3R01EB01946504","3R01EB01946504S2","R01EB03103801"]}],"id":[{"id":"10.13039\/100000002","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2024]]},"DOI":"10.1109\/tim.2023.3328091","type":"journal-article","created":{"date-parts":[[2023,10,27]],"date-time":"2023-10-27T17:50:54Z","timestamp":1698429054000},"page":"1-9","source":"Crossref","is-referenced-by-count":4,"title":["Compact FPGA-Based Data Acquisition System for a High-Channel, High-Count-Rate TOF-PET Insert for Brain PET\/MRI"],"prefix":"10.1109","volume":"73","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-4250-7788","authenticated-orcid":false,"given":"Qian","family":"Dong","sequence":"first","affiliation":[{"name":"Departments of Electrical Engineering and Radiology, Stanford University, Stanford, CA, USA"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1848-9687","authenticated-orcid":false,"given":"Salar","family":"Sajedi","sequence":"additional","affiliation":[{"name":"Department of Radiology, Stanford University, Stanford, CA, USA"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-3699-5949","authenticated-orcid":false,"given":"Ke","family":"Cui","sequence":"additional","affiliation":[{"name":"Department of Radiology, Stanford University, Stanford, CA, USA"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4575-5074","authenticated-orcid":false,"given":"Craig S.","family":"Levin","sequence":"additional","affiliation":[{"name":"Departments of Radiology, Electrical Engineering, Bioengineering, and Physics and Molecular Imaging Program at Stanford (MIPS), Stanford University, Stanford, CA, USA"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1111\/j.1476-5829.2010.00218.x"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.2967\/jnumed.116.188029"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1053\/j.semnuclmed.2017.09.001"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1148\/radiol.2312021185"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1148\/radiol.2382041977"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1053\/j.semnuclmed.2007.04.001"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.2174\/1874471010902040224"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1007\/s00259-003-1202-5"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.7555\/JBR.29.20140081"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1097\/WCO.0000000000000489"},{"volume-title":"Positron Emission Tomography Market Size, Global Trends 2030","year":"2021","key":"ref11"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1186\/s40658-016-0138-3"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.2967\/jnumed.118.217901"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1007\/s00259-008-1054-0"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1007\/s13534-022-00234-y"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/NSSMIC.2017.8533051"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/NSSMIC.2012.6551564"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/NSSMIC.2014.7430883"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/NSSMIC.2013.6829207"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/NSSMIC.2010.5874142"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2016.2633237"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/j.nima.2009.01.100"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/trpms.2023.3309771"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/NSS\/MIC42101.2019.9059713"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1002\/mp.16354"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6560\/acc3f2"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/NSS\/MIC44867.2021.9875669"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6560\/acdec4"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1117\/12.2279439"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/NSSMIC.2017.8533057"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1145\/2854150"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1088\/1742-6596\/587\/1\/012068"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/TRPMS.2019.2906407"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/TMI.2021.3062066"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/10367905\/10298255.pdf?arnumber=10298255","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,1,12]],"date-time":"2024-01-12T03:43:58Z","timestamp":1705031038000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10298255\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024]]},"references-count":34,"URL":"https:\/\/doi.org\/10.1109\/tim.2023.3328091","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"type":"print","value":"0018-9456"},{"type":"electronic","value":"1557-9662"}],"subject":[],"published":{"date-parts":[[2024]]}}}